Patent application number | Description | Published |
20120287723 | METHOD AND CIRCUIT TO DISCHARGE BIT LINES AFTER AN ERASE PULSE - Disclosed here in a method that comprises performing an erase operation on multiple cells in a memory device, the performing comprising applying an erase voltage to the multiple cells, bit lines coupled to the multiple cells being thereby charged up; and discharging the bit lines by coupling the bit lines to a discharging line through a DC path. | 11-15-2012 |
20130235669 | HIGH VOLTAGE SWITCH CIRCUIT - Disclosed herein is a device that includes a first transistor coupled between an input terminal and an output terminal and including a control gate, a voltage-generating circuit configured to produce a voltage at the control gate of the first transistor, and a discharge circuit coupled between the input terminal of the first transistor and the control gate of the first transistor, the discharge circuit responding to a discharge signal to perform a discharge operation such that an electrical charge is discharged from the output terminal to the input terminal of the first transistor. | 09-12-2013 |
20130258780 | METHOD OF PROGRAMMING SELECTION TRANSISTORS FOR NAND FLASH MEMORY - Disclosed herein is a method that includes providing a non-volatile memory device which includes a plurality of cells, a plurality of selection transistors each having a gate and each coupled to associated one of the cells, and a selection line coupled in common to the gates of the selection transistors, applying a first program voltage to the selection line, and applying a second program voltage to the selection line when at least one of the selection transistors have not been shifted to a program condition. | 10-03-2013 |
20140071760 | SYSTEMS AND METHODS FOR ERASING CHARGE-TRAP FLASH MEMORY - FLASH memory device contains at least one memory stack. The stack of transistors includes a first (or source) selector transistor, a second (or drain) selector transistor, and a plurality memory cell transistors connected in series therebetween. During an erase operation, each of the first and second selector transistors has a bias applied that releases the select transistors from an electrically floating state together with biasing each of the memory cell transistors. | 03-13-2014 |
20140369125 | SEMICONDUCTOR DEVICE, DATA PROGRAMMING DEVICE, AND METHOD FOR IMPROVING THE RECOVERY OF BIT LINES OF UNSELECTED MEMORY CELLS FOR PROGRAMMING OPERATION - A device comprises a non-volatile memory array, a first selection circuit selecting whether to make a first connection path between a first bit line and a first circuit node, and selecting whether to make a second connection path between the first bit line and a second circuit node, a power supplying circuit supplying a power supply voltage to the first circuit node, the power supply voltage being, when the first connection path is selected to be made, supplied to the first bit line, and a first voltage supplying circuit supplying a first voltage to the second circuit node, the first voltage being, when the second connection path is selected to be made, supplied to the first bit line, the first voltage and the power supply voltage being higher than a ground potential, and the first voltage being higher than the power supply voltage. | 12-18-2014 |