Patent application number | Description | Published |
20090028652 | ELECTRIC DRILL - An electric drill having a function for preventing drilling of unexpected oblique hole. Further, in the electric drill, when the direction of drilling is displaced in drilling work using the electric drill, it is sensed automatically to stop the drilling. The electric drill ( | 01-29-2009 |
20090048796 | TEST APPARATUS - A test apparatus for testing a device under test includes a multi-strobe generating section that generates a plurality of strobe signals with different phases in each of cycles of an output signal output from the device under test, a plurality of timing comparing sections that obtain a value of the output signal respectively at timings of the plurality of strobe signals, a transition detecting section that generates transition data identifying one of the plurality of strobe signals which is positioned at a transition of the output signal, based on the values of the output signal which are respectively obtained at the timings of the plurality of strobe signals, a transition memory that sequentially stores thereon the transition data input thereto, a selecting section that selects, in association with each of the cycles of the output signal, whether to input the transition data output from the transition detecting section into the transition memory, and a calculating section that calculates jitter of the output signal based on the transition data stored on the transition memory. | 02-19-2009 |
20090060023 | TRANSMISSION CIRCUIT, CMOS SEMICONDUCTOR DEVICE, AND DESIGN METHOD THEREOF - A transmission circuit, which transmits a differential signal having pulse time larger than a predetermined minimum pulse time, includes: a driving unit for feeding the differential signal as a potential difference between two transmission lines; a driven unit for operating on the basis of the differential signal by receiving the differential signal by the potential difference between the two transmission lines; and a connecting resistor for electrically connecting the two transmission lines. Further, a connecting MOS transistor may be provided near a receiving end of the driven unit. | 03-05-2009 |
20100085561 | LASER SCATTERING DEFECT INSPECTION SYSTEM AND LASER SCATTERING DEFECT INSPECTION METHOD - A laser scattering defect inspection system includes: a stage unit that rotates a workpiece W and transports the workpiece W in one direction; a laser light source that emits a laser beam LB toward the workpiece W mounted on the stage unit; an optical deflector that scans the laser beam LB emitted from the laser light source on the workpiece W; an optical detector that detects the laser beam LB scattered from the surface of the workpiece W; a storage unit that stores defect inspection conditions for each inspection step of a manufacturing process of the workpiece W, where the conditions include the rotation speed and the moving speed of the workpiece W by the stage unit, the scan width on the workpiece W and the scan frequency by the optical deflector; and a control unit that reads the defect inspection conditions stored for each inspection step in the storage unit and controls the driving of the stage unit and the optical deflector under the conditions. | 04-08-2010 |
20100092254 | ELECTRIC DRILL - An electric drill having a function for preventing drilling of unexpected oblique hole. Further in the electric drill, when the direction of drilling is displaced in drilling work using the electric drill, it is sensed automatically to stop the drilling. The electric drill ( | 04-15-2010 |
20100259435 | DELAY CIRCUIT - A delay circuit includes a MOSFET and bias voltage sources. The bias voltage sources apply a voltage difference between the drain and source of the MOSFET. The bias voltage source supplies a source voltage to a source electrode of the MOSFET. The bias voltage source supplies a drain voltage to a drain electrode of the MOSFET. An input signal to be delayed is propagated through the gate of the MOSFET in the gate width direction (y-axis direction). | 10-14-2010 |
20100327983 | RING OSCILLATOR - Multiple multi-stage delay circuits each have n (n is an integer) output terminals. The multi-stage delay circuits each apply delay times to a corresponding input signal, and output, via n output terminals, n delayed signals to which different delay times have been applied. Multiple inverters invert the respective input signals. The multiple multi-stage delay circuits and multiple inverters are alternately connected in the form of a ring. | 12-30-2010 |
20110089983 | LOOP TYPE CLOCK ADJUSTMENT CIRCUIT AND TEST DEVICE - A variable delay circuit applies a variable delay that corresponds to an analog signal to a reference clock so as to generate a delayed clock. A phase detection unit detects the phase difference between the delayed clock and the reference clock, and generates a phase difference signal having a level that corresponds to the phase difference. A counter performs a counting up operation or a counting down operation according to the level of the phase difference signal. A digital/analog converter converts the count value of the counter into an analog signal, and supplies the count value thus converted to the variable delay circuit. The counter comprises: a first counter configured to use a first thermometer code to count the lower group of digits of the count value according to the phase difference signal; a second counter configured to use a second thermometer code to count an upper group of digits of the count value according to the phase difference signal; and a control circuit configured to perform a control operation such that the Hamming distance is maintained at 1 even in a carry operation and a borrow operation of the first counter and the second counter. | 04-21-2011 |
20110133973 | TIME MEASUREMENT CIRCUIT - A time measurement circuit measures the time difference between edges of a first signal and a second signal. A sampling circuit acquires the logical level of the first signal at a timing of the edge of the second signal. When a sampling circuit enters a metastable state, an output signal thereof transits with a long time scale. A transition time measurement circuit measures a transition time (settling time) of the output signal of the sampling circuit in the metastable state. | 06-09-2011 |
20110172957 | TEST APPARATUS AND TEST METHOD - A first transform unit transforms clock change point information which indicates the change timing of a clock signal into information with respect to the frequency domain thereof so as to generate first clock change point frequency information. A digital filter performs filtering of the first clock change point frequency information so as to generate second clock change point frequency information. A second transform unit inverse-transforms the second clock change point frequency information into information with respect to the time domain so as to generate second clock change point information. A judgment unit evaluates a DUT based upon difference data between the change timing represented by the data change point information and the change timing represented by the second clock change point information in increments of phases. | 07-14-2011 |
20110181308 | TEST APPARATUS AND TESTING METHOD - A main power supply supplies a power supply voltage to a power supply terminal of a DUT. A control pattern generator generates a control pattern including a pulse sequence. A compensation circuit intermittently injects a compensation current to the power supply terminal of the DUT via a path different from that of the main power supply. A switch is arranged between an output terminal of a voltage source and the power supply terminal of the DUT, and is turned on and off according to the control pattern. | 07-28-2011 |
20110202296 | TEST APPARATUS AND TEST METHOD - A data signal is transmitted synchronously with a clock signal, and contains n phases (n represents an integer of 2 or more) of data for each cycle of the clock signal. A first time to digital converter generates clock change point information which represents the change timing of the clock signal. A second time to digital converter receives a data sequence in increments of cycles of the clock signal, and generates data change point information items which represent the change timing of the data in increments of phases of the data. A calculation unit calculates difference data between the change timing represented by the data change point information and the change point timing represented by the clock change point information in increments of phases. A judgment unit judges a DUT based upon the difference data received from the calculation unit. | 08-18-2011 |