| Patent application number | Description | Published |
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| 20080218225 | Semiconductor Device and Communication Control Method - The present invention relates to a technique capable of establishing communications between cores, which can provide a large degree of freedom of clock frequencies settable in each core, and thus providing deterministic operation, small communication latency, and high reliability. An object of the present invention is to provide a semiconductor device with high reliability, by analyzing factors affecting the performance of the semiconductor device, based on the communication histories within the semiconductor device, and reflecting the analysis back to the next generation semiconductor devices. The improved semiconductor device includes a core A for transmitting data in sync with the clock signal clkA, a core B for receiving data in sync with the clock signal clkB coincided with the rising or falling of the clock signal clkA in a constant period, and a controller for controlling communications between the core A and the core B. The controller controls in such way that the core B can receive only the data arriving prior to the setup of the clock signal clkB. The controller stores the history on a communication status between cores. | 09-11-2008 |
| 20090146640 | PHASE DIFFERENCE MEASURING DEVICE AND PHASE COMPARISON CIRCUIT ADJUSTING METHOD - A phase difference measuring device according to this invention has an object of shortening the measuring time, and includes a plurality of phase difference measuring circuits ( | 06-11-2009 |
| 20090189596 | SIGNAL MEASURING DEVICE - An interpolated signal generating circuit ( | 07-30-2009 |
| 20090201045 | INPUT CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT COMPRISING THE INPUT CIRCUIT - A control signal input circuit for supplying control signals to a plurality of controlled circuits comprises N pieces of control signal preservation/output circuits provided one by one corresponding to plural-bit signals for delivering input data as it is when a trigger signal is at a first level, and holding previously delivered output data when the trigger signal is at a second level, and a controlled circuit selector circuit for setting the trigger signal for S pieces of the control signal preservation/output circuits to the first level, and setting the trigger signal for the rest of the control signal preservation/output circuits to the second level. | 08-13-2009 |
| 20090243624 | SIGNAL MEASURING DEVICE - Small-scale measuring circuits ( | 10-01-2009 |
| 20090246070 | ALLOY WITH HIGH GLASS FORMING ABILITY AND ALLOY-PLATED METAL MATERIAL USING SAME - An alloy with a high glass forming ability characterized by containing a group of elements A with atomic radii of less than 0.145 nm of a total of 20 to 85 atm %, a group of elements B with atomic radii of 0.145 nm to less than 0.17 nm of a total of 10 to 79.7 atm %, and a group of elements C with atomic radii of 0.17 nm or more of a total of 0.3 to 15 atm %; when the elements with the greatest contents in the group of elements A, group of elements B, and group of elements C are respectively designated as the “element a”, “element b”, and “element c”, by the ratio of the content of the element a in the group of elements A (for example, Zn and/or Al), the ratio of the content of the element b in the group of elements B (for example, Mg), and the ratio of the content of the element c in the group of elements C (for example, Ca) all being 70 atm % or more; and by the liquid forming enthalpy between any two elements selected from the element a, element b, and element c being negative. | 10-01-2009 |
| 20090269084 | LIGHT RECEIVING CIRCUIT AND DIGITAL SYSTEM - A light receiving circuit ( | 10-29-2009 |
| 20100018612 | MG-BASED ALLOY PLATED STEEL MATERIAL - An Mg-based alloy plated steel material superior in adhesion and corrosion resistance characterized by being provided with a hot dip Mg-based alloy plating layer (preferably containing Zn: 15 atm % to less than 45 atm %). | 01-28-2010 |
| 20100042373 | SIGNAL MEASURING DEVICE AND SIGNAL MEASURING METHOD - A signal measuring device, comprises one set, or a plurality of sets, of measuring unit(s) measuring an object of measurement in synch with a driving clock signal for measurement and outputting result of measurement as first data, and a timing identification unit which, in accordance with a measurement-start command, outputs a value, which differs every period, as second data in synch with a reference signal having a prescribed period and a speed lower than that of the driving clock signal; and a storage unit collecting and successively storing the first data and the second data as one set in synch with the driving clock signal. | 02-18-2010 |
| 20100052740 | CLOCK SIGNAL FREQUENCY DIVIDING CIRCUIT AND CLOCK SIGNAL FREQUENCY DIVIDING METHOD - To provide a rational frequency dividing circuit wherein the variations in cycle times of frequency divided clock signals are small, there are many occasions in which the minimum cycle time of frequency divided clock signals and test costs are small. A clock signal frequency dividing circuit, the frequency division ratio of which is specified as N/M where are both N and Mare integers, includes an output clock selecting circuit ( | 03-04-2010 |
| 20100052753 | CLOCK SIGNAL DIVIDING CIRCUIT - A clock signal dividing circuit in which a dividing ratio is regulated by N/M (M and N are positive integers and satisfy M>N) includes: a variable delay circuit which gives a predetermined delay amount based on a control value to an input clock signal CKI to output an output clock signal CKO; and a variable delay control circuit which cumulatively adds values obtained by subtracting N from M every cycle of the input clock signal CKI, when the addition result is N or more, performs a calculation which subtracts N from the addition result to obtain a calculation result K, and calculates, to a maximum delay amount in the variable delay circuit corresponding to one cycle of the input clock signal CKI, a control value corresponding to a delay amount of K/N of the maximum delay amount to give the control value to the variable delay circuit. | 03-04-2010 |
| 20100052792 | AMPLIFYING APPARATUS, METHOD OF OUTPUT CONTROL AND CONTROL PROGRAM - [PROBLEMS] To provide, for example, a pulse input type power amplifying apparatus that can be operated at low voltage and low power, effectively suppressing generation of harmonic component. | 03-04-2010 |
| 20100094577 | SIGNAL QUALITY MEASUREMENT DEVICE, SPECTRUM MEASUREMENT CIRCUIT, AND PROGRAM - Spectrum measurement circuit ( | 04-15-2010 |
| 20100164053 | SEMICONDUCTOR DEVICE - A semiconductor device includes a semiconductor wafer in which semiconductor chip forming regions and a scribe region located between the semiconductor chip forming regions are formed, a plurality of semiconductor chip circuit portions provided over the semiconductor wafer, a plurality of first conductive layers, provided in each of the semiconductor chip forming regions, which is electrically connected to each of the circuit portions, and a first connecting portion that electrically connects the first conductive layers to each other across a portion of the scribe region. An external power supply or grounding pad is connected to any one of the first conductive layer and the first connecting portion. The semiconductor device includes a communication portion, connected to the circuit portion, which performs communication with the outside by capacitive coupling or inductive coupling. | 07-01-2010 |
| 20100176893 | MODULATION DEVICE AND PULSE WAVE GENERATION DEVICE - Provided is a modulation device including a signal selection circuit selecting two carrier signals from a plurality of carrier signals having the same frequency and the same phase difference according to a defined control signal and outputting the selected carrier signals, and a phase interpolator adjusting the phase in smaller units than the phase difference between the plurality of carrier signals according to the control signal and modulating the frequency or the phase of the carrier signal into a baseband signal based on the carrier signals selected by the signal selection circuit to generate a carrier wave signal. | 07-15-2010 |
| 20100251046 | FAILURE PREDICTION CIRCUIT AND METHOD, AND SEMICONDUCTOR INTEGRATED CIRCUIT - Disclosed is a semiconductor integrated circuit including a first storage circuit and a second storage circuit that respectively store logic levels of an input to the delay circuit and an output of the delay circuit when a logic level of a clock line is changed, and a determination circuit that determines whether or not the results of the first storage circuit and the second storage circuit coincide or not. Even if a transistor or a wiring that constitutes the semiconductor integrated circuit has been degraded due to secular change or the like, a possibility of an anomaly or a failure in one of the operation circuits caused by the degradation can be predicted before the anomaly or the failure occurs. | 09-30-2010 |
| 20100259292 | SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND TEST METHOD THEREFOR - A semiconductor integrated circuit device includes: a normal output signal counter that counts number of times a normal output signal is output by the circuit under test in response to a preset one of the input signals of the input signal set, in case where a circuit under test repeats processing on each of one or more input signals of an input signal set sequentially, a plural number of times. | 10-14-2010 |
| 20100272149 | TEMPERATURE MEASURING DEVICE AND METHOD - Current reading means detects an output current of a current source whose output current varies with a variation in temperature and outputs a value proportional to the output current. The temperature of the current source corresponding to the output value of the current reading means which is proportional to the output current of the current source is measured, and a parameter for converting the output value to temperature information is determined from the output value of the current reading means and the measured value of the temperature of the current source corresponding to the output value. The output value of the current reading means is converted to the temperature information using the determined parameter. | 10-28-2010 |
| 20100283497 | SEMICONDUCTOR TESTING DEVICE, SEMICONDUCTOR DEVICE, AND TESTING METHOD - A semiconductor test apparatus, semiconductor device, and test method are provided that enable the realization of a high-speed delay test. Semiconductor test apparatuses ( | 11-11-2010 |
