Patent application number | Description | Published |
20090059647 | SEMICONDUCTOR STORAGE DEVICE - A memory cell array has memory cells, each of which has a ferroelectric capacitor and a selection transistor. A plate line is connected to one end of the ferroelectric capacitor and applied a certain plate line voltage. A sense amplifier circuit senses and amplifies voltage of the bit line. An error correction circuit corrects any error in retained data in the memory cells sensed by the sense amplifier. A plate line control circuit controls the timing for switching a potential of the plate line to a ground potential, based on absence or presence of error correction by the error correction circuit. | 03-05-2009 |
20090103349 | SEMICONDUCTOR MEMORY DEVICE - A first memory cell array includes a first bit line and a second bit line arranged to read data out of a memory cell containing a ferroelectric capacitor. A second memory cell array includes a third bit line and a fourth bit line arranged to read data out of a memory cell containing a ferroelectric capacitor. A sense amp circuit detects and amplifies a potential difference caused between any two of the first through fourth bit lines. A decoupling circuit selectively connects any two of the first through fourth bit lines to the sense amp circuit and decouples the remainder from the sense amp circuit. A bit-line potential control circuit is arranged between the decoupling circuit and the first and second memory cell arrays to fix the bit lines decoupled from the sense amp circuit by the decoupling circuit to a first potential. | 04-23-2009 |
20090282318 | SEMICONDUCTOR MEMORY DEVICE - A semiconductor memory device according to an aspect of the present invention includes a memory cell array that includes a ferroelectric capacitor and a selection transistor that selects a column of the memory cell array and connects the selected column to a bit line. A plate line applies a potential for reading or writing data to the ferroelectric capacitor. A sense amplifier circuit compares and amplifies a signal read from the ferroelectric capacitor to the bit line. A plate line control circuit controls a potential of the plate line synchronously with a clock signal. | 11-12-2009 |
20100014342 | SEMICONDUCTOR STORAGE DEVICE - A memory includes a cell block comprises memory cells connected in series; block select transistors connected to one ends of the cell blocks; bit lines; plate lines; a sense amplifier comprises an N-type sensor and a P-type sensor, the N-type sensor applying a low-level potential to the bit line, and the P-type sensor applying a high-level potential to the bit line; local data lines corresponding to the bit lines respectively and transmitting data; and a column select transistor between one of the bit lines and one of the local data lines; wherein either one of the P-type sensor and the N-type sensor is set in an inactive state with the other one of the P-type sensor and the N-type sensor being in an active state, when the column select transistor is turned on to transmit the data to be written from the local data line to the bit line. | 01-21-2010 |
20100073987 | SEMICONDUCTOR MEMORY DEVICE AND DRIVING METHOD OF SEMICONDUCTOR MEMORY DEVICE - A memory includes a memory cell array comprising memory cells; word lines connected to gates of the cell transistors; bit lines connected to one ends of the memory cells on the cell transistor side; plate lines connected to the other ends of the memory cells on the ferroelectric capacitor side; a sense amplifier detecting data stored in the ferroelectric capacitor; an error correcting circuit correcting error bits when such error bits exist in pieces of data; a redundancy cell array comprising redundancy cells; and a ferroelectric fuse corresponding to the redundancy cell and configured to indicate whether data is stored in the corresponding redundancy cell, wherein when error bits exist in the data read from the memory cell array, the data corrected by the error correcting circuit is written in the redundancy cell and a polarization state of the ferroelectric fuse corresponding to that redundancy cell is changed accordingly. | 03-25-2010 |
20100128513 | SEMICONDUCTOR MEMORY DEVICE - A memory cell array includes a memory cell comprising a ferroelectric capacitor and a transistor arranged therein. A plate line applies a drive voltage to one end of the ferroelectric capacitor. A bit line reads data stored in the memory cell from the other end of the ferroelectric capacitor. A sense amplifier circuit detects and amplifies a signal read to the bit line from the ferroelectric capacitor. A bit line voltage control circuit performs control of changing a voltage of the bit line to which the signal is read, thereby pulling up a potential difference between the plate line and the bit line, prior to operation of the sense amplifier circuit for data read. The bit line voltage control circuit varies a range of variation of the voltage of the bit line depending on ambient temperature. | 05-27-2010 |
20120063215 | SEMICONDUCTOR STORAGE DEVICE - A semiconductor storage device includes first to fourth switch circuit. The semiconductor storage device includes a row decoder which controls a voltage of a word line. The semiconductor storage device includes a first selection transistor of which a control terminal is connected to the word line. The semiconductor storage device includes a first resistance change element which is connected in series to the first selection transistor between the first bit line and the second bit line, and of which a resistance value changes according to a flowing current. The semiconductor storage device includes a second selection transistor of which a control terminal is connected to the word line. The semiconductor storage device includes a second resistance change element which is connected in series to the second selection transistor between the second bit line and the third bit line, and of which a resistance value changes according to a flowing current. | 03-15-2012 |
20120069639 | SEMICONDUCTOR STORAGE DEVICE - A memory according to an embodiment includes bit lines, word lines, source lines, magnetic tunnel junction elements and transistors that are serially connected between the bit lines and the source lines, respectively, and a sense amplifier that detects data stored in the magnetic tunnel junction elements. The semiconductor storage device includes multiplexers between the bit lines and the sense amplifier in order to select one of the bit lines to be connected to the sense amplifier, and write amplifiers that are located corresponding to memory cell blocks each of which includes memory cells each including the magnetic tunnel junction element and the transistor and are connected to the bit lines or connected via the multiplexers to the bit lines. To write data, the sense amplifier applies a write voltage to the bit lines and then the write amplifiers hold the write voltage. | 03-22-2012 |
20120243304 | SEMICONDUCTOR STORAGE DEVICE - A semiconductor storage device according to the present embodiment comprises a plurality of bit lines, a plurality of word lines, and a plurality of memory cells corresponding to intersections between the bit lines and the word lines, respectively, and including magnetic tunnel junction elements capable of storing data. A plurality of sense amplifiers respectively correspond to the bit lines and are configured to detect data stored in the memory cells via a bit line selected from among the corresponding bit lines. A plurality of read latch parts correspond to the sense amplifiers, respectively, and are configured to latch data detected by the corresponding sense amplifiers. A plurality of read global data buses are connected to the read latch parts, respectively, and are configured to consecutively transmit data latched by the read latch parts at a time of a data read operation. | 09-27-2012 |
20130107638 | SEMICONDUCTOR STORAGE DEVICE | 05-02-2013 |
20140068154 | SEMICONDUCTOR MEMORY DEVICE - According to one embodiment, a semiconductor memory device includes a first memory circuit and a first controller. The first memory circuit includes a register in which a read page size is stored, and a memory cell array. The first controller is configured to access the first memory circuit by the page size stored in the register, in one of an open page policy and closed page policy. | 03-06-2014 |
20140254254 | SEMICONDUCTOR STORAGE DEVICE AND DRIVING METHOD THEREOF - A memory includes a cell array including nonvolatile memory cells. A power generator generates a power supply voltage for driving the cell array. A receiver receives a command and an address. A controller controls an active state of the cell array, the power generator, and the receiver. In an activation mode, the cell array, the power generator, and the receiver are turned into the active states. In a first power saving mode, the cell array, the power generator, and the receiver are turned into inactive states. In a second power saving mode, the cell array and the power generator are turned into the active states, and the receiver is turned into the inactive state. In a third power saving mode, at least a part of the power generator is turned into the active state, and the cell array and the receiver are turned into the inactive states. | 09-11-2014 |
20140328118 | SEMICONDUCTOR STORAGE DEVICE - A semiconductor storage device according to the present embodiment includes a plurality of bit lines, a plurality of word lines, and a plurality of memory cells corresponding to intersections between the bit lines and the word lines, respectively, and including magnetic tunnel junction elements capable of storing data. A plurality of sense amplifiers respectively correspond to the bit lines and are configured to detect data stored in the memory cells via a bit line selected from among the corresponding bit lines. A plurality of read latch parts correspond to the sense amplifiers, respectively, and are configured to latch data detected by the corresponding sense amplifiers. A plurality of read global data buses are connected to the read latch parts, respectively, and are configured to consecutively transmit data latched by the read latch parts at a time of a data read operation. | 11-06-2014 |
20140355336 | SEMICONDUCTOR MEMORY DEVICE - According to one embodiment, the semiconductor memory device includes a first memory cell, first, second, third and fourth interconnect lines and first, second and third write circuits. The first memory cell includes a first magnetic tunnel junction (MTJ) element. The first interconnect line is connected to one end of the first memory cell. The first write circuit drives the first interconnect line. The second interconnect line is connected to the other end of the first memory cell. The second write circuit drives the second interconnect line. The third and fourth interconnect lines are adjacent to the first memory cell. The third write circuit drives the third and fourth interconnect lines. | 12-04-2014 |
20150070982 | SEMICONDUCTOR STORAGE DEVICE - According to one embodiment, a semiconductor storage device includes a cell array including resistance change elements formed above a semiconductor substrate; first cell transistors formed on the semiconductor substrate and provided in association with the resistance change elements; first gate electrodes included in the first cell transistor and extending in a first direction; a first bit lines electrically connected to the resistance change elements respectively and extending in a second direction perpendicular to the first direction; a second bit lines electrically connected to one end of a current path of the first cell transistors respectively and extending in the second direction; and first active areas in which the first cell transistors are formed, and which extend in a direction crossing the first direction at a first angle. | 03-12-2015 |
20150074491 | MAGNETIC RANDOM ACCESS MEMORY - According to one embodiment, a magnetic random access memory includes memory cells, a read circuit, (ECC) circuit, an address register, a flag register, a flag check circuit, and a write back circuit. The memory cells each include a magnetoresistive element. The address register stores the address at which the error has been detected by the ECC circuit. The data register stores corrected data in which the error has been corrected by the ECC circuit. The flag register sets an error flag in association with the address at which the error has been detected by the ECC circuit. The flag check circuit checks whether the error flag is set in the flag register. The write back circuit writes back the data to the memory cell designated by the address corresponding to the error flag. | 03-12-2015 |