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Ju-Yi
Ju-Yi Hsieh, Luzhu Township TW
| Patent application number | Description | Published |
|---|---|---|
| 20120081922 | BACKLIGHT MODULE - A backlight module includes a light guide plate, a first light module, and a second light module. The light guide plate includes first troughs and second troughs on opposite sides. The first light module includes a first substrate and first LEDs thereon. An opaque element is disposed on each first gap between two adjacent first LEDs, each first LED is embedded in one first trough. The second light module includes a second substrate and second LEDs thereon. An opaque element is disposed on each second gap between two adjacent second LEDs, and each second LED is embedded in one second trough. Each first LED is disposed to one second gap, and each second LED is disposed in one first gap. Light from first LED is absorbed by the opaque element on the second substrate, and that from the second LED is absorbed by the opaque element on the first substrate. | 04-05-2012 |
Ju-Yi Hung, Hsin-Tien TW
| Patent application number | Description | Published |
|---|---|---|
| 20110010485 | Flash Memory Control Device - A flash memory control device includes a controller and an expansion device. The expansion device is electrically connected to the controller and one and more flash memory devices for temporarily storing data, integrating data and presenting processing status, wherein the controller orders the expansion device to transform data to the one and more flash memory devices or receive data from the one and more flash memory devices according to processing status. | 01-13-2011 |
Ju-Yi Lee, Taipei City TW
| Patent application number | Description | Published |
|---|---|---|
| 20110096336 | APPARATUS AND METHOD FOR MEASURING DISPLACEMENT - The apparatus and method for measuring displacement according to the present invention includes a first beam and a second beam. A first reflection structure reflects a first beam to the surface of an object under test; and a second reflection structure reflects a second beam to the surface of the object under test. The reflected first beam and the reflected second beam have an optical path difference. The object under test scatters a scattering beam of gathering the first and second beams. The scattering beam has an interference signal. A photodetector receives the interference signal of the scattering beam. Then an operational unit receives and computes the interference signal for producing a displacement value. By using the first and second reflection structures, the first and second beams split from an incident beam produce an optical path difference. Thereby, the structure of the apparatus for measuring displacement can be simplified. Besides, the displacement or the amplitude of vibration of the object under test can be measured effectively. | 04-28-2011 |
Ju-Yi Lee, Taoyuan County TW
| Patent application number | Description | Published |
|---|---|---|
| 20110273716 | SURFACE PLASMON RESONANCE MEASURING DEVICE - A SPR measuring device is proposed. The measuring device includes a circularly polarized heterodyne light source that produces a circularly polarized heterodyne light beam, a beam splitting element that splits the circularly polarized heterodyne light beam into a reference beam and a signal beam, a first light sensing unit that receives a reference light intensity of the reference beam, a SPR sensor that receives the signal beam and reflects a reflected signal beam, a second light sensing unit that receives a reflected light intensity of the reflected signal beam and a processing circuit that calculates a phase difference between the reference light intensity and the reflected light intensity. A phase change caused by SPR of an incident light is sensitively represented by the circularly polarized heterodyne light beam. Thus tiny changes in physical quantities of analytes are measured easily. | 11-10-2011 |