# Katsumi Homma, Kawasaki JP

## Katsumi Homma, Kawasaki JP

Patent application number | Description | Published |
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20080222586 | Delay analysis apparatus, delay analysis method and computer product - Within-die delay distributions and die-to-die delay distributions of two arbitrary paths in an analysis target circuit are extracted from a delay distribution library, and an effect index indicative of a relative error of an overall path delay distribution of one path and an overall path delay distribution when the two paths are integrated as one path is calculated based on the within-die delay distributions and the die-to-die delay distributions of the two paths. When the effect index is determined to be equal to or above a threshold, the overall path delay distribution of the two paths integrated as one path is calculated. Hence, a path that affects an analysis result alone is selected to execute a statistical Max operation, thereby increasing a speed of delay analysis processing. | 09-11-2008 |

20080244487 | Delay analysis support apparatus, delay analysis support method and computer product - A delay analysis support apparatus that supports analysis of delay in a target circuit includes an acquiring unit that acquires error information concerning a cell-delay estimation error that is dependent on a characterizing tool; an error calculating unit that calculates, based on the error information and a first probability density distribution concerning the cell delay of each cell and obtained from the cell delay estimated by the characterizing tool, a second probability density distribution that concerns the cell-delay estimation error of each cell; and an linking unit that links the second probability density distribution and a cell library storing therein the first probability density distribution. | 10-02-2008 |

20090007044 | Design support method and apparatus, and computer product - A design support apparatus includes an extracting unit that extracts a first cell from among plural cells in a target circuit; a detecting unit that detects a second cell arranged adjacent to the first cell; and a setting unit that sets a delay value of the first cell according to an arrangement pattern of the second cell. | 01-01-2009 |

20090055142 | METHOD AND APPARATUS FOR ESTIMATING MAN-HOURS - A method for estimating a man-hours of an entire project having a series of tasks with a computer includes, inputting an estimated man-hours of the each task, acquiring model functions for extracting estimation errors included in the estimated man-hours of the each task based on an attribute of a worker who performs the each task, calculating a probability density distribution representing estimation errors depending on the attribute and a probability density distribution representing modeling errors depending on methods for estimating the man-hours for each task using the model functions, calculating man-hours of the entire project having a series of tasks for the each task using statistical methods to accumulate the probability density distribution representing estimation errors and the probability density distribution representing the modeling errors, and outputting calculating results of man-hours of the entire project to a output device. | 02-26-2009 |

20090138838 | METHOD AND APPARATUS FOR SUPPORTING DELAY ANALYSIS, AND COMPUTER PRODUCT - A delay distribution of a partial path that passes through a node to which a plurality of signals is input and for which an estimation in a statistical MAX is predicted to be large, that is present on a critical path having large influence on a circuit delay, and that has high possibility of improving the circuit delay, among nodes in a circuit graph is calculated by the Monte Carlo simulation instead of the block based simulation, thereby increasing speed and accuracy of delay analysis. | 05-28-2009 |

20090222773 | LEAKAGE CURRENT ANALYZING APPARATUS, LEAKAGE CURRENT ANALYZING METHOD, AND COMPUTER PRODUCT - A leakage current analyzing apparatus receives input of data used for analysis and indicating intra/inter-chip variation concerning the gate length of transistors constituting cells in a circuit to be designed, where the inter-chip variation is handled as a discrete probability density distribution R. Using the data input, the leakage current analyzing apparatus obtains a cumulative probability density for a leakage current value (of the circuit) that is equal to or less than each arbitrary leakage current value I | 09-03-2009 |

20100017765 | MONITOR POSITION DETERMINING APPARATUS AND MONITOR POSITION DETERMINING METHOD - A monitor position determining apparatus includes an acquiring unit that acquires design data concerning circuit elements arranged in a layout of a semiconductor device and for each of the circuit elements, yield sensitivity data indicative of a percentage of change with respect to a yield ratio of the semiconductor device; a selecting unit that selects, based on the yield sensitivity data, a circuit element from a circuit element group arranged in the layout; a determining unit that determines an arrangement position in the layout to be an installation position of a monitor that measures a physical amount in the semiconductor device in a measurement region, the arrangement position being of the circuit element that is specified from the design data acquired by the acquiring unit and selected by the selecting unit; and an output unit that outputs the installation position determined by the determining unit. | 01-21-2010 |

20100131249 | METHOD AND APPARATUS FOR SUPPORTING VERIFICATION OF LEAKAGE CURRENT DISTRIBUTION - A leakage current distribution verification support method includes a process including obtaining the estimated number L of cells in the custom macro circuit and the first arithmetic expression including a polynomial with a term having a common parameter α representing variations arising from each cell in the custom macro circuit and with a term having a parameter β representing variations arising from the entirety of the custom macro circuit, generating a second arithmetic expression including a polynomial with a term having a parameter α | 05-27-2010 |

20100292977 | SUPPORT COMPUTER PRODUCT, APPARATUS AND METHOD - A computer-readable recording medium stores therein a program causing a computer that accesses a simulator to execute receiving a measured yield distribution that expresses an actually measured yield distribution concerning leak current of a circuit-under-design, and model data for leak current of a cell of the circuit-under-design; providing the simulator with the model data and values for a normal distribution concerning variation components of the leak current of the cell; acquiring the leak current of the circuit-under-design; calculating, based on the acquired leak current, an estimated yield distribution concerning the leak current of the circuit-under-design; calculating values for the normal distribution that minimize error between the measured yield distribution and the estimated yield distribution; setting an initial value to the normal distribution and the calculated values for the normal distribution to the normal distribution; and outputting the estimated yield distribution that is based on the leak current of the circuit-under-design. | 11-18-2010 |

20110125480 | COMPUTER PRODUCT, ANALYSIS SUPPORT APPARATUS, AND ANALYSIS SUPPORT METHOD - A non-transitory, computer-readable recording medium stores therein a program causing a computer to execute calculating, using respective standard deviations of first delay distributions of delay variation independent to each element included in a path among parallel paths in a circuit, standard deviation of a first delay distribution of the path when modeled as a series circuit; correcting the standard deviation of the first delay distribution for each element, using the calculated standard deviation of the first delay distribution of the path and a standard deviation of a first delay distribution of the path obtained by a statistical delay analysis on the circuit; obtaining a correlation distribution representing a correlation between delay and leak current of the circuit by executing, using the corrected standard deviation of the first delay distribution for each element, correlation analysis between delay and leak current of the target circuit; and outputting the obtained correlation distribution. | 05-26-2011 |

20110276286 | ANALYSIS SUPPORT COMPUTER PRODUCT, APPARATUS, AND METHOD - A computer-readable, non-transitory medium stores a program that causes a computer to execute a process including acquiring a unique coefficient that is unique to a device in a circuit under test and is included in a function expressing fluctuation of leak current of the device; detecting as a group and based on the unique coefficient, devices having an identical or similar characteristic; converting first random variables into a single second random variable, the first random variables expressing fluctuation of leak current unique to each of the detected devices; yielding a function that expresses fluctuation of leak current of the detected devices, using the second random variable; and outputting the yielded function. | 11-10-2011 |