Patent application number | Description | Published |
20080283778 | Apparatus for ion beam fabrication - The apparatus for ion beam fabrication, which has been able to detect any anomalous condition of ion beams only by means of the current irradiated on the specimen, could not compensate the failure by investigating the cause and could not realize stable processing. To solve the problem described above, the present invention includes the first and second blankers and Faraday cups switches ON and OFF the first and second blankers and monitors beam current at two positions above and below the projection mask. By adopting this configuration, it will be possible to acquire the information on failure in ion beam, sort out the cause of the failure and to compensate the failure while limiting damages to the projection mask. As a result, it will be possible to realize stable processing by means of ion beam, and to use the ion beam fabricating device on a stable basis. | 11-20-2008 |
20090230299 | ION SOURCE, ION BEAM PROCESSING/OBSERVATION APPARATUS, CHARGED PARTICLE BEAM APPARATUS, AND METHOD FOR OBSERVING CROSS SECTION OF SAMPLE - An ion beam machining and observation method relevant to a technique of cross sectional observation of an electronic component, through which a sample is machined by using an ion beam and a charged particle beam processor capable of reducing the time it takes to fill up a processed hole with a high degree of flatness at the filled area. The observation device is capable of switching the kind of gas ion beam used for machining a sample with the kind of a gas ion beam used for observing the sample. To implement the switch between the kind of a gas ion beam used for sample machining and the kind of a gas ion beam used for sample observation, at least two gas introduction systems are used, each system having a gas cylinder a gas tube, a gas volume control valve, and a stop valve. | 09-17-2009 |
20100176297 | ION BEAM PROCESSING APPARATUS - An ion beam processing apparatus includes an ion beam irradiation optical system that irradiate a rectangular ion beam to a sample held on a first sample stage, an electron beam irradiation optical system that irradiates an electron beam to the sample, and a second sample stage on which a test piece, extracted from the sample by a probe, is mounted. An angle of irradiation of the ion beam can be tilted by rotating the second sample stage about a tilting axis. A controller controls the width of skew of an intensity profile representing an edge of the rectangular ion beam in a direction perpendicular to a first direction in which the tilting axis of the second sample stage is projected on the second sample stage surface so that the width will be smaller than the width of skew of an intensity profile representing another edge of the ion beam in a direction parallel to the first direction. | 07-15-2010 |
20130284593 | ION SOURCE, ION BEAM PROCESSING/OBSERVATION APPARATUS, CHARGED PARTICLE BEAM APPARATUS, AND METHOD FOR OBSERVING CROSS SECTION OF SAMPLE - An ion beam machining and observation method relevant to a technique of cross sectional observation of an electronic component, through which a sample is machined by using an ion beam and a charged particle beam processor capable of reducing the time it takes to fill up a processed hole with a high degree of flatness at the filled area. The observation device is capable of switching the kind of gas ion beam used for machining a sample with the kind of a gas ion beam used for observing the sample. To implement the switch between the kind of a gas ion beam used for sample machining and the kind of a gas ion beam used for sample observation, at least two gas introduction systems are used, each system having a gas cylinder, a gas tube, a gas volume control valve, and a stop valve. | 10-31-2013 |
20130320209 | ION BEAM PROCESSING APPARATUS - An ion beam processing apparatus includes an ion beam irradiation optical system that irradiates a rectangular ion beam to a sample on a first sample stage, an electron beam irradiation optical system that irradiates an electron beam to the sample, and a second sample stage to hold a test piece, extracted from the sample. The ion beam can be tilted by rotating the second sample stage about a tilting axis. A controller controls the width of skew of an intensity profile representing an edge of the rectangular ion beam in a direction perpendicular to a first direction in which the tilting axis of the second sample stage is projected on the second sample stage surface so that the width will be smaller than the width of skew of an intensity profile representing another edge of the ion beam in a direction parallel to the first direction. | 12-05-2013 |
Patent application number | Description | Published |
20140349754 | MANAGEMENT SERVER, CONTROLLING METHOD THEREOF, NON-TRANSITORY COMPUTER READABLE STORAGE MEDIUM HAVING STORED THEREON A COMPUTER PROGRAM FOR A MANAGEMENT SERVER AND TERMINAL DEVICE - If a management server receives an access request, the management server performs a first ranking processing. A CPU extracts records satisfying a predetermined condition by referring to a relation table, and specifies one or plural user identification information included in the extracted records. The CPU accumulates the number of the specified user identification information for each of games, and specifies descending order of popularity of the games using the accumulated number. The CPU arranges information including explanations of the games in descending order of the number of users playing the games, and generates a first ranking page. The CPU sends an access response including the first ranking page back to a terminal device. | 11-27-2014 |
20140351338 | MANAGEMENT SERVER, CONTROLLING METHOD THEREOF, NON-TRANSITORY COMPUTER READABLE STORAGE MEDIUM HAVING STORED THEREON A COMPUTER PROGRAM FOR A MANAGEMENT SERVER AND TERMINAL DEVICE - A management server is provided with an accepting unit for accepting identification information identifying an application, a specifying unit adapted for specifying a part or all of candidate users satisfying all of conditions out of one or more users with whom a request user's friendship is built in one or more utilized applications that the request user has utilized, a first condition in which the candidate user utilizes the application identified by the identification information, a second condition in which the request user's friendship with the candidate user has not been built in the identified application, a third condition in which a friend upper limit is not encountered, and a display controlling unit adapted for displaying the part or all of the candidate users specified by the specifying unit in the terminal device of the request user in order to select one or more users from the part or all of the candidate users. | 11-27-2014 |
20140351339 | MANAGEMENT SERVER, CONTROLLING METHOD THEREOF, NON-TRANSITORY COMPUTER READABLE STORAGE MEDIUM HAVING STORED THEREON A COMPUTER PROGRAM FOR A MANAGEMENT SERVER AND TERMINAL DEVICE - If a management server receives an invitation request, the management server acquires a requester's reference identification information corresponding to a requester's user identification information, a receiver's reference identification information corresponding to a receiver's user identification information, and an identification information, by referring to a user information table. The management server generates a record in which a status information is set to “pending”, and records the record in an invitation table. Assuming that the game to which a user A wants to invite another user B is a game b, the other user B who builds a friendship with the user A in a game c, the user A manages one terminal device, and the other user B manages another terminal device. In this case, the management server sends an invitation mail indicating that there is an invitation from the user A in the game b to the other terminal device. | 11-27-2014 |