Patent application number | Description | Published |
20100066235 | IMAGE DISPLAY APPARATUS - The shortest distance L [μm] from an arbitrary point on an exposed insulating surface on a base to a conductive member on the base and a sheet resistivity Rs [Ω/□] of the arbitrary point satisfy Rs×L | 03-18-2010 |
20130320204 | SAMPLE ANALYSIS METHOD AND ANALYZER - Provided is a sample analysis method of irradiating a sample with a primary ion beam to analyze a secondary ion emitted from the sample by mass spectrometry, the sample analysis method including the steps of cooling a sample placed in a chamber; forming an ice layer on a surface of the cooled sample by discharging one of water and an aqueous solution to the chamber; and irradiating the surface of the sample with the primary ion beam with the ice layer being formed thereon, wherein an amount of the water forming the ice | 12-05-2013 |
20140353504 | LIGHT SOURCE ADJUSTMENT UNIT, OPTICAL MEASUREMENT DEVICE, SUBJECT INFORMATION OBTAINING SYSTEM, AND WAVELENGTH ADJUSTMENT PROGRAM - An optical measurement device includes a light source unit including a first laser light source configured to emit a laser beam having a first wavelength and a second laser light source configured to emit a laser beam having a second wavelength, a measurement wave number setting unit, and a light source adjustment unit configured to adjust at least one of the first wavelength and the second wavelength such that a difference between or a sum of a first wave number corresponding to the first wavelength and a second wave number corresponding to the second wavelength matches a measurement wave number set through the measurement wave number setting unit. | 12-04-2014 |
20140374585 | ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND SECONDARY ION MASS SPECTROMETRY METHOD - The present invention provides an ion group irradiation device for irradiating a sample with an ion group, comprising: an ion group selecting unit configured to select, from ions released from an ion source, at least two ion groups formed of ions having different average masses; and a primary ion irradiation unit configured to irradiate the sample with the at least two ion groups selected by the ion group selecting unit, wherein the ion group selecting unit selects at least one ion group and further selects the at least two ion groups from each of the selected at least one ion group. | 12-25-2014 |
20140374586 | ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND SECONDARY ION MASS SPECTROMETRY METHOD - Provided is an ion group irradiation device for facilitating the distinction of peaks in secondary ion mass spectra. The ion group irradiation device for irradiating a sample with an ion group includes an ion source for generating ions, an ion group selecting unit configured to select, from the ions released from the ion source, two or more ion groups formed of ions having different average masses, and a primary ion irradiation unit configured to irradiate the sample with the two or more ion groups. Further, an atom species or a molecule species of the ions forming the two or more ion groups is common between ion groups. | 12-25-2014 |
20140374587 | ION GROUP IRRADIATION DEVICE AND SECONDARY ION MASS SPECTROMETER - The present invention provides an ion group irradiation device which includes: an ion source which generates an ion; and an ion group selecting unit which selects an ion group containing a cluster ion from ions released from the ion source, in an ion group irradiation device for irradiating a sample with the ion group, wherein the ion source has a pressure gradient forming unit for changing a pressure with which a material of the cluster ion is jetted, with time, the ion group selecting unit has a chopper which performs a chopping operation of selecting the ion group by passing and blocking the cluster ions in a traveling direction by the opening and closing of the chopper, and the chopper performs two or more times of the chopping operations per one time of a pressure gradient forming operation by the pressure gradient forming unit. | 12-25-2014 |
20150034817 | IONIZATION DEVICE, MASS SPECTROMETRY APPARATUS, MASS SPECTROMETRY METHOD, AND IMAGING SYSTEM - A mass spectrometry apparatus includes a holding table that holds a specimen to be ionized, a probe that identifies a portion of the specimen to be ionized, an ion extraction electrode that extracts ions obtained by ionizing the specimen, a liquid supplying unit that supplies liquid to between the specimen and the probe to form a liquid bridge between the specimen and the probe, a vibrating unit that vibrates one of the probe and the holding table, an electric field generating unit that generates an electric field between the probe and the ion extraction electrode, a mass spectrometry unit that mass analyzes ions extracted by the ion extraction electrode, and a synchronization unit configured to synchronize a time at which ions are generated from the portion with a time at which the mass spectrometry unit measures the ions. | 02-05-2015 |
20150034821 | IONIZATION APPARATUS, MASS SPECTROMETER INCLUDING IONIZATION APPARATUS, AND IMAGE FORMING SYSTEM - Provided is an ionization apparatus including: a holder configured to hold a sample; a probe configured to determine a part to be ionized of the sample held by the holder; an extract electrode configured to extract ionized ions of the sample; a liquid supply unit configured to supply liquid to a part of a region of the sample; and a unit configured to apply a first voltage between the probe and the extract electrode, in which the first voltage is pulse-modulated. | 02-05-2015 |