Patent application number | Description | Published |
20120226727 | METHODS AND SYSTEMS FOR ANALYZING DECOMPOSED UNCORRELATED SIGNAL IMPAIRMENTS - Method and systems are described for estimating signal impairments, in particular jitter that includes uncorrelated, non-periodic signal impairments. One system may take the form of an oscilloscope. The estimates may take the form of a probability density function (PDF) for uncorrelated signal impairments that has been modified to replace low probability regions with a known approximation and an extrapolation of the known approximation. | 09-06-2012 |
20120320964 | METHODS AND SYSTEMS FOR PROVIDING OPTIMUM DECISION FEEDBACK EQUALIZATION OF HIGH-SPEED SERIAL DATA LINKS - Computationally efficient methods and related systems, for use in a test and measurement instrument, such as an oscilloscope, optimize the performance of DFEs used in a high-speed serial data link by identifying optimal DFE tap values for peak-to-peak based criteria. The optimized DFEs comply with the behavior of a model DFE set forth in the PCIE 3.0 specification. | 12-20-2012 |
20130093493 | ARBITRARY MULTIBAND OVERLAY MIXER APPARATUS ANDMETHOD FOR BANDWIDTH MULTIPLICATION - An apparatus and method for splitting a wide band input signal and overlaying multiple frequency bands on each path associated with one or more digitizers. All frequencies from the split signal on each path can be fed to a mixer. The local oscillator of each mixer receives a sum of signals, which can each be set to any arbitrary frequency, as long as an associated matrix determinant of coefficients is non-zero. Each oscillator signal is multiplied by a coefficient, which can represent phase and magnitude, prior to summing the oscillator signals together. Each mixer mixes a combined signal with the input, thereby generating a set of multiple overlaid frequency bands. The digitized signals are processed to substantially reconstruct the original input signal. Thus, the wide band input signal is digitized using multiple individual digitizers. In particular, a system can support two wide band signals using four digitizers of narrower bandwidth. | 04-18-2013 |
20130237170 | ARBITRARY MULTIBAND OVERLAY MIXER APPARATUS AND METHOD FOR BANDWIDTH MULTIPLICATION - An apparatus and method for splitting a wide band input signal and overlaying multiple frequency bands on each path associated with one or more digitizers. All frequencies from the split signal on each path can be fed to a mixer. The local oscillator of each mixer receives a sum of signals, which can each be set to any arbitrary frequency, as long as an associated matrix determinant of coefficients is non-zero. Each oscillator signal is multiplied by a coefficient, which can represent phase and magnitude, prior to summing the oscillator signals together. Each mixer mixes a combined signal with the input, thereby generating a set of multiple overlaid frequency bands. The digitized signals are processed to substantially reconstruct the original input signal. Thus, the wide band input signal is digitized using multiple individual digitizers. In particular, a system can support two wide band signals using four digitizers of narrower bandwidth. | 09-12-2013 |
20130332101 | SERIAL DATA LINK MEASUREMENT AND SIMULATION SYSTEM - A serial data link measurement and simulation system for use on a test and measurement instrument presents on a display device a main menu having elements representing a measurement circuit, a simulation circuit and a transmitter. The main menu includes processing flow lines pointing from the measurement circuit to the transmitter and from the transmitter to the simulation circuit. The main menu includes a source input to the measurement circuit and one or more test points from which waveforms may be obtained. The simulation circuit includes a receiver. The measurement and simulation circuits are defined by a user, and the transmitter is common to both circuits so all aspects of the serial data link system are tied together. | 12-12-2013 |
20130343442 | RE-SAMPLING S-PARAMETERS FOR SERIAL DATA LINK ANALYSIS - A device and method of re-sampling a plurality of S-parameters for serial data link analysis is disclosed. The method includes storing a plurality of S-parameters sets, each S-parameter set being associated with a subsystem and having associated impulse responses and a time interval. An increased time interval is determined based on the time interval associated with each S-parameter set. The impulse responses are zero filled in each S-parameter set to maintain any wrapped ripples and increase the time interval. A plurality of resampled S-parameter sets are generated with a finer frequency resolution to cover the increased time interval. | 12-26-2013 |
20140362901 | METHODS AND SYSTEMS FOR PROVIDING OPTIMUM DECISION FEEDBACK EQUALIZATION OF HIGH-SPEED SERIAL DATA LINKS - Computationally efficient methods and related systems, for use in a test and measurement instrument, such as an oscilloscope, optimize the performance of DFEs used in a high-speed serial data link by identifying optimal DFE tap values for peak-to-peak based criteria. The optimized DFEs comply with the behavior of a model DFE set forth in the PCIE 3.0 specification. | 12-11-2014 |
20150084655 | SWITCHED LOAD TIME-DOMAIN REFLECTOMETER DE-EMBED PROBE - A de-embed probe, including two inputs configured to connect to a device under test, a memory, a signal generator configured to output a signal, a plurality of load components, a plurality of switches, and a controller. Each load component is configured to provide a different load. A first switch of the plurality of switches is associated with the signal generator and the other switches of the plurality of switches are each associated with one load component. The controller is configured to control the plurality of switches to connect combinations of the loads from the plurality of load components and the signal from the signal generator across the two inputs. | 03-26-2015 |
20150084656 | TWO PORT VECTOR NETWORK ANALYZER USING DE-EMBED PROBES - A test and measurement system including a device under test, two de-embed probes connected to the device under test, and a test and measurement instrument connected to the two de-embed probes. The test and measurement instrument includes a processor configured to determine the S-parameter set of the device under test based on measurements from the device under test taken by the two de-embed probes. | 03-26-2015 |