Patent application number | Description | Published |
20080292012 | MULTIPLE-INPUT MULTIPLE-OUTPUT COMMUNICATION METHOD AND MULTIPLE-INPUT MULTIPLE-OUTPUT COMMUNICATION SYSTEM OF ENABLING THE METHOD - A Multiple-Input Multiple-Output (MIMO) communication system and method. The MIMO communication system includes: an antenna number determination unit to determine a number of active antennas among a plurality of transmitting antennas based on a power of a transmission signal wherein the number of active antennas is at least one and the at least one active antenna transmits the transmission signal; and a beam generator to generate the transmission signal corresponding to the number of active antennas by using channel information wherein the channel information is fed back from each of a plurality of user terminals. | 11-27-2008 |
20080317145 | MULTIPLE INPUT MULTIPLE OUTPUT COMMUNICATION SYSTEM AND A METHOD OF ADAPTIVELY GENERATING CODEBOOK - A Multiple-Input Multiple-Output (MIMO) communication system and a method of adaptively generating a codebook are provided. A terminal includes a channel estimator to estimate a channel formed between a base station and the terminal to calculate a channel matrix and a codebook generator to adaptively generate a codebook based on a spatial correlation matrix of the channel matrix. | 12-25-2008 |
20090004986 | METHOD OF FEEDING BACK CHANNEL INFORMATION AND RECEIVER FOR FEEDING BACK CHANNEL INFORMATION - Provided is a receiver for feeding back channel information, which includes a channel vector measuring unit to measure channel vectors corresponding to a plurality of receiving antennas, respectively, that receive a plurality of data streams, a candidate codebook vector selecting unit to select at least two candidate codebook vectors from codebook vectors included in a codebook, by considering a quantization error based on the channel vectors with respect to each of the data streams, and a selection codebook vector determining unit to determine selection codebook vectors corresponding to the plurality of data streams respectively from the at least two candidate codebook vectors, based on a signal-to-interference and noise ratio (SINR) of each of the data streams that is calculated according to each of the candidate codebook vectors. | 01-01-2009 |
20090010215 | METHOD OF ALLOCATING WIRELESS RESOURCE FOR SPACE DIVISION MULTIPLE ACCESS COMMUNICATION AND WIRELESS RESOURCE ALLOCATION SYSTEM OF ENABLING THE METHOD - A system for allocating a wireless resource for a Space Division Multiple Access (SDMA) communication is provided. The system for allocating the wireless resource for the SDMA communication includes: a channel state recognition unit to recognize a channel state of wireless channels generated among adjacent nodes including a source node, a relay node, and a destination node; and a wireless resource allocation unit to control at least one of an amount of channel state information fed back from the destination node to the source node, and a relay level of a relay signal, the relay signal being generated by relaying a source signal transmitted from the source node, according to the channel state. | 01-08-2009 |
20100041406 | COMMUNICATION SYSTEM FOR SUPPORTING PRIMARY USER AND SECONDARY USER - A communication system for supporting a primary user and a secondary user is provided. A base station of a communication system, includes a scheduler to group at least one primary user and at least one secondary user corresponding to each of the at least one primary user according to characteristics of services desired by users, a superposition coding unit to perform superposition coding for primary data associated with the at least one primary user and secondary data associated with the at least one secondary user to generate a transmission data stream, and a beamformer to perform beamforming for the transmission data stream. | 02-18-2010 |
Patent application number | Description | Published |
20110068459 | Semiconductor Device and Method of Forming Interposer with Opening to Contain Semiconductor Die - A semiconductor device has an interposer mounted over a carrier. The interposer includes TSV formed either prior to or after mounting to the carrier. An opening is formed in the interposer. The interposer can have two-level stepped portions with a first vertical conduction path through a first stepped portion and second vertical conduction path through a second stepped portion. A first and second semiconductor die are mounted over the interposer. The second die is disposed within the opening of the interposer. A discrete semiconductor component can be mounted over the interposer. A conductive via can be formed through the second die or encapsulant. An encapsulant is deposited over the first and second die and interposer. A portion of the interposer can be removed to that the encapsulant forms around a side of the semiconductor device. An interconnect structure is formed over the interposer and second die. | 03-24-2011 |
20110278717 | Semiconductor Device and Method of Embedding Bumps Formed on Semiconductor Die Into Penetrable Adhesive Layer to Reduce Die Shifting During Encapsulation - A semiconductor device has a semiconductor die with a plurality of bumps formed over a surface of the first semiconductor die. A penetrable adhesive layer is formed over a temporary carrier. The adhesive layer can include a plurality of slots. The semiconductor die is mounted to the carrier by embedding the bumps into the penetrable adhesive layer. The semiconductor die and interconnect structure can be separated by a gap. An encapsulant is deposited over the first semiconductor die. The bumps embedded into the penetrable adhesive layer reduce shifting of the first semiconductor die while depositing the encapsulant. The carrier is removed. An interconnect structure is formed over the semiconductor die. The interconnect structure is electrically connected to the bumps. A thermally conductive bump is formed over the semiconductor die, and a heat sink is mounted to the interconnect structure and thermally connected to the thermally conductive bump. | 11-17-2011 |
20110298110 | Semiconductor Device and Method of Forming Thermally Conductive Layer Between Semiconductor Die and Build-Up Interconnect Structure - A semiconductor device has a thermally conductive layer with a plurality of openings formed over a temporary carrier. The thermally conductive layer includes electrically non-conductive material. A semiconductor die has a plurality of bumps formed over contact pads on the die. The semiconductor die is mounted over the thermally conductive layer so that the bumps are disposed at least partially within the openings in the thermally conductive layer. An encapsulant is deposited over the die and thermally conductive layer. The temporary carrier is removed to expose the bumps. A first interconnect structure is formed over the encapsulant, semiconductor die, and bumps. The bumps are electrically connected to the first interconnect structure. A heat sink or shielding layer can be formed over the semiconductor die. A second interconnect structure can be formed over the encapsulant and electrically connected to the first interconnect structure through conductive vias formed in the encapsulant. | 12-08-2011 |
20110298137 | Semiconductor Device and Method of Forming Sacrificial Adhesive Over Contact Pads of Semiconductor Die - A semiconductor wafer contains a plurality of semiconductor die each having a plurality of contact pads. A sacrificial adhesive is deposited over the contact pads. Alternatively, the sacrificial adhesive is deposited over the carrier. An underfill material can be formed between the contact pads. The semiconductor wafer is singulated to separate the semiconductor die. The semiconductor die is mounted to a temporary carrier such that the sacrificial adhesive is disposed between the contact pads and temporary carrier. An encapsulant is deposited over the semiconductor die and carrier. The carrier and sacrificial adhesive is removed to leave a via over the contact pads. An interconnect structure is formed over the encapsulant. The interconnect structure includes a conductive layer which extends into the via for electrical connection to the contact pads. The semiconductor die is offset from the interconnect structure by a height of the sacrificial adhesive. | 12-08-2011 |
20110316146 | Semiconductor Device and Method of Forming Anisotropic Conductive Film Between Semiconductor Die and Build-Up Interconnect Structure - A semiconductor wafer contains a plurality of semiconductor die with bumps formed over contact pads on an active surface of the semiconductor die. An ACF is deposited over the bumps and active surface of the wafer. An insulating layer can be formed between the ACF and semiconductor die. The semiconductor wafer is singulated to separate the die. The semiconductor die is mounted to a temporary carrier with the ACF oriented to the carrier. The semiconductor die is forced against the carrier to compress the ACF under the bumps and form a low resistance electrical interconnect to the bumps. An encapsulant is deposited over the semiconductor die and carrier. The carrier is removed. An interconnect structure is formed over the semiconductor die and encapsulant. The interconnect structure is electrically connected through the compressed ACF to the bumps. The ACF reduces shifting of the semiconductor die during encapsulation. | 12-29-2011 |
20110316156 | Semiconductor Device and Method of Forming RDL Along Sloped Side Surface of Semiconductor Die for Z-Direction Interconnect - A semiconductor device has a first semiconductor die with a sloped side surface. The first semiconductor die is mounted to a temporary carrier. An RDL extends from a back surface of the first semiconductor die along the sloped side surface of the first semiconductor die to the carrier. An encapsulant is deposited over the carrier and a portion of the RDL along the sloped side surface. The back surface of the first semiconductor die and a portion of the RDL is devoid of the encapsulant. The temporary carrier is removed. An interconnect structure is formed over the encapsulant and exposed active surface of the first semiconductor die. The RDL is electrically connected to the interconnect structure. A second semiconductor die is mounted over the back surface of the first semiconductor die. The second semiconductor die has bumps electrically connected to the RDL. | 12-29-2011 |
20120012990 | Semiconductor Device and Method of Forming Protective Layer Over Exposed Surfaces of Semiconductor Die - A semiconductor wafer has a plurality of first semiconductor die. A second semiconductor die is mounted to the first semiconductor die. A shielding layer is formed between the first and second semiconductor die. An electrical interconnect, such as conductive pillar, bump, or bond wire, is formed between the first and second semiconductor die. A conductive TSV can be formed through the first and second semiconductor die. An encapsulant is deposited over the first and second semiconductor die and electrical interconnect. A heat sink is formed over the second semiconductor die. An interconnect structure, such as a bump, can be formed over the second semiconductor die. A portion of a backside of the first semiconductor die is removed. A protective layer is formed over exposed surfaces of the first semiconductor die. The protective layer covers the exposed backside and sidewalls of the first semiconductor die. | 01-19-2012 |
20120061824 | SEMICONDUCTOR DEVICE AND METHOD OF FORMING BOND-ON-LEAD INTERCONNECTION FOR MOUNTING SEMICONDUCTOR DIE IN FO-WLCSP - A semiconductor die has a conductive layer including a plurality of trace lines formed over a carrier. The conductive layer includes a plurality of contact pads electrically continuous with the trace lines. A semiconductor die has a plurality of contact pads and bumps formed over the contact pads. A plurality of conductive pillars can be formed over the contact pads of the semiconductor die. The bumps are formed over the conductive pillars. The semiconductor die is mounted to the conductive layer with the bumps directly bonded to an end portion of the trace lines to provide a fine pitch interconnect. An encapsulant is deposited over the semiconductor die and conductive layer. The conductive layer contains wettable material to reduce die shifting during encapsulation. The carrier is removed. An interconnect structure is formed over the encapsulant and semiconductor die. An insulating layer can be formed over the conductive layer. | 03-15-2012 |
20120074585 | Semiconductor Device and Method of Forming TSV Interposer With Semiconductor Die and Build-Up Interconnect Structure on Opposing Surfaces of the Interposer - A semiconductor device has a substrate with first and second opposing surfaces. A plurality of conductive vias is formed partially through the first surface of the substrate. A first conductive layer is formed over the first surface of the substrate electrically connected to the conductive vias. A first semiconductor die is mounted over the first surface of the substrate. The first semiconductor die and substrate are mounted to a carrier. An encapsulant is deposited over the first semiconductor die, substrate, and carrier. A portion of the second surface of the substrate is removed to expose the conductive vias. An interconnect structure is formed over a surface of the substrate opposite the first semiconductor die. A second semiconductor die can be stacked over the first semiconductor die. A second semiconductor die can be mounted over the first surface of the substrate adjacent to the first semiconductor die. | 03-29-2012 |
20120074587 | Semiconductor Device and Method of Bonding Different Size Semiconductor Die at the Wafer Level - A semiconductor wafer has first and second opposing surfaces. A plurality of conductive vias is formed partially through the first surface of the semiconductor wafer. The semiconductor wafer is singulated into a plurality of first semiconductor die. The first semiconductor die are mounted to a carrier. A second semiconductor die is mounted to the first semiconductor die. A footprint of the second semiconductor die is larger than a footprint of the first semiconductor die. An encapsulant is deposited over the first and second semiconductor die and carrier. The carrier is removed. A portion of the second surface is removed to expose the conductive vias. An interconnect structure is formed over a surface of the first semiconductor die opposite the second semiconductor die. Alternatively, a first encapsulant is deposited over the first semiconductor die and carrier, and a second encapsulant is deposited over the second semiconductor die. | 03-29-2012 |
20120104623 | Semiconductor Device and Method of Forming Stepped Interposer for Stacking and Electrically Connecting Semiconductor Die - A semiconductor substrate has a plurality of different size recesses formed in the substrate to provide a stepped interposer. A conductive via can be formed through the stepped interposer. An insulating layer follows a contour of the stepped interposer. A conductive layer is formed over the insulating layer following the contour of the stepped interposer. A first semiconductor die is partially disposed in a first recess and electrically connected to the conductive layer. A second semiconductor die is partially disposed in a second recess and electrically connected to the conductive layer. The first semiconductor die is electrically connected to the second semiconductor die through the conductive layer. The first and second semiconductor die can be flipchip type semiconductor die. An encapsulant is deposited over the first and second semiconductor die. A portion of the stepped interposer can be removed to reduce thickness. | 05-03-2012 |
20120248596 | Semiconductor Device and Method of Forming Thermally Conductive Layer Between Semiconductor Die and Build-Up Interconnect Structure - A semiconductor device has a thermally conductive layer with a plurality of openings formed over a temporary carrier. The thermally conductive layer includes electrically non-conductive material. A semiconductor die has a plurality of bumps formed over contact pads on the die. The semiconductor die is mounted over the thermally conductive layer so that the bumps are disposed at least partially within the openings in the thermally conductive layer. An encapsulant is deposited over the die and thermally conductive layer. The temporary carrier is removed to expose the bumps. A first interconnect structure is formed over the encapsulant, semiconductor die, and bumps. The bumps are electrically connected to the first interconnect structure. A heat sink or shielding layer can be formed over the semiconductor die. A second interconnect structure can be formed over the encapsulant and electrically connected to the first interconnect structure through conductive vias formed in the encapsulant. | 10-04-2012 |
20120261818 | Semiconductor Device and Method of Embedding Bumps Formed on Semiconductor Die into Penetrable Adhesive Layer to Reduce Die Shifting During Encapsulation - A semiconductor device has a semiconductor die with a plurality of bumps formed over a surface of the first semiconductor die. A penetrable adhesive layer is formed over a temporary carrier. The adhesive layer can include a plurality of slots. The semiconductor die is mounted to the carrier by embedding the bumps into the penetrable adhesive layer. The semiconductor die and interconnect structure can be separated by a gap. An encapsulant is deposited over the first semiconductor die. The bumps embedded into the penetrable adhesive layer reduce shifting of the first semiconductor die while depositing the encapsulant. The carrier is removed. An interconnect structure is formed over the semiconductor die. The interconnect structure is electrically connected to the bumps. A thermally conductive bump is formed over the semiconductor die, and a heat sink is mounted to the interconnect structure and thermally connected to the thermally conductive bump. | 10-18-2012 |
20130001771 | Semiconductor Device and Method of Forming FO-WLCSP with Discrete Semiconductor Components Mounted Under and Over Semiconductor Die - A semiconductor die has first and second discrete semiconductor components mounted over a plurality of wettable contact pads formed on a carrier. Conductive pillars are formed over the wettable contact pads. A semiconductor die is mounted to the conductive pillars over the first discrete components. The conductive pillars provide vertical stand-off of the semiconductor die as headroom for the first discrete components. The second discrete components are disposed outside a footprint of the semiconductor die. Conductive TSV can be formed through the semiconductor die. An encapsulant is deposited over the semiconductor die and first and second discrete components. The wettable contact pads reduce die and discrete component shifting during encapsulation. A portion of a back surface of the semiconductor die is removed to reduce package thickness. An interconnect structure is formed over the encapsulant and semiconductor die. Third discrete semiconductor components can be mounted over the semiconductor die. | 01-03-2013 |
20130214409 | Semiconductor Device and Method of Forming Bond-on-Lead Interconnection for Mounting Semiconductor Die in FO-WLCSP - A semiconductor die has a conductive layer including a plurality of trace lines formed over a carrier. The conductive layer includes a plurality of contact pads electrically continuous with the trace lines. A semiconductor die has a plurality of contact pads and bumps formed over the contact pads. A plurality of conductive pillars can be formed over the contact pads of the semiconductor die. The bumps are formed over the conductive pillars. The semiconductor die is mounted to the conductive layer with the bumps directly bonded to an end portion of the trace lines to provide a fine pitch interconnect. An encapsulant is deposited over the semiconductor die and conductive layer. The conductive layer contains wettable material to reduce die shifting during encapsulation. The carrier is removed. An interconnect structure is formed over the encapsulant and semiconductor die. An insulating layer can be formed over the conductive layer. | 08-22-2013 |
20130299982 | Semiconductor Device and Method of Forming Interposer with Opening to Contain Semiconductor Die - A semiconductor device has an interposer mounted over a carrier. The interposer includes TSV formed either prior to or after mounting to the carrier. An opening is formed in the interposer. The interposer can have two-level stepped portions with a first vertical conduction path through a first stepped portion and second vertical conduction path through a second stepped portion. A first and second semiconductor die are mounted over the interposer. The second die is disposed within the opening of the interposer. A discrete semiconductor component can be mounted over the interposer. A conductive via can be formed through the second die or encapsulant. An encapsulant is deposited over the first and second die and interposer. A portion of the interposer can be removed to that the encapsulant forms around a side of the semiconductor device. An interconnect structure is formed over the interposer and second die. | 11-14-2013 |
20140054802 | Semiconductor Device and Method of Forming RDL Using UV-Cured Conductive Ink Over Wafer Level Package - A semiconductor device has a semiconductor die and first insulating layer formed over the semiconductor die. A patterned trench is formed in the first insulating layer. A conductive ink is deposited in the patterned trench by disposing a stencil over the first insulating layer with an opening aligned with the patterned trench and depositing the conductive ink through the opening in the stencil into the patterned trench. | 02-27-2014 |
20140077344 | Semiconductor Device with Protective Layer Over Exposed Surfaces of Semiconductor Die - A semiconductor wafer has a plurality of first semiconductor die. A second semiconductor die is mounted to the first semiconductor die. A shielding layer is formed between the first and second semiconductor die. An electrical interconnect, such as conductive pillar, bump, or bond wire, is formed between the first and second semiconductor die. A conductive TSV can be formed through the first and second semiconductor die. An encapsulant is deposited over the first and second semiconductor die and electrical interconnect. A heat sink is formed over the second semiconductor die. An interconnect structure, such as a bump, can be formed over the second semiconductor die. A portion of a backside of the first semiconductor die is removed. A protective layer is formed over exposed surfaces of the first semiconductor die. The protective layer covers the exposed backside and sidewalls of the first semiconductor die. | 03-20-2014 |
20140077389 | Semiconductor Device and Method of Using Substrate Having Base and Conductive Posts to Form Vertical Interconnect Structure in Embedded Die Package - A semiconductor device has a substrate including a base and a plurality of conductive posts extending from the base. The substrate can be a wafer-shape, panel, or singulated form. The conductive posts can have a circular, rectangular, tapered, or narrowing intermediate shape. A semiconductor die is disposed through an opening in the base between the conductive posts. The semiconductor die extends above the conductive posts or is disposed below the conductive posts. An encapsulant is deposited over the semiconductor die and around the conductive posts. The base and a portion of the encapsulant is removed to electrically isolate the conductive posts. An interconnect structure is formed over the semiconductor die, encapsulant, and conductive posts. An insulating layer is formed over the semiconductor die, encapsulant, and conductive posts. A semiconductor package is disposed over the semiconductor die and electrically connected to the conductive posts. | 03-20-2014 |
20140252631 | Semiconductor Device and Method of Forming Sacrificial Adhesive Over Contact Pads of Semiconductor Die - A semiconductor wafer contains a plurality of semiconductor die each having a plurality of contact pads. A sacrificial adhesive is deposited over the contact pads. Alternatively, the sacrificial adhesive is deposited over the carrier. An underfill material can be formed between the contact pads. The semiconductor wafer is singulated to separate the semiconductor die. The semiconductor die is mounted to a temporary carrier such that the sacrificial adhesive is disposed between the contact pads and temporary carrier. An encapsulant is deposited over the semiconductor die and carrier. The carrier and sacrificial adhesive is removed to leave a via over the contact pads. An interconnect structure is formed over the encapsulant. The interconnect structure includes a conductive layer which extends into the via for electrical connection to the contact pads. The semiconductor die is offset from the interconnect structure by a height of the sacrificial adhesive. | 09-11-2014 |
20140264786 | Semiconductor Device Including RDL Along Sloped Side Surface of Semiconductor Die for Z-Direction Interconnect - A semiconductor device has a first semiconductor die with a sloped side surface. The first semiconductor die is mounted to a temporary carrier. An RDL extends from a back surface of the first semiconductor die along the sloped side surface of the first semiconductor die to the carrier. An encapsulant is deposited over the carrier and a portion of the RDL along the sloped side surface. The back surface of the first semiconductor die and a portion of the RDL is devoid of the encapsulant. The temporary carrier is removed. An interconnect structure is formed over the encapsulant and exposed active surface of the first semiconductor die. The RDL is electrically connected to the interconnect structure. A second semiconductor die is mounted over the back surface of the first semiconductor die. The second semiconductor die has bumps electrically connected to the RDL. | 09-18-2014 |
Patent application number | Description | Published |
20100146446 | DISPLAY APPARATUS AND METHOD OF DISPLAYING CONTENTS LIST - Disclosed is a method and apparatus for displaying a contents list. The method includes: displaying a loading image, which is preset for displaying, on a loading region to display a thumbnail image corresponding to contents of the loading image, wherein the loading image corresponds to the thumbnail images; animating the loading image displayed in the loading region; and displaying the thumbnail image in the loading region, by substituting the thumbnail image for the loading image. | 06-10-2010 |
20100153872 | METHOD FOR PROVIDING GRAPHICAL USER INTERFACE AND ELECTRONIC DEVICE USING THE SAME - A method for providing a graphical user interface (GUI) and an electronic device using the method are provided. The method includes forming one or more groups of GUI items other than a GUI item selected by a user, moving the GUI items in the one or more groups, and enlarging and displaying the selected item on an area formed by movement of the GUI items. Therefore, it is possible to provide a GUI which enables easy manipulation and which is displayed with superior visual effect on a screen that is relatively small in size. | 06-17-2010 |
20120030619 | METHOD FOR PROVIDING USER INTERFACE AND DISPLAY APPARATUS APPLYING THE SAME - A method for providing a user interface and a display apparatus applying the same are provided. According to the method for providing the user interface, if a flick touch manipulation of a first axis direction is sensed, a category of a displayed content list is changed, so that a user can change the category of the content list. | 02-02-2012 |
20120060190 | METHOD FOR ZAPPING CONTENTS AND DISPLAY APPARATUS FOR IMPLEMENTING THE SAME - A content zapping method for accessing multimedia contents rapidly and easily by accessing the multimedia contents on a browser basis, includes receiving a screen change command for at least one broadcast channel or at least one content; and changing a screen to a browser which provides the at least one broadcast channel or the at least one content corresponding to the received screen change command, in an order of a pre-stored list. | 03-08-2012 |
20130305190 | DISPLAY APPARATUS AND METHOD OF DISPLAYING CONTENTS LIST - A method and apparatus for displaying a contents list. The method includes: displaying a loading image on a loading region to display a thumbnail image before the thumbnail image is displayed, animating the loading image displayed in the loading region such that a center coordinate of the loading image is maintained; and displaying the thumbnail image in the loading region, by substituting the loading image with the thumbnail image. The loading image represents a state in which the thumbnail image is loading, the animating the loading image comprises pivoting the loading image by a preset degree of an angle, and the pivoting the loading image by the preset degree of the angle comprises displaying a plurality of loading images by differentiating pivoting speeds of the plurality of loading images. | 11-14-2013 |