| Patent application number | Description | Published |
|---|
| 20090121514 | Covering Frame for a Tarpaulin Structure - The invention relates to a covcring frame for a tarpaulin structure, comprising a number of bows, which can be displaced along lateral longitudinal beams ( | 05-14-2009 |
| 20110047760 | CLAMPING DEVICE - A clamping device for sliding roofs is provided in the region of the guidance and runner rail. An actuation lever is pivotable between locking and release positions. A clamping element is modifiable in its position by means of the actuation lever, which coacts with a countermember of the end carriage and moves the end carriage to the end of the guidance and runner rail. The clamping element is aligned with the guidance and runner rail, and is shiftable in a longitudinal direction, between a locking position retaining the end carriage, and a release position. The guide comprises in a subregion on the underside an open space such that upon shifting of the actuation lever into the release position, the clamping element is at least partly lowerable sufficiently that the end carriage can be displaced away from the end of the guidance and runner rail. | 03-03-2011 |
| 20110049926 | ROLLER CARRIAGE FOR A SLIDING BOW ROOF FOR A TRUCK OR TRUCK TRAILER - The invention relates to a roller carriage for a sliding bow roof for a truck or truck trailer. The roof encompasses guidance and runner rails, extending on the cargo surface of the truck along the longitudinal sides of the cargo surface. Roller carriages, which comprise rollers and on which retaining bows, embodied in gantry fashion and having a roof tarpaulin mounted thereon, are displaceably guided. At least one roller carriage is equipped with a securing device for preventing inadvertent shifting of the roller carriage along the rails. The securing device encompasses a wedge element associated with a roller, which element is shiftable between a release position and a secured position. In its release position it has no contact with the roller. In its secured position a portion of the wedge element is between the roller and the corresponding guidance and runner rail. | 03-03-2011 |
| Patent application number | Description | Published |
|---|
| 20090164931 | Method and Apparatus for Managing Test Result Data Generated by a Semiconductor Test System - Methods, apparatus, and computer readable media for managing test result data generated by a semiconductor test system are described. Examples of the invention can relate to managing test result data generated by a semiconductor test system. In some examples, test result data is obtained from the semiconductor test system responsive to testing of a device under test (DUT). The test result data is processed for storage in a relational database using an interface generated in part based on design information of the DUT. | 06-25-2009 |
| 20090235131 | METHOD AND APPARATUS FOR PROCESSING FAILURES DURING SEMICONDUCTOR DEVICE TESTING - Methods and apparatus for processing failures during semiconductor device testing are described. Examples of the invention can relate to testing a device under test (DUT). Fail capture logic can be provided, coupled to test probes and memory, to indicate only first failures of failures detected on output pins of the DUT during a test for storage in the memory. | 09-17-2009 |
| 20100050029 | Method And Apparatus For Testing Semiconductor Devices With Autonomous Expected Value Generation - Method and apparatus for testing semiconductor devices with autonomous expected value generation is described. Examples of the invention can relate to apparatus for interfacing a tester and a semiconductor device under test (DUT). An apparatus can include output processing logic configured to receive test result signals from the DUT responsive to testing by the tester, the output processing logic voting a logic value of a majority of the test result signals as a correct logic value; and memory configured to store indications of whether each of the test result signals has the correct logic value. | 02-25-2010 |
| 20100079159 | METHOD AND APPARATUS FOR PROVIDING A TESTER INTEGRATED CIRCUIT FOR TESTING A SEMICONDUCTOR DEVICE UNDER TEST - Methods and apparatus for providing a tester integrated circuit (IC) for testing a semiconductor device under test (DUT) are described. Examples of the invention can relate to an apparatus for testing a semiconductor device under test (DUT). In some examples, the apparatus can include an integrated circuit (IC) coupled to test probes configured to contact pads on the DUT, the IC including a plurality of dedicated test circuits coupled to programmable logic, the programmable logic responsive to programming data to form a tester for testing the DUT from at least one of the dedicated test circuits. | 04-01-2010 |
