Marchman
Drenda L. Marchman, Birmingham, AL US
Patent application number | Description | Published |
---|---|---|
20100010848 | TROUBLE TICKET MANAGEMENT SYSTEM - Management of trouble tickets for a circuit is provided. A method and system provides a plurality of management tools that enable a user to obtain, verify, and manage information related to a trouble ticket to ensure compliance with federal standards and proper resolution and billing for problems experienced for a customer. With the method and system, the user may open a trouble ticket, close the trouble ticket, and bill a customer for services associated with resolving the trouble ticket. | 01-14-2010 |
Evan L. Marchman, Austin, TX US
Patent application number | Description | Published |
---|---|---|
20130071071 | Assembling an Optical Transceiver Based on Lead Frame Features - Assembling an optical transceiver. A connector housing for a semiconductor package may be received. The connector housing may include a first alignment feature for assembling the optical transceiver. Additionally, a semiconductor package may be received. The semiconductor package may include a leadframe that has a second alignment feature which is complementary to the first alignment feature. The semiconductor package may be attached to the connector housing to form the optical transceiver by aligning the second alignment feature of the leadframe of the semiconductor package with the first alignment feature of the connector housing. This alignment may operate to align an optical axis a fiber optic transmitter and/or a fiber optic receiver with a corresponding fiber optic connector. | 03-21-2013 |
Herschel M. Marchman, Dallas, TX US
Patent application number | Description | Published |
---|---|---|
20100051802 | SINGLE-CHANNEL OPTICAL PROCESSING SYSTEM FOR ENERGETIC-BEAM MICROSCOPES - A single-channel optical processing system for an energetic-beam instrument has separate sources for processing radiation and illumination radiation. The processing radiation and the illumination radiation are combined in a single optical path and directed to a sample surface inside the energetic-beam instrument through a self-focusing rod lens. The self-focusing rod lens thus has a working distance from the sample surface that will not interfere with typical arrangements of ion beams and electron beams in such instruments. A combination of polarizers and beam splitters allows separation of the combined incident radiation and the combined radiation reflected from the sample surface and returned through the same optical channel, so that the reflected radiation may be directed to an optical detector, such as a camera or spectrometer. In other embodiments, additional illumination of the sample surface is provided at an angle to the central axis of the self-focusing rod lens. | 03-04-2010 |
20100068408 | METHODS FOR ELECTRON-BEAM INDUCED DEPOSITION OF MATERIAL INSIDE ENERGETIC-BEAM MICROSCOPES - We disclose method for materials deposition on a surface inside an energetic-beam instrument, where the energetic beam instrument is provided with a laser beam, an electron beam, and a source of precursor gas. The electron beam is focused on the surface, and the laser beam is focused to a focal point that is at a distance above the surface of about 5 microns to one mm, preferably from 5 to 50 microns. The focal point of the laser beam will thus be within the stream of precursor gas injected at the sample surface, so that the laser beam will facilitate reactions in this gas cloud with less heating of the surface. A second laser may be used for cleaning the surface. | 03-18-2010 |
20100200546 | METHOD OF ETCHING MATERIALS WITH ELECTRON BEAM AND LASER ENERGY - We disclose a method of electron-beam induced of etching the surface of a specimen in a charged-particle beam instrument, where the charged-particle beam instrument has first and second laser beams, an electron beam, and a gas-injection system for applying etchant gas to the surface. Etching is accomplished by applying a photolytic pulse from the first laser to the surface; applying a pyrolytic pulse from the second laser to the surface; and, applying an etchant gas to the surface at least during the pyrolytic pulse. Two or more alternating pyrolytic laser pulses and photolytic laser pulses may be applied to the surface. The stage supporting the specimen may be tilted relative to the axis of the electron beam before applying the electron beam to the surface of the specimen. The electron beam is applied to the surface of the specimen during the time the etchant gas is present at the surface. | 08-12-2010 |
20100202042 | MULTIPLE MAGNIFICATION OPTICAL SYSTEM WITH SINGLE OBJECTIVE LENS - A multiple magnification optical system ( | 08-12-2010 |
Herschel M. Marchman, Ashburn, VA US
Patent application number | Description | Published |
---|---|---|
20080283777 | IN-SITU HIGH-RESOLUTION LIGHT-OPTICAL CHANNEL FOR OPTICAL VIEWING AND SURFACE PROCESSING IN PARALLEL WITH CHARGED PARTICLE (FIB AND SEM) TECHNIQUES - An apparatus for simultaneous parallel processing of a sample using light energy for optical viewing or surface processing in parallel with a charged particle beam. A charged particle beam transmits a focused ion beam or an electron beam along a path to a sample. An optical microscope transmits light along a first path to the sample, and a prism aligned along the first light path reflects light into a second light path toward the sample. A portion of the prism and reflective surface is removed for passage of the charged particle beam. A lens is aligned along the second light path and has a portion removed for passage of the charged particle beam. The removed portions of the prism and lens are aligned along the charged particle beam path to permit parallel delivery of the charged particle beam and the light to substantially the same portion of the sample. | 11-20-2008 |
Herschel M. Marchman, Poughquag, NY US
Patent application number | Description | Published |
---|---|---|
20080236745 | METHOD AND APPARATUS FOR FABRICATING OR ALTERING MICROSTRUCTURES USING LOCAL CHEMICAL ALTERATIONS - A method and apparatus for fabricating or altering a microstructure use means for heating to facilitate a local chemical reaction that forms or alters the submicrostructure. | 10-02-2008 |
20120201956 | METHOD AND APPARATUS FOR FABRICATING OR ALTERING MICROSTRUCTURES USING LOCAL CHEMICAL ALTERATIONS - A method and apparatus for fabricating or altering a microstructure use means for heating to facilitate a local chemical reaction that forms or alters the submicrostructure. | 08-09-2012 |