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Jung-Yup
Jung-Yup Han, Gyeonggi-Do KR
| Patent application number | Description | Published |
|---|---|---|
| 20110104555 | BATTERY PACK - A battery pack includes a plurality of battery units, each comprising a plurality of battery cells, a case providing a space to accommodate the battery cells, and a plurality of electrode terminals that are electrically connected to the battery cells and protrude out of the case. Bus bars connect electrode terminals of adjacent battery units. Short circuits are prevented by surrounding each bus bar with an insulating protection unit. | 05-05-2011 |
Jung-Yup Kim, Daejeon-City KR
| Patent application number | Description | Published |
|---|---|---|
| 20110057675 | PERPENDICULAR FINE-CONTACT PROBE HAVING A VARIABLE-STIFFNESS STRUCTURE - An exemplary embodiment of the present invention provides a vertical micro contact probe that includes a column formed by longitudinally continuously stacking a plurality of basic units and a front end formed at the front end of the column and contacting an electrode pad of a semiconductor chip. The basic unit includes a probe body alternately bending to the left and right and protrusions protruding from the probe body at the left and right sides from the center of the width direction, and contacting the adjacent probe body to support the probe body under compression. | 03-10-2011 |
| 20110163772 | MICRO CONTACT PROBE COATED WITH NANOSTRUCTURE AND METHOD FOR MANUFACTURING THE SAME - The present invention relates to a micro contact probe used for a probe card. | 07-07-2011 |
Jung-Yup Kim, Deajeon-City KR
| Patent application number | Description | Published |
|---|---|---|
| 20100127728 | CANTILEVER-TYPE MICRO CONTACT PROBE WITH HINGE STRUCTURE - According to the present invention, allowable displacement can be increased from an excellent stress relaxation effect achieved by applying a hinge structure while adopting advantages of a dual beam cantilever-type probe that can reduce scrub. Since the hinge structure is a structure that does not receive a moment, an effect that is the same as eliminating a moment in a conventional prove can be achieved so that stress can be evenly applied and the allowable displacement of the probe can be increased. | 05-27-2010 |