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Kurenuma, JP
Takeroh Kurenuma, Kanagawa JP
| Patent application number | Description | Published |
|---|---|---|
| 20110002713 | TONER CONTAINER AND IMAGE FORMING APPARATUS - A toner container includes a longitudinal container body and a held portion. The longitudinal container body has a first end and a second end distal to the first end in a length direction of the container body. The container body includes a gear configured to engage with a drive gear provided in the main body. The held portion is attached to the first end of the container body and configured to be detachably attached to the toner-container holder. The held portion includes a toner outlet, is configured to be held by the toner-container holder in non-rotating manner, and is biased downwardly by a force applied from the drive gear to the gear when the drive gear rotates. | 01-06-2011 |
| 20110008075 | TONER CONTAINER AND IMAGE FORMING APPARATUS - A toner container detachably attached to a toner-container holder of a main body of an image forming apparatus includes a container body that includes an opening, and discharges toner contained in the container body, from the opening; and a held portion that is held by the toner-container holder in a non-rotating manner. The held portion includes an open/close member for opening/closing the toner outlet in synchronization with an attachment/detachment operation of the held portion to/from the toner-container holder. | 01-13-2011 |
Takeroh Kurenuma, Tokyo JP
| Patent application number | Description | Published |
|---|---|---|
| 20100296847 | TONER CARTRIDGE, IMAGE FORMING APPARATUS, METHOD OF RECYCLING TONER CARTRIDGE - An insertion passage | 11-25-2010 |
Takeroh Kurenuma, Ebina-Shi JP
| Patent application number | Description | Published |
|---|---|---|
| 20090190960 | PROCESS CARTRIDGE INCLUDING DEVELOPING UNIT AND INCORPORATED IN IMAGE FORMING APPARATUS - A process cartridge for use in an image forming apparatus includes an image bearing member and a developing unit. The developing unit includes a developer bearing member to bear developer including toner and carrier, a casing forming a developer container containing the developer, a screw having a shaft with a spiral screw blade, a toner density sensor to detect a density of the toner on a detection surface, and a detection surface agitating member fixedly mounted on the shaft of the screw at a position facing a detection surface to scrape away the developer accumulated on the detection surface as the screw rotates. The detection surface agitating member includes an elastic sheet elastically deformable to scrape away the developer accumulated on the detection surface and disposed at a substantially same angle to an axial direction of the shaft of the screw as the spiral screw blade. | 07-30-2009 |
| 20090245882 | DEVELOPING UNIT, PROCESS CARTRIDGE INCLUDING SAME, AND IMAGE FORMING APPARATUS INCORPORATING SAME - A developing unit includable in a process cartridge and in an image forming apparatus includes a developer bearing member including a magnetic field generator and a nonmagnetic hollow member, a developer container, an agitation/conveyance member, a developer regulating member to regulate the thickness of a layer of the two-component developer. The magnetic field generator has first and second magnetic poles to generate respective magnetic forces for removing the developer from the developer bearing member after the developer passes the development region. The second magnetic pole generates a magnetic force to attract the developer to form a magnetic brush on the developer bearing member. The developer regulating member includes a magnetic member outwardly disposed on an exterior perimeter surface of the developer bearing member upstream from the developer regulating member, and one planar surface of the magnetic member faces the second magnetic pole across an effective development region. | 10-01-2009 |
Tooru Kurenuma, Ibaraki JP
| Patent application number | Description | Published |
|---|---|---|
| 20080236259 | Method of Control of Probe Scan and Apparatus for Controlling Probe Scan of Scanning Probe Microscope - A scanning probe microscope provided with a cantilever | 10-02-2008 |
Toru Kurenuma, Tsuchiura JP
| Patent application number | Description | Published |
|---|---|---|
| 20080223122 | SCANNING PROBE MICROSCOPE - A scanning probe microscope, capable of performing shape measurement not affected by electrostatic charge distribution of a sample, which: monitors an electrostatic charge state by detecting a change in a flexure or vibrating state of a cantilever due to electrostatic charges in synchronization with scanning during measurement with relative scanning between the probe and the sample, and makes potential adjustment so as to cancel an influence of electrostatic charge distribution, thus preventing damage of the probe or the sample due to discharge and achieving reduction in measurement errors due to electrostatic charge distribution. | 09-18-2008 |
| 20090158828 | Scanning Probe Microscope - In the case of measuring a pattern having a steep side wall, a probe adheres to the side wall by the van der Waals forces acting between the probe and the side wall when approaching the pattern side wall, and an error occurs in a measured profile of the side wall portion. When a pattern having a groove width almost equal to a probe diameter is measured, the probe adheres to both side walls, the probe cannot reach the groove bottom, and the groove depth cannot be measured. When the probe adheres to a pattern side wall in measurements of a microscopic high-aspect ratio pattern using an elongated probe, the probe is caused to reach the side wall bottom by detecting the adhesion of the probe to the pattern side wall, and temporarily increasing a contact force between the probe and the sample. Also, by obtaining the data of the amount of torsion of a cantilever with the shape data of the pattern, a profile error of the side wall portion by the adhesion is corrected by the obtained data of the amount of torsion. | 06-25-2009 |
Toru Kurenuma, Tsuchiura-Shi JP
| Patent application number | Description | Published |
|---|---|---|
| 20080245139 | SCANNING PROBE MICROSCOPE AND MEASUREMENT METHOD OF SAME - A measurement method of a scanning probe microscope including a first approach operation adjusting an operation position of a fine positioning unit to near a maximum extension amount and ending the approach by coarse positioning, a first measurement operation making the probe scan the surface for measurement in a close probe state based on the first approach operation to obtain relief information of the sample surface, a positioning operation positioning the probe at a recessed part based on the relief information obtained by the first measurement operation, a second approach operation making the probe again approach the surface at a position determined by the positioning operation, adjusting an operation position of the Z-axis fine positioning device to close to a maximum extension amount, and ending the repeated approach, and a second measurement operation making the probe scan the surface for measurement in a close probe state based on the second approach operation to obtain relief information of the sample surface. | 10-09-2008 |