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Konishi, Yokohama
Hideaki Konishi, Yokohama JP
| Patent application number | Description | Published |
|---|---|---|
| 20100213970 | Semiconductor integrated circuit and method for testing the same - A semiconductor integrated circuit includes a plurality of clock gating circuits, a plurality of flip-flops to which transmission of a clock signal is controlled by a respective clock gating circuit, and a clock gating control circuit that controls an active state and an inactive state of the plurality of clock gating circuits, wherein during a test operation mode, the clock gating control circuit controlling the active state and the inactive state of the plurality of clock gating circuits according to a user logic signal, and controlling setting of an arbitrary combination of clock gating circuits to an inactive state regardless of the user logic signal. | 08-26-2010 |
Jun Konishi, Yokohama JP
| Patent application number | Description | Published |
|---|---|---|
| 20110016404 | DATA PROCESSING APPARATUS, DATA PROCESSING METHOD OF DATA PROCESSING APPARATUS, AND COMPUTER-READABLE MEMORY MEDIUM STORING PROGRAM THEREIN - To freely establish a peripheral equipment selection operating environment of excellent operability which can remarkably reduce an operation burden which is applied until construction information of selectable peripheral equipment can be confirmed and can easily confirm the construction information of the selectable peripheral equipment by everyone by a simple operating instruction, a CPU obtains construction information of a printer that is being selected and default setting on the basis of a selection instructing state relative to a selectable printer candidate on a network and allows them to be caption-displayed at a position near the position indicated by a cursor on a printer selection picture plane displayed on a CRT. | 01-20-2011 |
Junko Konishi, Yokohama JP
| Patent application number | Description | Published |
|---|---|---|
| 20080226153 | ANALYZING APPARATUS, PROGRAM, DEFECT INSPECTION APPARATUS, DEFECT REVIEW APPARATUS, ANALYSIS SYSTEM, AND ANALYSIS METHOD - In order to allow to easily specify inspection recipe with which defects desired to be detected can be detected efficiently, a defect inspection apparatus performs defect inspection of a substrate in accordance with a plurality of inspection recipes and produces defect information associated with position of defect in the substrate and attribute data of the defect for each of the inspection recipes and a defect review apparatus produces review result information specifying a kind of defect selected from defects contained in the defect information. An analyzing apparatus obtains defect information and review result information and totalizes the number of defects having attribute data similar to attribute data possessed in defects corresponding to kind of defects to be analyzed for each inspection recipe. | 09-18-2008 |
| 20090286174 | MANUFACTURING METHOD AND MANUFACTURING SYSTEM OF SEMICONDUCTOR DEVICE - In an exposure process forming a predetermined circuit pattern of a semiconductor device on a wafer, a resist dimension of the resist pattern formed on a wafer and a focus position in the exposure process at past time are measured, a resist dimension and a focus position of a wafer to which the exposure process is secondly performed are estimated by using measurement results of these measured resist dimension and focus position, and a focus offset value is calculated by using estimated values of these estimated resist dimension and focus position, and then, an exposure dose is calculated as considering this focus offset value, and a resist pattern is formed on the wafer to which the exposure process is performed by using these calculated exposure dose and focus offset value. | 11-19-2009 |
Katsumi Konishi, Yokohama JP
| Patent application number | Description | Published |
|---|---|---|
| 20100020738 | RELAY NETWORK SYSTEM AND TERMINAL ADAPTOR APPARATUS - The optimum relay route is selected out of a plurality of relay routes to a server. In order to solve a multirouting problem, introduced is a multi routing system for determining a relay route on the basis of a label corresponding to a terminal of an access source and a server type of an access destination instead of using an IP address as a key to select the relay route. A VPN using L2TP is also introduced. A CE router A ( | 01-28-2010 |
Noriaki Konishi, Yokohama JP
| Patent application number | Description | Published |
|---|---|---|
| 20090303911 | BROADCAST-CONTENT TRANSMITTING APPARATUS, BROADCAST-CONTENT RECEIVING APPARATUS, BROADCAST-CONTENT TRANSMITTING METHOD, BROADCAST-CONTENT RECEIVING METHOD, AND PROGRAM - The content receiving unit ( | 12-10-2009 |
Shozaburo Konishi, Yokohama JP
| Patent application number | Description | Published |
|---|---|---|
| 20110028361 | LOW-FRICTION SLIDING MECHANISM - A low-friction sliding mechanism includes first and second sliding members having respective sliding surfaces slidable relative to each other and a lubricant applied to the sliding surfaces of the first and second sliding members. At least the sliding surface of the first sliding member is made of a diamond-like carbon material, and at least the sliding surface of the second sliding member is made of either an aluminum-based alloy material, a magnesium-based alloy material or a diamond-like carbon material. The lubricant contains a base oil and at least one of an ashless fatty-ester friction modifier and an ashless aliphatic-amine friction modifier. | 02-03-2011 |
Yoshiro Konishi, Yokohama JP
| Patent application number | Description | Published |
|---|---|---|
| 20090268584 | Optical Pickup Apparatus And Optical Disc Apparatus Using Same - An optical pickup apparatus is provided with a dividing element having a plurality of regions. The dividing element is capable of dividing a light flux reflected by the optical disc into a plurality of light fluxes having different outgoing directions. Each region of the dividing element and light receiving parts of a light detector are structured such that when a target information recording layer of the optical disc is brought into focus, a light flux reflected from the target information recording layer is focused on the light receiving parts of the light detector, and a light flux reflected from other information recording layer than the target information recording layer is not irradiated onto the light receiving parts of the light detector. | 10-29-2009 |
| 20100067333 | OBJECTIVE LENS ACTUATOR AND AN OPTICAL PICKUP - An objective lens actuator, being suitable for a thin-sized optical pickup and a thin-sized optical disc apparatus, comprises: an objective lens for focusing a light upon a recording surface of an optical disc; and a driving means including a focusing coil, tracking coils, and a magnetic circuit, for operating the objective lens into a focusing direction of approaching/receding to/from the optical disc, and into a tracking direction of a radius of the optical disc, wherein the magnetic circuit has two (2) pieces of magnets putting the objective lens therebetween, and one of the magnets is short of length in the focusing direction and is long in length in the tracking direction, comparing to the other magnet, thereby brining an unnecessary moment, which is applied upon a moving part including the objective lens therein, to be small, and suppressing inclination or tile and vibration of the objective lens, so as to deal with high-density and high-speed recording/reproducing of information. | 03-18-2010 |
| 20100214904 | Optical Pickup Having Radially Arranged Lenses in a Low Profile Construction - An optical pickup includes a first source which emits a first beam with a first wavelength; a second source which emits a second beam with a wavelength shorter than the first wavelength; a first collimate lens which collimates the first beam; a second collimate lens which collimates the second beam; a first objective lens which converges the first collimated beam onto an optical disc; and a second objective lens which converges the second collimated beam onto the disc. The first and second objective lenses are arranged in the disc radial direction. The second objective lens is arranged closer to the side of the disc outer circumference than the first objective lens. The first collimate lens is arranged on the right-hand side when the second objective lens is viewed from the first objective lens. The second collimate lens is arranged on the left-hand side when the first objective lens is viewed from the second objective lens. The gap between the first collimate lens and the first objective lens is larger than the gap between the second collimate lens and the second objective lens. | 08-26-2010 |