| Patent application number | Description | Published |
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| 20080215923 | DESIGN STRUCTURE FOR TASK BASED DEBUGGER (TRANSACTION-EVENT -JOB-TRIGGER) - Disclosed is a design structure for an apparatus for a task based debugger (transaction-event-job-trigger). More specifically, an integrated event monitor for a SOC comprises functional cores each having a functional debug logic element. The cores are connected to an interconnect structure that links the functional debug logic elements. Each functional debug logic element is specifically dedicated to a function of its corresponding core, wherein the functional debug logic elements generate a table of function-specific system events. The system events are function-specific with respect to an associated core, wherein the system events include transaction events, controller events, processor events, interconnect structure arbiter events, interconnect interface core events, high speed serial link core events, and/or codec events. | 09-04-2008 |
| 20080215945 | System and method for system-on-chip interconnect verification - A system and method for verifying system-on-chip interconnect includes a first linear feedback shift register coupled to an output interface of a first system-on-chip component, a second linear feedback shift register instantiated in a second system-on-chip component, and a comparator coupled to the second linear feedback shift register and the input interface of the second system-on-chip. Another method for verifying includes generating a pseudo-random number sequence with the first linear feedback shift register and the second linear feedback shift register using an identical first initial state, and comparing an output of the first linear feedback shift register with an output of the second linear feedback shift register and reporting a miss-compare. | 09-04-2008 |
| 20080256503 | POWER MANAGEMENT ARCHITECTURE AND METHOD OF MODULATING OSCILLATOR FREQUENCY BASED ON VOLTAGE SUPPLY - A method and system for modulating logic clock oscillator frequency based on voltage supply. The system comprises a logic unit having a logic operation and a device to produce self-adjusting clocks to match the logic operation. The device is configured to use supply voltage as an independent variable to optimize device parameters for voltage variations. The invention is also directed to a design structure on which a circuit resides. | 10-16-2008 |
| 20080285338 | DETERMINING HISTORY STATE OF DATA IN DATA RETAINING DEVICE BASED ON STATE OF PARTIALLY DEPLETED SILICON-ON-INSULATOR - A system, method and program product for determining a history state of data in a data retaining device are disclosed. A state of a partially-depleted silicon-on-insulator (PD SOI) device coupled to a data retaining device is measured to indicate a body voltage of the PD SOI device. The body voltage of the PD SOI device may indicate, among others, how long the PD SOI device has been idling, which indirectly indicates how long data in the data retaining device has not been accessed. As such, the current invention may be used efficiently with, e.g., a cache replacement algorithm in a management of the data retaining device. | 11-20-2008 |
| 20080290896 | System and Method for Dynamically Executing a Function in a Programmable Logic Array - A reconfigurable logic array (RLA) system that includes an RLA and a programmer for reprogramming the RLA on a cyclical basis. A function (F) requiring a larger amount of logic than contained in the RLA is partitioned into multiple functional blocks. The programmer contains software that partitions the RLA into a function region FR located between two storage regions SR | 11-27-2008 |
| 20090024859 | STRUCTURE AND METHOD TO OPTIMIZE COMPUTATIONAL EFFICIENCY IN LOW-POWER ENVIRONMENTS - A method and structure to optimize computational efficiency in a low-power environment. A design structure is embodied in a machine readable medium used in a design process. The design structure includes a component to determine an optimal point for maximizing computational efficiency in a low-power environment, and a component to selectively control operation of at least one processing unit of a plurality of processing units in accordance with the determined optimal point. The design structure further includes at least one of a component for controlling a frequency of a clock signal transmitted to the at least one processing unit in accordance with the determined optimal point, and a component for determining a present power available. | 01-22-2009 |
| 20090024862 | STRUCTURE AND METHOD TO OPTIMIZE COMPUTATIONAL EFFICIENCY IN LOW-POWER ENVIRONMENTS - A method and structure to optimize computational efficiency in a low-power environment. The method includes determining an optimal point for maximizing computational efficiency in a low-power environment, and selectively controlling operation of at least one processing unit of a plurality of processing units in accordance with the determined optimal point. The structure includes a plurality of processing units, a load manager controlling selective parallel operation of at least one processing unit of the plurality of processing units, and an unregulated power source. | 01-22-2009 |
| 20090044054 | DYNAMIC CRITICAL PATH DETECTOR FOR DIGITAL LOGIC CIRCUIT PATHS - Method for correcting timing failures in an integrated circuit and device for monitoring an integrated circuit. The method includes placing a first and second latch near a critical path. The first latch has an input comprising a data value on the critical path. The method further includes generating a delayed data value from the data value, latching the delayed data value in the second latch, comparing the data value with the delayed data value to determine whether the critical path comprises a timing failure condition, and executing a predetermined corrective measure for the critical path. | 02-12-2009 |
| 20090044160 | DYNAMIC CRITICAL PATH DETECTOR FOR DIGITAL LOGIC CIRCUIT PATHS - Method for correcting timing failures in an integrated circuit and device for monitoring an integrated circuit. The method includes placing a first and second latch near a critical path. The first latch has an input comprising a data value on the critical path. The method further includes generating a delayed data value from the data value, latching the delayed data value in the second latch, comparing the data value with the delayed data value to determine whether the critical path comprises a timing failure condition, and executing a predetermined corrective measure for the critical path. The invention is also directed to a design structure on which a circuit resides. | 02-12-2009 |
| 20090058504 | SELF-POWERED VOLTAGE ISLANDS ON AN INTEGRATED CIRCUIT - The present disclosure is directed to self-powered voltage islands on an integrated circuit. A structure in accordance with an embodiment includes: an integrated circuit including a power source; a voltage island; and an on-board power source provided on the voltage island for powering the voltage island independently of the power source of the integrated circuit. | 03-05-2009 |
| 20090091351 | CHIP IDENTIFICATION SYSTEM AND METHOD - Disclosed are embodiments of on-chip identification circuitry. In one embodiment, pairs of conductors (e.g., metal pads, vias, lines) are formed within one or more metallization layers. The distance between the conductors in each pair is predetermined so that, given known across chip line variations, there is a random chance (i.e., an approximately 50/50 chance) of a short. In another embodiment different masks form first conductors (e.g., metal lines separated by varying distances and having different widths) and second conductors (e.g., metal vias separated by varying distances and having equal widths). The first and second conductors alternate across the chip. Due to the different separation distances and widths of the first conductors, the different separation distances of the second conductors and, random mask alignment variations, each first conductor can short to up to two second conductors. In each embodiment the resulting pattern of shorts and opens, can be used as an on-chip identifier or private key. | 04-09-2009 |
| 20090094566 | DESIGN STRUCTURE FOR CHIP IDENTIFICATION SYSTEM - Disclosed is a design structure for an on-chip identification circuitry. In one embodiment, pairs of conductors (e.g., metal pads, vias, lines) are formed within one or more metallization layers. The distance between the conductors in each pair is predetermined so that, given known across chip line variations, there is a random chance (i.e., an approximately 50/50 chance) of a short. In another embodiment different masks form first conductors (e.g., metal lines separated by varying distances and having different widths) and second conductors (e.g., metal vias separated by varying distances and having equal widths). The first and second conductors alternate across the chip. Due to the different separation distances and widths of the first conductors, the different separation distances of the second conductors and, random mask alignment variations, each first conductor can short to up to two second conductors. In each embodiment the resulting pattern of shorts and opens, can be used as an on-chip identifier or private key. | 04-09-2009 |
| 20090109741 | DETERMINING HISTORY STATE OF DATA IN DATA RETAINING DEVICE BASED ON STATE OF PARTIALLY DEPLETED SILICON-ON-INSULATOR - An integrated circuit and a design structure are disclosed. An integrated circuit may comprise: a data retaining device; a partially depleted silicon-on-insulator (PD SOI) device electrically coupled to the data retaining device; and a measurement device coupled to the PD SOI device for measuring a state of the PD SOI device indicating a body voltage thereof, the measuring device being communicatively coupled to a calculating means which determines a history state of a data in the data retaining device based on the measured state of the PD SOI device. | 04-30-2009 |
| 20090109781 | DETERMINING RELATIVE AMOUNT OF USAGE OF DATA RETAINING DEVICE BASED ON POTENTIAL OF CHARGE STORING DEVICE - An integrated circuit and a design structure are disclosed. An integrated circuit may comprise: a data retaining device; a charge storing device coupled to the data retaining device such that a use of the data retaining device triggers a charging of the charge storing device by a charge source; and means for measuring a potential of the charge storing device, the measuring means being communicatively coupled to a calculating mean which determines a relative amount of usage of the data retaining device based on the measured potential. | 04-30-2009 |
| 20090113358 | MECHANISM FOR DETECTION AND COMPENSATION OF NBTI INDUCED THRESHOLD DEGRADATION - The embodiments of the invention provide a design structure for detection and compensation of negative bias temperature instability (NBTI) induced threshold degradation. A semiconductor device is provided comprising at least one stress device having a voltage applied to its gate node and at least one reference device having a zero gate-to-source voltage. A controller is also provided to configure node voltages of the device and/or the reference device to reflect different regions of device operations found in digital and analog circuit applications. Moreover, the controller measures a difference in current between the stress device and the reference device to determine whether NBTI induced threshold degradation has occurred in the stress device. The controller also adjusts an output power supply voltage of the stress device until a performance of the stress device matches a performance of the reference device to account for the NBTI induced threshold degradation. | 04-30-2009 |
| 20090119625 | Structure for System Architectures for and Methods of Scheduling On-Chip and Across-Chip Noise Events in an Integrated Circuit - A design structure integrated circuit (IC) system architectures that allow for the reduction of on-chip or across-chip transient noise budgets by providing a means to avoid simultaneous high current demand events from at least two functional logic blocks, i.e., noise contributors, are disclosed. Embodiments of the IC system architectures include at least one noise event arbiter and at least two noise contributor blocks. A method of scheduling on-chip noise events to avoid simultaneous active transient noise events may include, but is not limited to: the noise event arbiter receiving simultaneously multiple requests-to-operate from multiple noise contributors; the noise event arbiter determining when each noise contributor may execute operations based on a pre-established dI/dt budget; and the noise event arbiter notifying each noise contributor as to when permission is granted to execute its operations. | 05-07-2009 |
| 20090132747 | STRUCTURE FOR UNIVERSAL PERIPHERAL PROCESSOR SYSTEM FOR SOC ENVIRONMENTS ON AN INTEGRATED CIRCUIT - A design structure including universal peripheral processor architecture on an integrated circuit (IC) includes first and second data buses coupled to interface logic devices for enabling communication between the first and second data buses including enabling interface of multiple signaling protocols. One or more processors communicate with the first and second data buses to manage control functions on the IC. A data path enables transfer of data between the first and second data buses, and communicates with data storage devices. A data control path enables communication between the data storage devices and the processors. | 05-21-2009 |
| 20090144673 | PARTIAL GOOD SCHEMA FOR INTEGRATED CIRCUITS HAVING PARALLEL EXECUTION UNITS - Processing engines (PE's) disposed on the substrate. Each processing engine includes a measurement and storage unit, and a PE controller coupled to each of the processing engines. The processing engines perform self-tests and store the results of the self-tests in the measurement and storage unit. The PE controller reads the results and selects a sub-set of processing engines based on the results and an optimization algorithm. | 06-04-2009 |
| 20090150726 | METHOD AND SYSTEM FOR EXTENDING THE USEFUL LIFE OF ANOTHER SYSTEM - Disclosed are embodiments of a method and an associated first system for extending product life of a second system in the presence of phenomena that cause the exhibition of both performance degradation and recovery properties within system devices. The first system includes duplicate devices incorporated into the second system (e.g., on a shared bus). These duplicate devices are adapted to independently perform the same function within that second system. Reference signal generators, a reference signal comparator, a power controller and a state machine, working in combination, can be adapted to seamlessly switch performance of that same function within the second system between the duplicate devices based on a measurement of performance degradation to allow for device recovery. A predetermined policy accessible by the state machine dictates when and whether or not to initiate a switch. | 06-11-2009 |
| 20090152591 | Design Structure for an On-Demand Power Supply Current Modification System for an Integrated Circuit - A design structure for a circuit that selectively connects an integrated circuit to elements external to the integrated circuits. The circuit includes and input/output element that selectively connects an input/output pin as a function of a power requirement or a signal bandwidth requirement of the integrated circuit. The input/output element includes one or more switching devices that connect the input/output pin to an external element, such as a power supply or external signal path. The input/output element also includes one or more switching devices that connect the input/output pin to an internal element, such as a power network or internal signal line. | 06-18-2009 |
| 20090249091 | SECONDARY POWER UTILIZATION DURING PEAK POWER TIMES - The invention generally relates to the utilization of electric power, and more particularly to systems and methods for selectively utilizing secondary power sources during peak power times. A method includes receiving a notification of a peak power time, and discontinuing use of a primary power supply and beginning use of a secondary power supply based upon the notification. | 10-01-2009 |
| 20090268541 | DESIGN STRUCTURE FOR ESTIMATING AND/OR PREDICTING POWER CYCLE LENGTH, METHOD OF ESTIMATING AND/OR PREDICTING POWER CYCLE LENGTH AND CIRCUIT THEREOF - A design structure is embodied in a machine readable medium for designing, manufacturing, or testing a design. The design structure includes a threshold register having a counter, a count register, and a non-volatile storage for storing a state when a value of the count register equals or exceeds a value of the threshold register. Also provided is a method of predicting and/or estimating a power cycle duration in order to save a state in non-volatile memory and a circuit. The method includes setting a threshold value; determining that the threshold value has been equaled or exceeded; and saving the state in the non-volatile memory at a first checkpoint based on the threshold value being equaled or exceeded. | 10-29-2009 |
| 20090273239 | SEMICONDUCTOR POWER DISTRIBUTION AND CONTROL SYSTEMS AND METHODS - A system for dynamic integrated circuit power distribution and control is disclosed. The system includes an external power consumption target generator configured to generate a power dissipation target for one or more integrated circuits. The system also includes a first integrated circuit that includes an IC power control unit coupled to the external power consumption target generator. The first integrated circuit also includes a first plurality of functional units, each functional unit of the first plurality including a unit power level control and a first power control grid coupling the IC power control unit to one or more of the first plurality of functional units. The IC power control unit is configured to generate a mode control signal which places at least one of plurality of functional units into a first mode of operation based upon the power consumption target. | 11-05-2009 |
| 20090276178 | WARRANTY MONITORING AND ENFORCEMENT FOR INTEGRATED CIRCUIT AND RELATED DESIGN STRUCTURE - An integrated circuit (IC) including a warranty and enforcement system, and a related design structure and HDL design structure are disclosed. In one embodiment, an IC includes a parameter obtainer for obtaining a value of a parameter of the IC; a warranty data storage system for storing warranty limit data regarding the IC; a comparator for determining whether a warranty limit has been exceeded by comparing the value of the parameter to a corresponding warranty limit; and an action taker for taking a prescribed action in response to the warranty limit being exceeded. | 11-05-2009 |
| 20090276232 | WARRANTY MONITORING AND ENFORCEMENT FOR INTEGRATED CIRCUIT - An integrated circuit (IC) including a warranty and enforcement system and a method are disclosed. In one embodiment, an IC includes a parameter obtainer for obtaining a value of a parameter of the IC; a warranty data storage system for storing warranty limit data regarding the IC; a comparator for determining whether a warranty limit has been exceeded by comparing the value of the parameter to a corresponding warranty limit; and an action taker for taking a prescribed action in response to the warranty limit being exceeded. | 11-05-2009 |
| 20090276644 | STRUCTURE FOR SEMICONDUCTOR POWER DISTRIBUTION AND CONTROL - A design structure for dynamic integrated circuit power distribution and control is disclosed. The design structure includes an external power consumption target generator configured to generate a power dissipation target for one or more integrated circuits. The design structure also includes a first integrated circuit that includes an IC power control unit coupled to the external power consumption target generator. The first integrated circuit also includes a first plurality of functional units, each functional unit of the first plurality including a unit power level control and a first power control grid coupling the IC power control unit to one or more of the first plurality of functional units. The IC power control unit is configured to generate a mode control signal which places at least one of plurality of functional units into a first mode of operation based upon the power consumption target. | 11-05-2009 |
| 20100231306 | POWER MANAGEMENT ARCHITECTURE AND METHOD OF MODULATING OSCILLATOR FREQUENCY BASED ON VOLTAGE SUPPLY - A method and system for modulating logic clock oscillator frequency based on voltage supply. The system comprises a logic unit having a logic operation and a device to produce self-adjusting clocks to match the logic operation. The device is configured to use supply voltage as an independent variable to optimize device parameters for voltage variations. The invention is also directed to a design structure on which a circuit resides. | 09-16-2010 |
| 20110099527 | DYNAMICALLY RECONFIGURABLE SELF-MONITORING CIRCUIT - A method configures a plurality of circuit elements for execution of an application in a first configuration. The method monitors the execution of the application on the plurality of circuit elements to produce monitoring information, using a computerized device, and stores the monitoring information in a storage structure. The method selectively communicates the monitoring information to an external element separate from the computerized device. The external element transforms the first configuration into a second configuration based on the monitoring information. The computerized device receives the second configuration from the external element and reconfigures the plurality of elements into the second configuration. | 04-28-2011 |
