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Malinovich
Yacov Malinovich, Kiyat Tivon IL
| Patent application number | Description | Published |
|---|---|---|
| 20110032534 | SYSTEM AND A METHOD FOR BROADBAND INTERFEROMETRY - A method and a system for determining a depth of a space, the system includes: a scanner for scanning, by a single broadband light beam, the structural element and the area of the surface of the object, wherein the area at least partially surrounds the structural element; a sensor for detecting interference patterns generated when the single broadband light beam concurrently illuminates a portion of the area and at least a portion of the structural element; and an analyzer for analyzing the interference patterns to determine the height difference between the area and the structural element. | 02-10-2011 |
Yacov Malinovich, Tivon IL
| Patent application number | Description | Published |
|---|---|---|
| 20080264107 | Methods and Process of Tapering Waveguides and of Forming Optimized Waveguide Structures - In some embodiments of the present invention, an electrical field is applied across a waveguide substrate so as to induce ion exchange process that affects the cross section of the waveguide. Shaped electrical field may, according to the invention, may control the size and shape of the waveguide along it. | 10-30-2008 |
| 20090016670 | System and method for the fabrication of an electro-optical module - A system and method for fabricating an electro-optical hybrid module ( | 01-15-2009 |
Yacov Malinovich, Kiriat Tivon IL
| Patent application number | Description | Published |
|---|---|---|
| 20080278775 | HIGH-SENSITIVITY OPTICAL SCANNING USING MEMORY INTEGRATION - An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report. | 11-13-2008 |
| 20110114823 | IMAGING DEVICE AND METHOD FOR HIGH-SENSITIVITY OPTICAL SCANNING AND INTEGRATED CIRCUIT THEREFOR - An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspection output and to provide a defect report. | 05-19-2011 |
Yacov Malinovich, Kiryat Tivon IL
| Patent application number | Description | Published |
|---|---|---|
| 20110317003 | METHOD AND SYSTEM FOR EDGE INSPECTION USING A TILTED ILLUMINATION - A method and an edge inspection system, the edge inspection system includes: an illumination unit; a support module for supporting an inspected object and for moving the inspected object in relation to the illumination unit; wherein the inspected object comprises a top surface, a bottom surface and at least one edge facet; an illumination unit that has an illumination axis, wherein the illumination unit is arranged to illuminate an inspected edge area of the inspected object by directing a light beam along the illumination axis; wherein the illumination axis is tilted in relation to a plane of the inspected object by a tilt angle that differs from ninety degrees; wherein the plane of the inspected object is defined by at least one of the top surface and the bottom surface; and a camera that has a collection axis, wherein the camera is arranged to detect light from the inspected edge area. | 12-29-2011 |