Maruyama, Hyogo
Jyunpei Maruyama, Hyogo JP
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20080258059 | Scanning Probe Microscope System - A scanning probe microscope system capable of identifying an element with atomic scale spatial resolution comprises: an X-ray irradiation means for irradiating a measurement object with high-brilliance monochromatic X-rays having a beam diameter smaller than 1 mm; a probe arranged to oppose to the measurement object; a processing means for detecting and processing a tunneling current through the probe; and a scanning probe microscope having an alignment means for relatively moving the measurement object, the probe, and the incident position of the high-brilliance monochromatic X-rays to the measurement object. | 10-23-2008 |
Shigeru Maruyama, Hyogo JP
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20090025144 | Flame-Retardant Bedding - The object of the present invention is to provide a bedding in which polyester having excellent elasticity is used for a batting therein, and which is provided with high-grade flame retardance so as to withstand long-time flaming, even though only a small amount of a halogen-containing fiber is used therein. By configuring the flame-retardant bedding product so that it is composed of a batting and a ticking for covering the batting and that the batting comprises a cellulose fiber (A), a polyester fiber (B), and a halogen-containing fiber (C) as essential components, the bedding product is caused to achieve the above-described object. In addition to the excellent flame retardance, the bedding product of the present invention is allowed to have excellent cushiony properties, since a large amount of a polyester fiber can be used therein because the amount of a halogen-containing fiber used therein is relatively small. Further, with the present invention, even a flame-retardant bedding product in which an easily inflammable fiber such as a polyester fiber or a cellulose fiber is used for a ticking exhibits sufficient flame retardance. Therefore, it is possible to provide a bedding that exhibits excellent feeling and touch as well as flame retardance. | 01-29-2009 |
20090311933 | Flame-retardant low-resilience urethane foam cushion - A low-resilience urethane foam cushion that is comfortable and has high flame retardancy. It sufficiently retains the unique texture and comfort inherent in low-resilience urethane foam materials for use as cushions or pillows. It further retains the intact excellent texture, touch feeling, and other properties inherent in fibrous materials. The low-resilience urethane foam cushion is obtained by covering a low-resilience urethane foam with a flame-barrier fabric made of at least two members selected from the group consisting of halogenated fibers (A), flame-retardant cellulosic fibers (B), cellulosic fibers (C), and polyester fibers (D), wherein the sum of (A) and (B) is 25 to 75 wt. % of the flame-barrier fabric, the sum of (B) and (C) is 30 wt. % or more of the flame-barrier fabric, the amount of (C) alone is up to 75 wt. % of the flame-barrier fabric, and the amount of (D) alone is up to 30 wt. % of the flame-barrier fabric. | 12-17-2009 |
Toyotaro Maruyama, Hyogo JP
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20090294033 | Device and method for cutting and winding a tubular resin film - A device and method are provided for continuously manufacturing a thermoplastic resin film product of any width having a small film thickness and uniform flat surface at an excellent yield. | 12-03-2009 |
Tsuyoshi Maruyama, Hyogo JP
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20110262120 | LIQUID HEATING APPARATUS AND LIQUID HEATING METHOD - Provided is a liquid heating apparatus capable of heating fluid such as peroxosulfuric acid solution to high temperature in a short time. The heating apparatus includes: a flow channel member forming a flow channel | 10-27-2011 |
Yuko Maruyama, Hyogo JP
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20090250788 | SEMICONDUCTOR DEVICE - A semiconductor device includes a semiconductor substrate including a main surface; a plurality of first interconnections formed in a capacitance forming region defined on the main surface and extending in a predetermined direction, a plurality of second interconnections each adjacent to the first interconnection located at an edge of the capacitance forming region, extending in the predetermined direction, and having a fixed potential; and an insulating layer formed on the main surface and filling in between each of the first interconnections and between the first interconnection and the second interconnection adjacent to each other. The first interconnections and the second interconnections are located at substantially equal intervals in a plane parallel to the main surface, and located to align in a direction substantially perpendicular to the predetermined direction. | 10-08-2009 |
20110140277 | SEMICONDUCTOR DEVICE - A semiconductor device includes a semiconductor substrate including a main surface; a plurality of first interconnections formed in a capacitance forming region defined on the main surface and extending in a predetermined direction; a plurality of second interconnections each adjacent to the first interconnection located at an edge of the capacitance forming region, extending in the predetermined direction, and having a fixed potential; and an insulating layer formed on the main surface and filling in between each of the first interconnections and between the first interconnection and the second interconnection adjacent to each other. The first interconnections and the second interconnections are located at substantially equal intervals in a plane parallel to the main surface, and located to align in a direction substantially perpendicular to the predetermined direction. | 06-16-2011 |
20120022797 | SWITCHING-DEVICE REMAINING LIFETIME DIAGNOSIS METHOD AND APPARATUS - There are provided a switching-device remaining lifetime diagnosis method and a switching-device remaining lifetime diagnosis apparatus, wherein as status amount history data, there are accumulated status amounts related to a deterioration status of a switching device, estimated based on measurement data obtained through measurement of performance characteristics of the switching device; based on the accumulated status amount history data, there are created a plurality of system data pieces in which the status amounts are arranged with the respective abscissas of an elapsed time during an operation period of the switching device, the number of operations of the switching device, an inoperative time of the switching device, and an accumulated operation time of the switching device; based on the created system data pieces, the remaining lifetime of the switching device is estimated. | 01-26-2012 |