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Masaaki Ito
Masaaki Ito, Ohtake-Shi JP
| Patent application number | Description | Published |
|---|---|---|
| 20100261926 | SURFACE-MODIFIED NANODIAMOND AND ITS PRODUCING METHOD - A surface-modified nanodiamond includes a base nanodiamond, and at least one polyglycerol-chain-containing group present on at least a surface portion of the base nanodiamond, in which the polyglycerol-chain-containing group is represented by following Formula (1): | 10-14-2010 |
Masaaki Ito, Mie JP
| Patent application number | Description | Published |
|---|---|---|
| 20100168323 | PROPYLENE-BASED POLYMER AND METHOD FOR PRODUCING THE SAME, AND PROPYLENE-BASED RESIN COMPOSITION - A propylene-based polymer comprising the following component (A) insoluble in p-xylene at 25° C. and component (B) soluble in p-xylene at 25° C., wherein (i) the weight average molecular weight (Mw) measured with GPC is 100,000 to 1,000,000, (ii) the content of the component insoluble in hot p-xylene is 0.3% by weight or lower, and (iii) the degree of strain hardening (λ max) in measurement of elongational viscosity is 2.0 or higher; and a method for producing the same, along with a resin composition comprising a propylene-ethylene copolymer (Z) in an amount of 50.0 to 99.9% by weight and a propylene-based polymer (M) in an amount of 0.1 to 50.0% by weight. | 07-01-2010 |
| 20100227987 | PROPYLENE-BASED POLYMER, PRODUCTION METHOD THEREFOR, COMPOSITION USING THE SAME, AND APPLICATION THEREOF - A propylene-based polymer which is suitably applicable to foam molding, sheet molding, blow molding or the like, because of having good flow characteristics, high melt tension, high swell ratio and thus good molding workability. | 09-09-2010 |
Masaaki Ito, Hitachinaka-Shi JP
| Patent application number | Description | Published |
|---|---|---|
| 20100106443 | Defect Inspection Apparatus and Defect Inspection Method - A defect inspection apparatus includes: stages each mounting an inspecting object on which a circuit pattern having a group of parallel lines is formed, and each running perpendicular or parallel to the group of lines; an illumination optical system which illuminating a surface of the inspecting object with a slit beam being slit light so that a longitudinal direction of the slit beam is substantially perpendicular to the running directions of the stages, and which has a first inclined angle formed by the direction of the group of lines and a projection line, of an optical axis of the slit beam, to the inspecting object; a spatial filter that shields or transmits reflected and scattered light of the inspecting object according to a difference in distribution of orientation; and a detection optical system that detects the reflected and scattered light transmitted through the spatial filter by image sensors. Moreover, the illumination optical system illuminates the inspecting object with another slit beam from a direction opposite to an incident direction of the slit beam on a plane. | 04-29-2010 |
Masaaki Ito, Tokyo JP
| Patent application number | Description | Published |
|---|---|---|
| 20090161943 | INSPECTION APPARATUS AND INSPECTION METHOD - The invention is directed to find a false defect from defect candidates and obtain a threshold with which the false defect can be eliminated by the smallest number of review times. Defect candidates are reviewed and selected as a defect or a false defect. By deleting a defect candidate having a characteristic quantity equal to or less than that of the false defect from a map or displaying it in another sign, the false defect can be determined visually. Since the defect candidate having the characteristic quantity equal to or less than that of the selected false defect is deleted from the map or displayed in another sign, the defect candidates unnecessary to set a threshold are not reviewed. The number of defect candidates to be reviewed can be largely reduced as compared with that in the conventional technique. Further, by repeating the above work, the threshold is automatically calculated, and an inspection result map with the threshold is displayed, so that a re-inspection is unnecessary. | 06-25-2009 |
| 20090247251 | Game device and program - A game device for performing a game in which, when a first-choice display object is freely chosen via a pointing operation undertaken by a player from among a large number of display objects, a second-choice object is then required to be determined as a correct choice, comprises determining means for determining whether or not the display object of interest has been chosen on the basis of the position coordinates from input means and a choice determination range and correcting means for performing, when the correct second-choice object has been determined, correction processing for changing the size of a choice determination range for the display object of interest used for the determination processing so that the choice determination range for a correct choice display object becomes relatively larger than the choice determination range for an incorrect choice display object. | 10-01-2009 |
Masaaki Ito, Hitachinaka JP
| Patent application number | Description | Published |
|---|---|---|
| 20090202138 | INSPECTION APPARATUS - The present invention provides an inspection apparatus having a high throughput and high sensitivity with respect to a number of various manufacturing processes and defects of interest in inspection of a specimen such as a semiconductor wafer on which a pattern is formed. The apparatus illuminates with light the specimen having the pattern formed thereon, forms an image of the specimen on an image sensor through a reflective optics, and determines the existence/nonexistence of a defect. The reflective optics has a conjugate pair of Fourier transform optics. An aberration of the reflective optics is corrected off-axis. The reflective optics has a field of view in non-straight-line slit form on the specimen surface. Also, the optics is of a reflection type, includes a conjugate pair of Fourier transform optics and has a field of view in non-straight-line slit form. An optimum wavelength band is selected according to the specimen (FIG. | 08-13-2009 |
| 20110141272 | APPARATUS AND METHOD FOR INSPECTING AN OBJECT SURFACE DEFECT - Disclosed is an apparatus having a light source of a deep ultraviolet ray for detecting a small foreign matter or pattern defect, which may arise during a process for manufacturing a semiconductor device or the like, in high resolution. The apparatus comprises a means for detecting a damage on an optical system due to a wavelength reduction thereby to save a damaged portion, and a means for comparing an optical system arrangement with that at the manufacturing time and detecting the abnormality thereof, to thereby make a correction, so that the apparatus can inspect the defect on an object substrate stably at a high speed and in high sensitivity. Also disclosed is a method for the stable inspection. The apparatus is provided, in the optical path of the optical system, with a means for detecting the intensity and the convergent state of an illumination light, and a means for detecting the abnormality of the optics system and for saving an abnormal portion from alignment with an optical axis. The apparatus is constituted such that the optical system is adjusted to make corrections for the optical conditions at the manufacturing time, thereby to elongate the lifetime of the optical system in the inspecting apparatus and to detect the small defect stably. | 06-16-2011 |
| 20110221886 | PATTERN DEFECT INSPECTING APPARATUS AND METHOD - In recent years, a wafer inspection time in semiconductor manufacturing processes is being required to be reduced for reduction in manufacturing time and for early detection of yield reduction factors. To meet this requirement, there is a need to reduce the time required for inspection parameter setup, as well as the time actually required for inspection. Based on the speed or position change information relating to a transport system | 09-15-2011 |
Masaaki Ito, Kyoto-Shi JP
| Patent application number | Description | Published |
|---|---|---|
| 20090155881 | CELL-FREE PROTEIN SYNTHESIS METHOD AND CELL-FREE PROTEIN SYNTHESIS REACTION SOLUTION USING ADENOSINE 3',5'-BISPHOSPHATE - The present invention provides a method of conducting cell-free protein synthesis by conveniently suppressing mRNA degradation, and a reaction solution enabling cell-free protein synthesis by conveniently suppressing mRNA degradation. A cell-free protein synthesis method using a cell-free protein synthesis reaction solution containing at least an extract liquid derived from a living cell, a potassium salt, a magnesium salt, adenosine triphosphate, guanosine triphosphate, creatine phosphate, creatine kinase, amino acid, a tRNA, an mRNA, a buffer, and adenosine 3′,5′-bisphosphate. | 06-18-2009 |
Masaaki Ito, Hiroshima JP
| Patent application number | Description | Published |
|---|---|---|
| 20090062525 | METHOD OF ADJUSTING THE DEGREE OF SUBSTITUTION WITH ACETYL GROUP OF CELLULOSE ACETATE - A process for adjusting an intermolecular or intramolecular degree of acetyl substitution of cellulose acetate is disclosed. The process comprises ripening cellulose acetate in the presence of a catalyst, an acetyl donor, and water or an alcohol. The amount of water and the alcohol is in the range of 0.1 to 10 mol % based on the amount of the acetyl donor. | 03-05-2009 |
| 20110166340 | Process for adjusting degree of acetyl substitution of cellulose acetate - A process for adjusting an intermolecular or intramolecular degree of acetyl substitution of cellulose acetate is disclosed. The process comprises ripening cellulose acetate in the presence of a catalyst, an acetyl donor, and water or an alcohol. The amount of water and the alcohol is in the range of 0.1 to 10 mol % based on the amount of the acetyl donor. | 07-07-2011 |
Masaaki Ito, Ina-Shi JP
| Patent application number | Description | Published |
|---|---|---|
| 20080225425 | Electro-optical device and electronic apparatus - The invention provides a heat dissipater such as a heat dissipation member that dissipates heat of an integrated circuit that is formed on a flexible substrate such as a flexible printed circuit board. The heat dissipater according to an aspect of the invention includes; a main body section that is formed in the shape of a hollow sleeve in such a manner that the flexible substrate can be inserted through and inserted inside the main body section; and an adhering section that is formed on an inner surface of the main body section in such a manner that the main body section and the integrated circuit are adhered to each other via the adhering section. | 09-18-2008 |
Masaaki Ito, Osaka JP
| Patent application number | Description | Published |
|---|---|---|
| 20080221311 | Preparation method of insect cell extract solution for cell-free protein synthesis, the insect cell extract solution and cell-free synthesis method of protein using the insect cell extract solution - The present invention provides a preparation method of an insect cell extract solution for cell-free protein synthesis, the insect cell extract solution, a protein synthesis method in a cell-free system, which uses the insect cell extract solution, and a kit for cell-free protein synthesis containing the insect cell extract solution. The extract solution is easily prepared by the method of the present invention and can synthesize a higher amount of protein than by extract solutions prepared by conventional methods. | 09-11-2008 |
Masaaki Ito, Chiba JP
| Patent application number | Description | Published |
|---|---|---|
| 20110237942 | BIOIMAGING METHOD USING NEAR-INFRARED (NIR) FLUORESCENT MATERIAL - This invention provides a novel bioimaging technique that can achieve a deep observation depth and a novel method for marking a lesion that allows clear recognition of the lesion from outside a living body. This invention also provides a bioimaging marker comprising a fluorescent material obtained by doping a ceramic with rare earths and the like and a bioimaging technique comprising detecting near-infrared fluorescence that can sufficiently penetrate a living body generated upon excitation of the marker with near-infrared excitation light. | 09-29-2011 |