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Kravec
Kerry A. Kravec, Fishkill, NY US
| Patent application number | Description | Published |
|---|---|---|
| 20090254991 | INTRUSION DETECTION USING A NETWORK PROCESSOR AND A PARALLEL PATTERN DETECTION ENGINE - An intrusion detection system (IDS) comprises a network processor (NP) coupled to a memory unit for storing programs and data. The NP is also coupled to one or more parallel pattern detection engines (PPDE) which provide high speed parallel detection of patterns in an input data stream. Each PPDE comprises many processing units (PUs) each designed to store intrusion signatures as a sequence of data with selected operation codes. The PUs have configuration registers for selecting modes of pattern recognition. Each PU compares a byte at each clock cycle. If a sequence of bytes from the input pattern match a stored pattern, the identification of the PU detecting the pattern is outputted with any applicable comparison data. By storing intrusion signatures in many parallel PUs, the IDS can process network data at the NP processing speed. PUs may be cascaded to increase intrusion coverage or to detect long intrusion signatures. | 10-08-2009 |
Kerry A. Kravec, Wappingers Falls, NY US
| Patent application number | Description | Published |
|---|---|---|
| 20090112352 | EQUIVALENT GATE COUNT YIELD ESTIMATION FOR INTEGRATED CIRCUIT DEVICES - A storage medium including a method of modeling yield for semiconductor products includes determining expected faults for each of a plurality of library elements by running a critical area analysis on each of the library elements, and assessing, from the critical area analysis, an expected number of faults per unit area, and comparing the same to actual observed faults on previously manufactured semiconductor products. Thereafter, the expected number of faults for each library element is updated in response to observed yield. A database is established, which includes the die size and expected faults for each of the library elements. Integrated circuit product die size is estimated, and library elements to be used to create the integrated circuit die are selected. Fault and size data for each of the selected library elements are obtained, the adjusted estimated faults for each of the library elements are summed, and estimated yield is calculated. | 04-30-2009 |
Kerry A. Kravec, Fontainebleau FR
| Patent application number | Description | Published |
|---|---|---|
| 20080199086 | APPARATUS FOR PERFORMING FAST CLOSEST MATCH IN PATTERN RECOGNITION - A method and apparatus for determining a closest match of N input patterns relative to R reference patterns using K processing units. Each of a set of input patterns are loaded into the K processing units. One of the Reference patterns is sequentially loaded into each of the processing units and a distance defining the similarity between the reference pattern and each of the input patterns is calculated. A present calculated distance replaces its corresponding stored present minimum distance if it is has a smaller value. After the R reference patterns have been processed the minimum distance and its corresponding identification for all N input patterns is determined without merging outputs. The minimum distances and the identifications may be read either in parallel or serially. The apparatus is easily scalable by adding processors. The number of reference patterns may be easily increased without altering system configuration. | 08-21-2008 |