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Makoto Ono
Makoto Ono, Yokohama JP
| Patent application number | Description | Published |
|---|---|---|
| 20080226153 | ANALYZING APPARATUS, PROGRAM, DEFECT INSPECTION APPARATUS, DEFECT REVIEW APPARATUS, ANALYSIS SYSTEM, AND ANALYSIS METHOD - In order to allow to easily specify inspection recipe with which defects desired to be detected can be detected efficiently, a defect inspection apparatus performs defect inspection of a substrate in accordance with a plurality of inspection recipes and produces defect information associated with position of defect in the substrate and attribute data of the defect for each of the inspection recipes and a defect review apparatus produces review result information specifying a kind of defect selected from defects contained in the defect information. An analyzing apparatus obtains defect information and review result information and totalizes the number of defects having attribute data similar to attribute data possessed in defects corresponding to kind of defects to be analyzed for each inspection recipe. | 09-18-2008 |
| 20110060552 | Measuring Apparatus, Measuring Coordinate Setting Method and Measuring Coordinate Number Calculation Method - With little cost and time, this invention makes high-precision measurements over an entire surface of a substrate to check how well devices are fabricated. The devices include integrated circuits, magnetic heads, magnetic discs, solar cells, optical modules, light emitting diodes and liquid crystal display panels—the ones that are fabricated on a substrate by repetitively performing deposition, resist application, exposure, development and etching. The method of this invention involves inputting multipoint measured data and a number of points used for measurement and calculating measuring coordinates by the measuring coordinate calculation program | 03-10-2011 |
Makoto Ono, Nagano-Ken JP
| Patent application number | Description | Published |
|---|---|---|
| 20100191866 | Information Processing Device, For Controlling The Same Method And Recording Medium - An information processing device that is connected to external devices includes a receiving unit that receives a command from the external devices, a judgment unit that determines whether the command received by the receiving unit is a first type command that reads out, rewrites, or deletes data stored in the information processing device, or a second type command other than the first type command, and a command processing unit in which execution of the command received by the receiving unit is prohibited when the command is the first type command, and execution of the command received by the receiving unit is performed when the command is the second type command, in accordance with determination by the judgment unit. | 07-29-2010 |
Makoto Ono, Settsu-Shi JP
| Patent application number | Description | Published |
|---|---|---|
| 20090281231 | TETRAFLUOROETHYLENE POLYMER AND AQUEOUS DISPERSION THEREOF - The invention provides a TFE polymer capable of providing stretched materials excellent in membrane homogeneity. The present invention is related to a tetrafluoroethylene polymer having stretchability and non-melt-processability and having a standard specific gravity of 2.140 to 2.165, wherein, with regard to the heat-of-fusion curve obtained by subjecting the tetrafluoroethylene polymer in the form of an unbaked polymer to be measured having no history of being heated to a temperature of 300° C. or higher to differential scanning calorimetry at a programming rate of 2° C./minute, the ratio between the amount of heat, S | 11-12-2009 |
Makoto Ono, Kanagawa JP
Makoto Ono, Chapel Hill, NC US
| Patent application number | Description | Published |
|---|---|---|
| 20090157867 | SYSTEM AND METHOD FOR REAL-TIME GRAPHIC MONITORING OF DIFFERING GRAPHICS RESOLUTIONS USING A SINGLE GRAPHICS BUFFER - A system and method automatically scale the resolution of video output of a selected workstation blade so that an administrator can view the video output by the selected workstation blade in the same format as it is displayed at the user terminal associated with the selected workstation blade. The video is automatically scaled to the administrator's VGA resolution while maintaining the same end-user DVI resolution and displaying the video so that the administrator may see the video output regardless of display format at the end user. This system and method allows the administrator to see the entire display. | 06-18-2009 |
Makoto Ono, Kariya-City JP
| Patent application number | Description | Published |
|---|---|---|
| 20090144489 | ELECTRONIC DEVICE AND PROGRAM FOR OPERATING THE SAME - A navigation device realizes such processing as map display and route guidance based on map data stored in a memory card. The data in the memory card tends to be volatilized with an increase in the frequency of reading of data. Therefore, the data that are highly frequently read out are held in a RAM so as to be read from the memory card at a decreased frequency. Further, the passage of time is calculated from the date and hour the data are recorded in the memory card, and the whole data in the memory card are refreshed every time when the passage of time exceeds a threshold value T | 06-04-2009 |
Makoto Ono, Osaka JP
| Patent application number | Description | Published |
|---|---|---|
| 20080281067 | Modified Polytetrafluoroethylene Powder and Method for Producing Tetrafluoroethylene Polymer - The present invention provides a polytetrafluoroethylene powder having moldability/processability as well as electrical characteristics in microwave bands. The present invention is a modified polytetrafluoroethylene powder which has (1) a dielectric loss tangent at 12 GHz of not higher than 2.0×10 | 11-13-2008 |
Makoto Ono, Yokohama-Shi JP
| Patent application number | Description | Published |
|---|---|---|
| 20110134559 | METHODS FOR PRODUCING AND/OR TESTING MAGNETIC HEADS USING CLASSIFICATIONS - In one embodiment, a manufacturing method for magnetic heads includes classifying magnetic heads into one of a first tested head class, and a non-test-candidate head class, determining characteristic values of the magnetic heads classified in the first tested head class, estimating characteristic values of the magnetic heads classified in the non-test-candidate head class, wherein the estimating is based on the characteristic values of the magnetic heads classified in the first tested head class, classifying each of the magnetic heads classified in the non-test-candidate head class into one of: a second tested head class, and a non-test head class based on the estimated characteristic values, determining characteristic values of the magnetic heads classified in the second tested head class, and screening magnetic heads in the second tested head class based on the determined characteristic values of the magnetic heads classified in the second tested head class. | 06-09-2011 |