Patent application number | Description | Published |
20090212695 | White and color photoexcitation light emitting sheet and method for the fabrication thereof - The present invention relates to a white and color photoexcitation light emitting sheet comprising a substrate, a light source formed on the substrate, and a white and color photoexcitation light emitting layer capable of converting a light emitted from the light source into a light having a different wavelength, where the white and color photoexcitation light emitting layer is fabricated by mixing a matrix polymer, white and color photoexcitation light emitting materials and a solvent, spinning the resulting mixture to prepare an ultrafine composite fiber layer of the matrix polymer/photoexcitation light emitting materials, and thermocompressing the ultrafine composite fiber layer; and a method for fabrication thereof. The white and color photoexcitation light emitting sheet according to the present invention has uniform brightness and color coordinates and exhibits high color reproducibility. | 08-27-2009 |
20090215279 | ORGANIC/INORGANIC HYBRID THIN FILM PASSIVATION LAYER FOR BLOCKING MOISTURE/OXYGEN TRANSMISSION AND IMPROVING GAS BARRIER PROPERTY - The present invention relates to an organic/inorganic hybrid thin film passivation layer comprising an organic polymer passivation layer prepared by a UV/ozone curing process and an inorganic thin film passivation layer for blocking moisture and oxygen transmission of an organic electronic device fabricated on a substrate and improving gas barrier property of a plastic substrate; and a fabrication method thereof. Since the organic/inorganic hybrid thin film passivation layer of the present invention converts the surface polarity of an organic polymer passivation layer into hydrophilic by using the UV/ozone curing process, it can improve the adhesion strength between the passivation layer interfaces, increase the light transmission rate due to surface planarization of the organic polymer passivation layer, and enhance gas barrier property by effectively blocking moisture and oxygen transmission. | 08-27-2009 |
20110260147 | ORGANIC/INORGANIC HYBRID THIN FILM PASSIVATION LAYER FOR BLOCKING MOISTURE/OXYGEN TRANSMISSION AND IMPROVING GAS BARRIER PROPERTY - The present invention relates to an organic/inorganic hybrid thin film passivation layer comprising an organic polymer passivation layer prepared by a UV/ozone curing process and an inorganic thin film passivation layer for blocking moisture and oxygen transmission of an organic electronic device fabricated on a substrate and improving gas barrier property of a plastic substrate; and a fabrication method thereof. Since the organic/inorganic hybrid thin film passivation layer of the present invention converts the surface polarity of an organic polymer passivation layer into hydrophilic by using the UV/ozone curing process, it can improve the adhesion strength between the passivation layer interfaces, increase the light transmission rate due to surface planarization of the organic polymer passivation layer, and enhance gas barrier property by effectively blocking moisture and oxygen transmission. | 10-27-2011 |
20130056828 | THIN FILM TRANSISTOR AND MANUFACTURING METHOD THEREOF - A thin film transistor is provided. A thin film transistor according to an exemplary embodiment of the present invention includes: a substrate; a gate line disposed on the substrate and including a gate electrode; a semiconductor layer disposed on the substrate and including at least a portion overlapping the gate electrode; a gate insulating layer disposed between the gate line and the semiconductor layer; and a source electrode and a drain electrode disposed on the substrate and facing each other over a channel region of the semiconductor layer. The gate insulating layer includes a first region and a second region, the first region corresponds to the channel region of the semiconductor layer, the first region is made of a first material, the second region is made of a second material, and the first material and the second material have different atomic number ratios of carbon and silicon. | 03-07-2013 |
20130320327 | THIN FILM TRANSISTOR AND METHOD OF FORMING THE SAME - A thin film transistor includes a substrate, an oxide semiconductor layer that is disposed on the substrate, a gate electrode that overlaps with the oxide semiconductor layer, a gate insulating layer that is disposed between the oxide semiconductor layer and the gate electrode, and a source electrode and a drain electrode that at least partially overlap with the oxide semiconductor layer and are spaced from each other. The gate insulating layer includes an oxide including a first material. The oxide semiconductor layer includes an oxide which includes a same material as the first material and a second material, and the source electrode and the drain electrode include an oxide that includes a same material as the second material and a third material, and a grain boundary is not formed on an interface between at least one of the gate insulating layer and the oxide semiconductor layer or between the oxide semiconductor layer, and the source electrode and the drain electrode. | 12-05-2013 |
20130328042 | PRECURSOR COMPOSITION OF OXIDE SEMICONDUCTOR, THIN FILM TRANSISTOR SUBSTRATE INCLUDING OXIDE SEMICONDUCTOR, AND METHOD OF MANUFACTURING THIN FILM TRANSISTOR SUBSTRATE INCLUDING OXIDE SEMICONDUCTOR - A thin film transistor substrate according to an exemplary embodiment of the present invention includes a semiconductor layer including metal disposed on an insulating substrate, a gate electrode overlapping the semiconductor layer, and a source electrode and a drain electrode overlapping the semiconductor layer, wherein the metal in the semiconductor layer comprises indium (In), zinc (Zn), and tin (Sn), and a molar ratio (R, R[mol %]=[In]/[In+Zn+Sn]/100) of indium (In) to the metals in the semiconductor layer is less than about 20%, and more specifically, the molar ratio (R, R[mol %]=[In]/[In+Zn+Sn]/100) of indium (In) of the metals in the semiconductor layer is about 5% to about 13%. | 12-12-2013 |
20140377904 | PRECURSOR COMPOSITION OF OXIDE SEMICONDUCTOR AND THIN FILM TRANSISTOR SUBSTRATE INCLUDING OXIDE SEMICONDUCTOR - A thin film transistor substrate according to an exemplary embodiment of the present invention includes a semiconductor layer including metal disposed on an insulating substrate, a gate electrode overlapping the semiconductor layer, and a source electrode and a drain electrode overlapping the semiconductor layer, wherein the metal in the semiconductor layer comprises indium (In), zinc (Zn), and tin (Sn), and a molar ratio | 12-25-2014 |
20150044817 | THIN FILM TRANSISTOR AND METHOD OF FORMING THE SAME - A thin film transistor includes a substrate, an oxide semiconductor layer that is disposed on the substrate, a gate electrode that overlaps with the oxide semiconductor layer, a gate insulating layer that is disposed between the oxide semiconductor layer and the gate electrode, and a source electrode and a drain electrode that at least partially overlap with the oxide semiconductor layer and are spaced from each other. The gate insulating layer includes an oxide including a first material. The oxide semiconductor layer includes an oxide which includes a same material as the first material and a second material, and the source electrode and the drain electrode include an oxide that includes a same material as the second material and a third material, and a grain boundary is not formed on an interface between at least one of the gate insulating layer and the oxide semiconductor layer or between the oxide semiconductor layer, and the source electrode and the drain electrode. | 02-12-2015 |