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Jerry L. Doorenbos, Tucson US

Jerry L. Doorenbos, Tucson, AR US

Patent application numberDescriptionPublished
20080258951Hybrid Delta-Sigma/SAR Analog to Digital Converter and Methods for Using Such - Various systems and methods for capturing data are disclosed. For example, some embodiments of the present invention provide methods for performing a first analog to digital conversion using a delta-sigma based analog to digital converter, and performing a second analog to digital conversion using a SAR based analog to digital converter. The delta-sigma converter provides a first portion of a conversion result, and the SAR based analog to digital converter provides a second portion of the conversion result. The methods further include combining the first portion of the conversion result with the second portion of the conversion result to produce a combined conversion result.10-23-2008
20080258959Integrating/SAR ADC and method with low integrator swing and low complexity - A reconfigurable circuit (10-23-2008
20080259989Systems and Methods for Temperature Measurement Using N-Factor Coefficient Correction - Various systems and methods for temperature measurement are disclosed. For example, some embodiments of the present invention provide temperature measurement systems. Such temperature measurement systems include a variable current source and a diode connected transistor. The variable current source is capable of applying two or more distinct currents to the diode connected transistor. The currents result in a different base-emitter voltage on the diode connected transistor. The systems further include an n-factor coefficient register and an analog to digital converter. The analog to digital converter is operable to receive two of the base-emitter voltages created by applying the different currents, and to provide a digital output based at least in part on a value stored in the n-factor coefficient register and the two base-emitter voltages.10-23-2008
20080259997Systems and Methods for PWM Clocking in a Temperature Measurement Circuit - Various systems and methods for pulse width modulated clocking in a temperature measurement are disclosed. For example, some embodiments of the present invention provide temperature measurement systems with a variable current source, a transistor, and a pulse width modulation circuit. The variable current source is operable to provide a first current and a second current that are applied to the transistor. A first base-emitter voltage occurs on the transistor when the first current is applied, and a second base-emitter voltage occurs on the transistor when the second current is applied. The first base emitter voltage is associated with a first sample period, and a second base-emitter voltage is associated with a second sample period. The pulse width modulation circuit provides a pulse width modulated clock including a combination of the aforementioned first period and second period.10-23-2008
20080288662Identification address configuration circuit and method without use of dedicated address pins - An identification address of a sensor interface device is configured in response to the order of connection of first (DXP11-20-2008
20090009239Low glitch offset correction circuit for auto-zero sensor amplifiers and method - An instrumentation amplifier includes first (01-08-2009
20090073011CIRCUIT AND METHOD FOR GAIN ERROR CORRECTION IN ADC - Gain errors are corrected in an ADC chip including an integrator (03-19-2009
20100019842Low-noise, wide offset range, programmable input offset amplifier front end and method - A programmable offset amplifier includes first (M01-28-2010
20100329304Circuit and method for beta variation compensation in single-transistor temperature sensor - A circuit (12-30-2010

Patent applications by Jerry L. Doorenbos, Tucson, AR US