| Patent application number | Description | Published |
|---|
| 20080288838 | NONVOLATILE SEMICONDUCTOR MEMORY SYSTEM - According to one embodiment, an electrical package includes: an external input portion; an external output portion; a plurality of integrated circuits that is compatible with a compressed deterministic pattern test, each of the integrated circuits including: an input portion; a decompressor that is connected to the input portion; scan chains that are connected to the decompressor; a compactor that is connected to the scan chains; a selector that is connected to the compactor and the input portion to selectively output an output of the compactor or an output of the input portion; and an output portion that is connected to the selector. | 11-20-2008 |
| 20090024885 | SEMICONDUCTOR INTEGRATED CIRCUIT AND TEST SYSTEM THEREOF - A semiconductor integrated circuit has a memory collar including a memory cell configured to store a written data pattern and read and output the data pattern, and a register configured to store a failed data pattern, and a built-in self test circuit configured to write the data pattern in the memory cell, output expected value data, and decide whether to continue a test or suspend the test to output failure information to outside, based on a comparison result of the data pattern outputted from the memory cell and the expected value data and a comparison result of the data pattern and the failed data pattern. | 01-22-2009 |
| 20090172483 | ON-CHIP FAILURE ANALYSIS CIRCUIT AND ON-CHIP FAILURE ANALYSIS METHOD - An on-chip failure analysis circuit for analyzing a memory comprises a memory in which data is stored, a built-in self test unit which tests the memory, an failure detection unit which detects an failure of output of the memory, an fail data storage unit in which fail data is stored, the fail data including a location of the failure, an failure analysis unit which performs failure analysis using the number of failures detected by the failure detection unit and the location of the failure, the failure analysis unit writing fail data including the analysis result in the fail data storage unit, and an analysis result output unit which outputs the analysis result of the failure analysis unit. | 07-02-2009 |
| 20100125766 | SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD FOR CONTROLLING SEMICONDUCTOR INTEGRATED CIRCUIT - A semiconductor integrated circuit includes memories, a BIST circuit, and an analyzer. The BIST circuit includes a test controller performing the test and generating a memory selection signal selecting a memory to be tested, an address generator generating write and read addresses, a data generator generating write data and an expected output value, and a control signal generator generating a control signal. The analyzer includes a memory output selector selecting output data, a bit comparator comparing the output data with the expected output value, an error detection unit determining whether there is an error in the memory, a plurality of pass/fail flag registers capable of storing a pass/fail flag, a repair analyzer analyzing a memory error and generating a repair analysis result, a plurality of repair analysis result registers capable of storing the repair analysis result, and an output unit outputting the pass/fail flag and the repair analysis result. | 05-20-2010 |
| 20100251043 | SEMICONDUCTOR INTEGRATED CIRCUIT, CIRCUIT FUNCTION VERYFICATION DEVICE AND METHOD OF VERYFYING CIRCUIT FUNCTION - A semiconductor integrated circuit has a data generation circuit configured to generate first data used for function verification of a built-in self test circuit and a built-in redundancy allocation circuit of a memory, a failure data generation circuit configured to generate second data for conducting a built in self test by inverting at least one bit of the first data based on a failure injection indication signal, and a timing circuit configured to adjust timing of at least one of the first and the second data in order to use one of the first and the second data as writing data to the memory and to use the other as an output expected value compared with data read out from the memory. | 09-30-2010 |
| 20110058434 | SEMICONDUCTOR INTEGRATED CIRCUIT - A semiconductor integrated circuit has a plurality of memory devices each comprising a memory cell array which includes a plurality of memory cells to store data, a spare part which includes a redundant cell to avoid a memory cell judged to be defective in the plurality of memory cells and conduct redundancy repair on data, and a switching circuit to avoid the defective memory cell and conduct switching to the redundant cell; and a repair code decoding circuit comprising a storage circuit which stores a repair code, a decoder which outputs a repair decoded signal obtained by decoding the repair code, wherein the switching circuit respectively in the memory devices avoids a memory cell corresponding to the repair decoded signal and conducts switching to the redundant cell of the memory devices in accordance with the repair decoded signal. | 03-10-2011 |
