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Jeyaraman
Govindarajalu Jeyaraman, Bangalore IN
| Patent application number | Description | Published |
|---|---|---|
| 20110004024 | PREPARATION OF NAPHTHOQUINONE COMPOUNDS USING 2,3-DIHALONAPHTHOQUINONE - The present invention relates the use of 2,3-dihalonaphthoquinone compounds of Formula I | 01-06-2011 |
Raghav Jeyaraman, Sunnyvale, CA US
| Patent application number | Description | Published |
|---|---|---|
| 20090187987 | Learning framework for online applications - Learning to, and detecting spam messages using a multi-stage combination of probability calculations based on individual and aggregate training sets of previously identified messages. During a preliminary phase, classifiers are trained, lower and upper limit probabilities, and a combined probability threshold are iteratively determined using a multi-stage combination of probability calculations based on minor and major subsets of messages previously categorized as valid or spam. During a live phase, a first stage classifier uses only a particular subset, and a second stage classifier uses a master set of previously categorized messages. If a newly received message can not be categorized with certainty by the first stage classifier, and a computed first stage probability is within the previously determined lower and upper limits, first and second stage probabilities are combined. If the combined probability is greater than the previously determined combined probability threshold, the received message is marked as spam. | 07-23-2009 |
Satheesh Jeyaraman, Bangalore IN
| Patent application number | Description | Published |
|---|---|---|
| 20090249879 | INSPECTION SYSTEMS AND METHODS FOR DETECTION OF MATERIAL PROPERTY ANOMALIES - An inspection system includes an ultrasonic transducer configured to deliver ultrasonic wave energy to at least one sub volume of the part, and an ultrasonic receiver configured to receive ultrasonic wave energy from the part at a fundamental frequency and at least one harmonic frequency. Both the ultrasonic transducer and the ultrasonic receiver are located on the same side of the part in various configurations. In a method, ultrasonic wave energy is delivered to at least one subvolume of the part using an ultrasonic transducer and ultrasonic wave energy from the part at a fundamental frequency is received at least one harmonic frequency using an ultrasonic receiver positioned on the same side of the part to determine whether one or more material property anomalies are present in the part. | 10-08-2009 |
| 20110317909 | TOOL WEAR QUANTIFICATION SYSTEM AND METHOD - A portable wear quantification system includes a hand-held image acquisition device and a fixture. The fixture includes a first end coupled to the image acquisition device. A light source emits a light beam along an emission axis. A beam splitter is disposed at an angle with respect to an axis of view of the image acquisition device for directing the beam from the light source toward a portion of an object. A second end of the fixture is located on an opposite side of the beam splitter from the first end. The second end includes a platform that is configured to position the fixture with respect to the object. A channel extends from the first end to the second end along the axis of view of the image acquisition device. | 12-29-2011 |
Suresh Jeyaraman, Bangalore IN
| Patent application number | Description | Published |
|---|---|---|
| 20100333061 | EXPLICIT STATE MODEL CHECKING OF SL/SF MODELS USING THE AUTO-GENERATED CODE - A system and a method for validating a model for a control system as per a set of specifications. The method includes obtaining a model code corresponding to the model, where the model-code is generated by a modeling tool. Further, a test-code capable of monitoring one or more model parameters that need to be validated is generated using a testing tool. The model-code and the test-code are combined to obtain an integrated-code. The integrated code is executed in the testing tool that compares the obtained output values with the expected output values as provided in the specifications. Further, the model is identified as valid or invalid based on the comparison based on the results of the comparison. | 12-30-2010 |
Venkataraman Jeyaraman, Rancho Cordova, CA US
| Patent application number | Description | Published |
|---|---|---|
| 20120096416 | HIGH-TEMPERATURE DEVICES ON INSULATOR SUBSTRATES - Semiconductor devices, logic devices, libraries to represent logic devices, and methods for designing and fabricating the same are disclosed. The semiconductor devices include a substrate comprising sapphire or diamond, an active layer disposed on the substrate, the active layer having a thickness tSi and comprising a channel region having a length L, where L/tSi is above 7 and an oxide layer disposed on the active layer. | 04-19-2012 |