Patent application number | Description | Published |
20080302418 | Elongated Photovoltaic Devices in Casings - A solar cell unit comprising a solar cell and an at least partially transparent casing that encases the solar cell. The solar cell includes a nonplanar substrate defining a length of the solar cell, wherein a length of the nonplanar substrate is at least three times longer than a width of the nonplanar substrate. A back-electrode is disposed around all or a portion of the nonplanar substrate, and extends along all or a portion of the length of the nonplanar substrate. A semiconductor junction is disposed on the back-electrode, and has first and second layers, each of which has an inorganic semiconductor. An at least partially transparent conductive layer is disposed on the semiconductor junction. Optionally, filler material is disposed on the transparent conductive layer, which can for example be a liquid or gel. | 12-11-2008 |
20110046916 | Pyrometer - A position sensitive pyrometer includes a sensor. | 02-24-2011 |
20110165315 | Flux Monitor - A flux monitor system includes a light source and a sensor. | 07-07-2011 |
20110203655 | PHOTOVOLTAIC DEVICE PROTECTION LAYER - A photovoltaic structure can include a protective cap, which can include sodium. | 08-25-2011 |
20110212256 | DEPOSITION RATE CONTROL - An vapor deposition control system includes a multi-level control scheme. | 09-01-2011 |
20110214725 | PHOTOVOLTAIC DEVICE WITH GRADED BUFFER LAYER - A photovoltaic device can include a graded bandgap buffer layer. | 09-08-2011 |
20110223710 | Deposition Chamber Cleaning System and Method - An in-situ method of cleaning a vacuum deposition chamber can include flowing at least one reactive gas into the chamber. | 09-15-2011 |
20110249263 | PARTICLE DETECTOR - A particle detector for evaporation flux is disclosed. The particle detector includes a light source and at least one reflective surface. | 10-13-2011 |
20120012756 | Photoluminescence Spectroscopy - This invention relates to temperature-corrected photoluminescence spectroscopy which may be applied to semiconductors and, in particular, photovoltaic films. | 01-19-2012 |
20120017973 | IN-LINE DEPOSITION SYSTEM - A deposition system includes a load lock chamber for receiving a substrate and exposing a substrate to a load lock temperature and load lock pressure suitable to prepare a substrate for subsequent low-pressure and high-temperature processing or for ambient temperature and pressure conditions. | 01-26-2012 |
20120017983 | BUFFER LAYER FORMATION - Manufacturing a photovoltaic device can include a vapor transport deposition process. | 01-26-2012 |
20120018829 | TEMPERATURE-ADJUSTED SPECTROMETER - A temperature-adjusted spectrometer can include a light source and a temperature sensor. | 01-26-2012 |
20120021556 | DEPOSITION SYSTEM - A selenium deposition system can improve the selenium vapor distribution. | 01-26-2012 |
20120045855 | POSITION-SENSITIVE METROLOGY SYSTEM - A metrology system for analyzing a semiconductor device on a substrate can include a metrology sensor. | 02-23-2012 |
20120058576 | Deposition System - A pumping and valve control device can be used in an atomic layer deposition system. | 03-08-2012 |
20130056047 | PHOTOVOLTAIC MODULE WITH SEALED PERIMETER AND METHOD OF FORMATION - A photovoltaic module is formed by encasing the edge of the photovoltaic module with a dielectric while passing internal module conductors through the edge encased. The edge encasing may be an overmolded dielectric through which the internal conductors pass or connectors may be provided in the overmolded dielectric to allow for external connection to the module. The photovoltaic module can also include mechanical attachment points formed in the molded dielectric to allow the module to be attached to a support structure. | 03-07-2013 |
20130078375 | DEPOSITION SOURCE INTEGRATION INTO COATER - An improved deposition source configuration in a process chamber can reduce the overheating in a thin film deposition system. | 03-28-2013 |
20130095601 | DEPOSITION CHAMBER CLEANING SYSTEM AND METHOD - An in-situ method of cleaning a vacuum deposition chamber can include flowing at least one reactive gas into the chamber. | 04-18-2013 |
20140104616 | FLUX MONITOR - A flux monitor system includes a light source and a sensor. | 04-17-2014 |
20140231945 | TEMPERATURE-ADJUSTED SPECTROMETER - A temperature-adjusted spectrometer can include a light source and a temperature sensor. | 08-21-2014 |