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Krishnaswami, US
Jayakumar Krishnaswami, Westmont, IL US
| Patent application number | Description | Published |
|---|---|---|
| 20080223329 | COMPOUND BRACKET SYSTEM - A compound bracket system ( | 09-18-2008 |
Karthik Krishnaswami, San Jose, CA US
| Patent application number | Description | Published |
|---|---|---|
| 20080212559 | Wireless proximity estimation - A wireless content protection system includes a coordinator, a source device, and a sink device. The coordinator includes a scheduler. The source and sink devices each have a content protection manager. One of the content protection manager allocates and releases bandwidth via the coordinator for a test message and a response message for a round-trip time computation. The test message is transmitted in a source-to-sink channel time block. The response message is transmitted in a sink-to-source channel time block. The round-trip time is the period between the end of the source-to-sink channel time block and the beginning of the sink-to-source channel time block. | 09-04-2008 |
Ramasunder Krishnaswami, Farmington, MI US
| Patent application number | Description | Published |
|---|---|---|
| 20110219905 | Range Shifting of an Automatic Transmission - A system for shifting a transmission range includes a selector producing a signal representing a selected range, and the system has a primary state wherein a source of electric power shifts the transmission to the selected range in response to the signal, and a secondary state wherein a source of mechanical energy shifts the transmission to a Park range when the primary state is unable to shift the range. | 09-15-2011 |
Sriram Krishnaswami, Saratoga, CA US
| Patent application number | Description | Published |
|---|---|---|
| 20080251019 | SYSTEM AND METHOD FOR TRANSFERRING A SUBSTRATE INTO AND OUT OF A REDUCED VOLUME CHAMBER ACCOMMODATING MULTIPLE SUBSTRATES - The present invention comprises a system and method for transferring a substrate into and out of a chamber configured to accommodate multiple substrates. In one embodiment, the system comprises a chamber housing that includes a first substrate support tray and a second substrate support tray independently movable along a vertical axis, and a substrate conveyor movable into and out of the chamber housing. The first substrate support tray and the second substrate support tray are movable to a position where a portion of the second substrate support tray is received in the first substrate support tray. | 10-16-2008 |
| 20090195262 | IN-LINE ELECTRON BEAM TEST SYSTEM - A method and apparatus for testing a plurality of electronic devices formed on a large area substrate is described. In one embodiment, the apparatus performs a test on the substrate in one linear axis in at least one chamber that is slightly wider than a dimension of the substrate to be tested. Clean room space and process time is minimized due to the smaller dimensions and volume of the system. | 08-06-2009 |
| 20090255911 | LASER SCRIBING PLATFORM AND HYBRID WRITING STRATEGY - Laser scribing can be performed on a workpiece ( | 10-15-2009 |
| 20090321397 | LASER-SCRIBING PLATFORM - Laser-scribing systems and translation stages operable to support a workpiece during laser scribing are provided. A laser-scribing system includes a base section, a bed supported by the base section, a laser, a first driving mechanism operable to move a workpiece longitudinally along the bed, and a second driving mechanism. The bed comprises a movable section configured to translate with respect to the base section. The movable section comprises a gap to allow a laser beam to pass through. The laser is positioned to direct the laser beam through the gap. The second driving mechanism is operable to laterally translate the laser and the movable section in order to scribe a pattern on the workpiece. | 12-31-2009 |
| 20090321399 | DYNAMIC SCRIBE ALIGNMENT FOR LASER SCRIBING, WELDING OR ANY PATTERNING SYSTEM - Methods and systems for improving the alignment between a previously formed feature and a subsequently formed feature are provided. An exemplary method can include laser scribing a workpiece ( | 12-31-2009 |
| 20100327162 | IN-LINE ELECTRON BEAM TEST SYSTEM - A method and apparatus for testing a plurality of electronic devices formed on a large area substrate is described. In one embodiment, the apparatus performs a test on the substrate in one linear axis in at least one chamber that is slightly wider than a dimension of the substrate to be tested. Clean room space and process time is minimized due to the smaller dimensions and volume of the system. | 12-30-2010 |
Sumi Krishnaswami, Morrisville, NC US
| Patent application number | Description | Published |
|---|---|---|
| 20080233285 | Methods of forming SIC MOSFETs with high inversion layer mobility - Methods of forming an oxide layer on silicon carbide include thermally growing an oxide layer on a layer of silicon carbide, and annealing the oxide layer in an environment containing NO at a temperature greater than 1175° C. The oxide layer may be annealed in NO in a silicon carbide tube that may be coated with silicon carbide. To form the oxide layer, a preliminary oxide layer may be thermally grown on a silicon carbide layer in dry O | 09-25-2008 |
| 20100221924 | METHODS OF FORMING SIC MOSFETS WITH HIGH INVERSION LAYER MOBILITY - Methods of forming an oxide layer on silicon carbide include thermally growing an oxide layer on a layer of silicon carbide, and annealing the oxide layer in an environment containing NO at a temperature greater than 1175° C. The oxide layer may be annealed in NO in a silicon carbide tube that may be coated with silicon carbide. To form the oxide layer, a preliminary oxide layer may be thermally grown on a silicon carbide layer in dry O | 09-02-2010 |