Joon-Hong
Joon Hong Kim, Yongin-Si KR
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20140211902 | INSPECTION APPARATUS FOR PENETRATION PIPE OF NUCLEAR REACTOR HEAD - An inspection apparatus for a penetration pipe of a nuclear reactor head comprising: a body; a probe module installed at the body and having a probe which is inserted in the penetration pipe to inspect damage of the penetration pipe; a fixing module installed along a longitudinal direction of the body and having an expanding cylinder which is inserted in the penetration pipe to support an inner diameter of the penetration pipe; and a rotating module installed in the longitudinal direction of the body and having an expanding cylinder which is inserted in the penetration pipe to support the inner diameter of the penetration pipe. | 07-31-2014 |
Joon Hong Park, Suson-Si KR
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20090152511 | INDIUM TIN OXIDE TARGET, METHOD FOR MANUFACTURING THE SAME, TRANSPARENT CONDUCTIVE FILM OF INDIUM TIN OXIDE, AND METHOD FOR MANUFACTURING TRANSPARENT CONDUCTIVE FILM OF INDIUM TIN OXIDE - Disclosed are an indium Tin Oxide (ITO) target, a method for manufacturing the same, a transparent conductive film of ITO, and a method for manufacturing the transparent conductive film of ITO. The ITO target includes at least one oxide selected from the group consisting of Sm | 06-18-2009 |
Joon Hong Park, Dublin, CA US
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20160064519 | ULTRAHIGH SELECTIVE POLYSILICON ETCH WITH HIGH THROUGHPUT - Provided are methods and apparatuses for removing a polysilicon layer on a wafer, where the wafer can include a nitride layer, a low-k dielectric layer, an oxide layer, and other films. A plasma of a hydrogen-based species and a fluorine-based species is generated in a remote plasma source, and the wafer is exposed to the plasma at a relatively low temperature to limit the formation of solid byproduct. In some implementations, the wafer is maintained at a temperature below about 60° C. The polysilicon layer is removed at a very high etch rate, and the selectivity of polysilicon over the nitride layer and the oxide layer is very high. In some implementations, the wafer is supported on a wafer support having a plurality of thermal zones configured to define a plurality of different temperatures across the wafer. | 03-03-2016 |
Joon-Hong Park, Suwon KR
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20150292683 | FLUORESCENT LAMP-TYPE LED LIGHTING DEVICE - The present invention relates to a fluorescent lamp-type LED lighting device including: a case part formed to be elongated in one direction and having an open bottom surface which provides a reflection space on the inner side; a cover part provided on the bottom surface of the case part so that the light which is reflected and diffused in the case part is emitted; and multiple LEDs which emit the light from the cover part and the inner side of the case part such that the light is reflected and diffused on the inner side of the case part. According to the present invention, the LED light is emitted toward an indoor ceiling side, the reflection space is provided so as to reflect and diffuse the emitted LED light, and the light is emitted through a bottom surface part. Accordingly, no additional diffusion plate for surface emission is used and thus optical efficiency can be increased. | 10-15-2015 |
Joon-Hong Park, Seoul KR
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20110123862 | THIN FILM BATTERY HAVING IMPROVED EFFICIENCY OF COLLECTING ELECTRIC CURRENT - Provided is a thin film battery, including: a base substrate; a cathode current collector pattern and an anode current collector pattern being formed on the base substrate to be electrically separated from each other; a cathode pattern being formed on the cathode current collector pattern; an electrolyte pattern being formed on the cathode pattern; and an anode pattern being formed on the electrolyte pattern. At least one pattern of the cathode current collector pattern and the anode current collector pattern may include a non-noble metal based alloy. | 05-26-2011 |
20120302447 | MOCK COMMUNITY FOR MEASURING PYROSEQUENCING ACCURACY AND METHOD OF MEASURING PYROSEQUENCING ACCURACY USING THE SAME - The present invention describes a method of measurement of pyrosequencing accuracy by directly calculating sequence errors from FLX Titanium pyrosequencing using mock community, according to the present invention, sequencing errors from FLX Titanium pyrosequencing in terms of microbial diversity and classification can be measured, resulting in possible effects of filtering. | 11-29-2012 |
Joon-Hong Park, Changwon-Shi KR
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20100278675 | 2 STAGE ROTARY COMPRESSOR - The present invention provides a 2 stage rotary compressor including a hermetic container ( | 11-04-2010 |
20100284847 | 2 STAGE ROTARY COMPRESSOR - The present invention provides a 2 stage rotary compressor including a hermetic container ( | 11-11-2010 |
Joon-Hong Park, Suwon-Si KR
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20110068003 | INDIUM TIN OXIDE TARGET, METHOD FOR MANUFACTURING THE SAME, TRANSPARENT CONDUCTIVE FILM OF INDIUM TIN OXIDE, AND METHOD FOR MANUFACTURING TRANSPARENT CONDUCTIVE FILM OF INDIUM TIN OXIDE - Disclosed are an indium Tin Oxide (ITO) target, a method for manufacturing the same, a transparent conductive film of ITO, and a method for manufacturing the transparent conductive film of ITO. The ITO target includes at least one oxide selected from the group consisting of Sm | 03-24-2011 |
20160003465 | Led Lighting Device - An LED lighting device includes a case unit forming a light emitting space, wherein resting surfaces are formed at predetermined areas on the inner side of the case unit, substrates having LEDs mounted thereon and respectively rested on the plurality of resting surfaces, and heat-dissipating units formed in the outer side of the case unit for heat dissipation. Lifespan and user convenience can be improved. | 01-07-2016 |