Patent application number | Description | Published |
20080246424 | Brushless motor - The brushless motor has a first and second drive member. The first drive member is equipped with M phase coil groups each having N electromagnetic coils where M is an integer of 1 or greater and N is an integer of 1 or greater. The second drive member has a plurality of permanent magnets, and is able to move relative to the first drive member. The first drive member has 2 (M×N) magnetic body cores. Each phase electromagnetic coil is coiled on a periodically selected magnetic body core at a ratio of 1 to 2M from among the arrangement of 2 (M×N) magnetic body cores. | 10-09-2008 |
20080265816 | BRUSHLESS ELECTRIC MACHINE - The brushless electric machine includes a first drive member ( | 10-30-2008 |
20090033166 | BRUSHLESS MOTOR - The brushless motor includes a stator having a electromagnetic coil and a position sensor; an axis fixed to the stator; and a rotor having a permanent magnet. The rotor rotates around the axis. The rotor is linked to a driven member that is driven by the brushless motor. | 02-05-2009 |
20100052458 | BRUSHLESS ELECTRIC MACHINE AND DEVICE COMPRISING SAID MACHINE - To provide a technique that improves an efficiency of using a magnetic field in a brushless electric machine. A brushless electric machine includes a first member having N sets (N is an integer of 2 or more) of electromagnetic groups, and a second member that has N+1 sets of magnetic field forming member groups and can move in a predetermined moving direction in relative to the first member. One set of the electromagnetic coil group and one set of the magnetic field forming member group are alternately disposed along a direction perpendicular to the moving direction. | 03-04-2010 |
20110101902 | BRUSHLESS ELECTRIC MACHINE - The brushless electric machine includes a first drive member ( | 05-05-2011 |
20120062162 | BRUSHLESS ELECTRIC MACHINE - The brushless electric machine includes a first drive member ( | 03-15-2012 |
20130182257 | SAMPLE ANALYSIS ELEMENT AND DETECTING DEVICE - A plurality of metallic nano-body groups that includes metallic nano-bodies which are dispersed on a dielectric surface at a first pitch smaller than the wavelength of incident light is arranged in one direction at a second pitch that resonates with the incident light. Localized surface plasmon resonance occurs in the metallic nano-body by the action of the incident light. Propagating surface plasmon resonance occurs by the action of the second pitch. The propagating surface plasmon resonance is combined with the localized surface plasmon resonance. A so-called hybrid mode is established. | 07-18-2013 |
20130182258 | SAMPLE ANALYSIS ELEMENT AND DETECTING DEVICE - A plurality of metallic nano-body groups that includes metallic nano-bodies which are a size smaller than the wavelength of incident light and are dispersed on a dielectric surface is arranged in one direction at a pitch that resonates with the incident light. A long piece extends on the dielectric surface between adjacent metallic nano-body groups. The long piece is formed of a material having no free electron that performs resonance oscillation with the incident light. Localized surface plasmon resonance occurs in the metallic nano-body by the action of the incident light. Propagating surface plasmon resonance occurs by the action of the pitch. The propagating surface plasmon resonance is combined with the localized surface plasmon resonance. A so-called hybrid mode is established. The long piece is helpful in the establishment of the pitch. | 07-18-2013 |
20140242571 | OPTICAL ELEMENT, ANALYSIS EQUIPMENT, ANALYSIS METHOD AND ELECTRONIC APPARATUS - An optical element includes a metal layer in which a first direction is a thickness direction; metallic particles provided to be spaced from the metal layer in the first direction; and a light transmitting layer that separates the metal layer from the metallic particles, in which the size T of the metallic particles in the first direction satisfies a relationship of 3 nm≦T≦14 nm, and the size D of the metallic particles in a second direction orthogonal to the first direction satisfies a relationship of 30 nm≦D<50 nm. | 08-28-2014 |
20140242573 | OPTICAL ELEMENT, ANALYSIS DEVICE, ANALYSIS METHOD AND ELECTRONIC APPARATUS - An optical element includes a metal layer having a thickness in a first direction; metallic particles spaced apart from the metal layer in the first direction; and a light transmitting layer separating the metal layer from the metallic particles. The metallic particles are disposed in a lattice shape in a second direction orthogonal to the first direction and in a third direction orthogonal to the first direction and the second direction. A distance between adjacent metal particles in the second and third directions is S, and 6 nm08-28-2014 | |
20140253920 | ANALYSIS DEVICE, ANALYSIS METHOD, OPTICAL ELEMENT AND ELECTRONIC APPARATUS FOR ANALYSIS DEVICE AND ANALYSIS METHOD, AND METHOD OF DESIGNING OPTICAL ELEMENT - An analysis device includes an optical element which includes a metal layer, a light transmitting layer on the metal layer, and a plurality of metal particles on the light transmitting layer arranged at a first interval P1 in a first direction and arranged at a second interval P2 in a second direction intersecting the first direction, P109-11-2014 | |
20140255913 | ANALYSIS DEVICE, ANALYSIS METHOD, OPTICAL ELEMENT AND ELECTRONIC APPARATUS FOR ANALYSIS DEVICE AND ANALYSIS METHOD, AND METHOD OF DESIGNING OPTICAL ELEMENT - An analysis device includes an optical element which includes a metal layer, a light transmitting layer provided on the metal layer to transmit light, and a plurality of metal particles arranged at a first interval P1 in a first direction and arranged at a second interval P2 in a second direction intersecting the first direction on the light transmitting layer, P109-11-2014 | |
20150070693 | ANALYSIS DEVICE, ANALYSIS METHOD, OPTICAL ELEMENT USED FOR THE SAME, AND ELECTRONIC APPARATUS - An analysis device is provided with an optical element having a structure in which the end portions of the upper surface and the lower surface of second metal layers are capable of having contact with a measurement object, and hotspots are exposed on the element surfaces. Therefore, it is easy for the substance that is the analysis object to be located at the hotspot. Further, since a first metal layer is disposed in the vicinity of the second metal layers, a resonance effect of a localized surface plasmon and a propagating surface plasmon can be generated. Therefore, the enhancement degree of light based on the plasmon is extremely high, and it is possible to analyze the substance with extremely high sensitivity. | 03-12-2015 |