Patent application number | Description | Published |
20110128420 | METHOD AND SYSTEM FOR REPEATED FIXED PATTERN NOISE CORRECTION - Repeated Fixed Pattern Noise (FPN) in solid state image sensors for a digitally encoded image captured with a sensor is corrected by exploits the periodicity of FPN pattern. In this way FPN is compensated by using a repeating pattern that is associated with repeating blocks of layout. | 06-02-2011 |
20110135218 | IMAGE PROCESSING - An image processor includes a readout arranged to read out an M-bit image data word from an image sensor pixel array and an adder arranged to add a noise contribution to the image data word to obtain a dithered M-bit word. A dither processor is arranged to derive correction data having a word size of M+1 bits from a combination of a plurality of M-bit reference words. The noise contribution are derived from said correction data, wherein different correction data are derived for different groups of pixels, each different group of pixels is associated with a specific pixel value DC shift. | 06-09-2011 |
20110249162 | ANALOG TO DIGITAL CONVERSION IN IMAGE SENSORS - An image sensor has a pixel array and an input circuit. The input circuit includes a first input, a second input and two coupling capacitors. The first input receives an analog signal from a pixel of the pixel array which has a first level during a first calibration period and a second level during a second read period. The second input receives a reference ramp signal. A comparator circuit compares the ramp signal and the analog signal. The analog signal and the ramp signal are constantly read onto the coupling capacitors during both the first calibration period and the second read period. The ramp circuit begins providing the ramp signal during the second read period so as to determine the change in magnitude of the analog signal between the first calibration period and the second read period, the ramp circuit also begins providing the ramp signal during the first calibration period so as to compensate for any delay in the ramp circuit providing the ramp signal during the second read period. | 10-13-2011 |
20110261177 | SAMPLE AND HOLD CIRCUIT - A sample and hold circuit includes a plurality of capacitors, a network of switches and a control circuit. The control circuit is operable to control the network of switches so as to sample an incoming signal onto at least some of the plurality of capacitors. In such an operation, each capacitor takes a sample of the incoming signal at a different time. The sample and hold circuit outputs a signal corresponding to an average of the samples. | 10-27-2011 |
20120132636 | APPLICATION USING A SINGLE PHOTON AVALANCHE DIODE (SPAD) - An oven may include a housing having a cooking receptacle configured to hold content therein, a heating element carried by the housing and configured to heat the content, and a proximity detector carried by the housing in the cooking receptacle and configured to detect surface movement of the content. The proximity detector may include at least one SPAD. | 05-31-2012 |
20120133921 | APPLICATION USING A SINGLE PHOTON AVALANCHE DIODE (SPAD) - A sporting device may include a proximity detector, and a housing for carrying the proximity detector. The proximity detector may comprise a single photon avalanche diode for measuring the speed of an object struck by the housing. For example, the housing may define a tennis racket. | 05-31-2012 |
20120312963 | IMAGE SENSOR ARRANGEMENT - Each column of pixels in an image sensor array has at least two column bitlines connected to an output of each pixel. A readout input circuit includes first inputs and a second input. Each first input is connected, via a capacitance, to a comparator input node. The second input is connected via a capacitance to the same comparator input node. The first inputs receive, in parallel, an analog signal acquired from the pixels via the column bitlines. The analog signals vary during a pixel readout period and have a first level during a first calibration period and a second level during a second read period with the analog signals being constantly read onto the capacitances during both the first calibration period and the second read period. The comparator compares an average of the signals on the plurality of first inputs to the reference signal. | 12-13-2012 |
20130155239 | IMAGE SENSOR WITH IMPROVED DYNAMIC RANGE - An image sensor having improved dynamic range includes a signal that is read out for a selection of pixels which act as a calibration to govern the choice of exposure levels to be applied to the rest of the array. In this way, the sensor is operable to adapt to variations in scene intensity. The pixels in the array are vertically and horizontally addressed so as to enable accounted for small areas of intensity variation across an imaged scene. | 06-20-2013 |
20130155302 | DIGITAL IMAGE SENSOR - A digital imaging sensor includes an array of pixels. A subset of the pixels in the array has reduced photosensitivity in comparison to other pixels in said array. A controller operates to control an integration time of the array of pixels such that a first integration time of the subset of pixels is longer than a second integration time of the other pixels in the array. Such an image sensor is particularly useful for sensing light sources that are not illuminated continuously. | 06-20-2013 |
20130182164 | COMPARATOR IMPLEMENTATION FOR PROCESSING SIGNALS OUTPUT FROM AN IMAGE SENSOR - An image sensor includes an analog-to-digital converter receiving a pixel signal output. The converter includes a first inverting amplifier circuit having an input and an output, the first inverting amplifier circuit including a first bias circuit having a control node and configured to source current for first inverting amplifier circuit operation. The converter further includes a second inverting amplifier circuit having an input and an output, the second inverting amplifier circuit including a second bias circuit having a control node and configured to source current for second inverting amplifier circuit operation. The output of the first inverting amplifier circuit is coupled to the input of the second inverting amplifier circuit. A positive feedback circuit couples the output of the second inverting amplifier circuit to the control node of the first bias circuit. | 07-18-2013 |
20140231630 | METHOD AND APPARATUS FOR IMAGE SENSOR CALIBRATION - A photon sensitive device is provided with a voltage. A controller is configured to control a voltage source so as to cause at least one calibration voltage to be applied to the photon sensitive device in a calibration mode in order to determine the voltage to be provided by the voltage source in a normal mode of operation. | 08-21-2014 |
20140231631 | APPARATUS FOR PULSE SHAPING - An array of photon sensitive devices is configured to provide outputs. Pulse shaping circuits operate to shape a respective output of the array in a normal mode of operation and shape a calibration signal in a calibration mode of operation. | 08-21-2014 |