Inventors list |
Assignees list |
Classification tree browser |
Top 100 Inventors |
Top 100 Assignees |
Klippel
Jon I. Klippel, Basking Ridge, NJ US
| Patent application number | Description | Published |
|---|---|---|
| 20080312952 | Regulating Use Of A Device To Perform A Procedure On A Subject - Among other things, whether a procedure can be performed on a subject using a procedure device, is governed based on control data prestored on a portable memory device; procedure data generated in connection with performing the procedure is stored on the portable memory device; the procedure data being stored in a manner that protects the privacy of the data in accordance with regulatory privacy restrictions that protect the subject with respect to the procedure. | 12-18-2008 |
Simon Francis Klippel, Knaresborough GB
| Patent application number | Description | Published |
|---|---|---|
| 20090051093 | CLAMP HEAD - The present invention provides clamp head comprising an arched body having upper and lower faces, a vertex and opposing unequal length arms. The body is further provided with a through aperture for a bolt or like threaded fastener which extends between the upper and lower faces in the region of the vertex. The aperture in the upper face is oval and tapers outwardly through the body in the direction of the lower face. The arms comprise a reaction arm having at its distal end a reaction face and a clamping arm having at its distal end a clamping face, the reaction and clamping faces being provided with respective formations. The formations of the reaction arm extend in a direction which is substantially transverse to the direction of the formations of the clamping arm. | 02-26-2009 |
Uwe Klippel, Freiberg DE
| Patent application number | Description | Published |
|---|---|---|
| 20100273636 | MIX AND REFRACTORY PRODUCT HAVING A HIGH HYDRATION RESISTANCE PRODUCED THEREFROM - Mix which comprises a) one or more very finely divided silicon dioxide powders having an average particle diameter of from 2 to 100 nm and a BET surface area of at least 30 m | 10-28-2010 |
Wolfgang Klippel, Dresden DE
| Patent application number | Description | Published |
|---|---|---|
| 20110015898 | METHOD AND ARRANGEMENT FOR DETECTING, LOCALIZING AND CLASSIFYING DEFECTS OF A DEVICE UNDER TEST - An arrangement and method for assessing and diagnosing the operating state of a device under test in the presence of a disturbing ambient noise and for detecting, localizing and classifying defects of the device which affect its operational reliability and quality. At least two sensors monitor signals at arbitrary locations which are affected by signals emitted by defects and by ambient noise sources. A source analyzer receives the monitored signals, identifies the number and location of the sources, separates defect and noise sources, and analyzes the deterministic and stochastic signal components emitted by each source. Defect and noise vectors at the outputs of the source analyzer are supplied to a defect classificator which detects invalid parts of the measurements corrupted by ambient noise, accumulates the valid parts, assesses the quality of the system under test and identifies the physical causes and location of the defects. | 01-20-2011 |