| Patent application number | Description | Published |
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| 20100178049 | FOCAL PLANE SHUTTER FOR CAMERAS - In the focal plane shutter for cameras, a shutter base plate, an shank for attaching the first blade drive component and the second blade drive component respectively so as to enable to be rotated, an shank for attaching a set component so as to enable to be rotated, and an shank for attaching the first blade and the second blade so as to enable to be rotated respectively are made of synthetic resins. Each of the shanks is fabricated after a shutter base plate was fabricated beforehand, and grooves for sump having cross section of V letter shape are formed at the same interval of angle extending toward the axial direction of the shank at the circumferential side surfaces of the shanks. | 07-15-2010 |
| 20110018827 | INFORMATION PROCESSING APPARATUS, DISPLAY METHOD, AND DISPLAY PROGRAM - An information processing apparatus includes a position detecting section that detects a touch position of a pointing object on a display screen of a display section, a region detecting section that detects a region on the display screen which is hidden by the pointing object, and a control section that displays information associated with the touch position outside the region detected by the region detecting section, when the touch position is detected by the position detecting section. | 01-27-2011 |
| 20110022982 | DISPLAY PROCESSING DEVICE, DISPLAY PROCESSING METHOD, AND DISPLAY PROCESSING PROGRAM - A display processing device includes a display element, a grouping mechanism configured to group such that each of a plurality of selectable items belongs to one or more groups based on information which each item has, an assigning mechanism configured to generate and assign display objects corresponding to related items to the respective groups generated by the grouping of the plurality of selectable items by the grouping mechanism, and a display processing mechanism configured to display the display objects assigned to the groups by the assigning mechanism on a display screen of the display element. | 01-27-2011 |
| 20110025873 | IMAGE SEARCH DEVICE, IMAGE SEARCH METHOD, AND IMAGE SEARCH PROGRAM - An image search device includes: a shooting unit configured to photographically shoot a subject; a display unit; a control unit configured to display a search key for image search on the display unit according to a shooting situation at the time of a shooting mode whereby the subject can photographically be shot by the shooting unit; a specifying unit which is used for specifying the search key displayed on the display unit; and a searching unit configured to search, in the event of the search key being specified via the specifying unit, an image based on the search key thus specified; with the control unit displaying, in the event of the image being searched by the searching unit, this search result on the display unit. | 02-03-2011 |
| 20110063236 | INFORMATION PROCESSING DEVICE, DISPLAY METHOD AND PROGRAM - There is provided an information processing device that includes: a display portion that displays a plurality of function buttons that respectively correspond to a plurality of functions included in the information processing device; a position detection portion that detects a position where an operating body touches or approaches a display screen of the display portion; a button selection portion that selects, from among the plurality of function buttons, at least one function button that corresponds to an operation state of the information processing device; and a display control portion that causes the function button selected by the button selection portion to move on the display screen such that the function button approaches the position on the display screen detected by the position detection portion. | 03-17-2011 |
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| 20090039261 | Pattern Inspection Method and Pattern Inspection System - A pattern data examination method and system capable of accurately and speedily examining a circuit pattern without failing to extract pattern contour data are provided. While pattern comparison is ordinarily made by using a secondary electron image, a contour of a pattern element is extracted by using a backscattered electron image said to be suitable for observation and examination of a three dimensional configuration of a pattern element, and pattern inspection is executed by using the extracted contour of the pattern element. More specifically, pattern inspection is executed by comparing a contour of a pattern element with design data such as CAD data to measure a difference between the contour and the data, and by computing, for example, the size of the circuit pattern element from the contour of a pattern. From two or more backscattered electron images formed by detecting backscattered electrons at two or more different spatial positions, pattern contour data contained in the backscattered electron images may be obtained. | 02-12-2009 |
| 20100310180 | Pattern Inspection Method and Pattern Inspection System - A pattern data examination method and system capable of accurately and speedily examining a circuit pattern without failing to extract pattern contour data are provided. While pattern comparison is ordinarily made by using a secondary electron image, a contour of a pattern element is extracted by using a backscattered electron image said to be suitable for observation and examination of a three dimensional configuration of a pattern element, and pattern inspection is executed by using the extracted contour of the pattern element. More specifically, pattern inspection is executed by comparing a contour of a pattern element with design data such as CAD data to measure a difference between the contour and the data, and by computing, for example, the size of the circuit pattern element from the contour of a pattern. From two or more backscattered electron images formed by detecting backscattered electrons at two or more different spatial positions, pattern contour data contained in the backscattered electron images may be obtained. | 12-09-2010 |
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| 20100122027 | Storage controller - A storage controller of the present invention enables a larger number of storage devices to be mounted while keeping the installation size small. A plurality of sub-storage units are disposed inside a high density-type storage unit. The respective sub-storage units comprise a plurality of hard disk drives, controller, memory, power supply device, and display part. The respective sub-storage units operate independently of one another. A controller creates a management table based on management data acquired from the respective sub-storage units. The user is notified when there is an error in the table contents. A display part lights up in accordance with an indication from a storage unit specification part, notifying the user of the location of the sub-storage unit. | 05-13-2010 |
| 20100211739 | STORAGE SUBSYSTEM AND STORAGE SYSTEM - The first storage subsystem, when new data is written in a first memory device beyond a certain timing, writes pre-updated data prior to update by said new data into a pre-updated data memory region and, in addition, updates snapshot management information that expresses a snapshot of a data group within the first memory device to information that expresses the snapshot at the certain timing and, at a later timing than the certain timing, judges, on the basis of the snapshot management information, in which of either the pre-updated data memory region or the first memory device the data constituting the data group at a certain timing exists, acquires data from the one in which the data exists and writes it into the second memory device of the second storage subsystem, and generates the certain timing repeatedly. | 08-19-2010 |
