| Patent application number | Description | Published |
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| 20080254589 | METHOD FOR MANUFACTURING COLLARS OF DEEP TRENCH CAPACITORS - A method for manufacturing collars of deep trench capacitors includes providing a substrate with a deep trench in which there is a trench capacitor in the bottom; forming an inner wall layer completely covering the deep trench and the substrate; forming a hard mask layer on the surface of the inner wall layer; performing a selective implanting but not on the hard mask layer on the wall of the deep trench; performing a selective wet etching to remove the not implanted hard mask layer; and performing an anisotropic dry etching to substantially remove the inner wall layer on the bottom of the deep trench so as to partially expose the trench capacitor and to substantially retain the collars of the deep trench capacitors intact. | 10-16-2008 |
| 20080268640 | METHOD FOR FORMING BIT-LINE CONTACT PLUG AND TRANSISTOR STRUCTURE - A method for forming a bit-line contact plug includes providing a substrate including a transistor which includes a gate structure and a source/drain at both sides of the gate structure; forming a conductive layer, a bit-line contact material layer and a hard mask layer; performing an etching process using the conductive layer as an etching stop layer to etch the bit-line contact material layer and the hard mask layer and forming the bit-line contact plug on the source/drain. A transistor structure includes a gate structure and a source/drain at both sides of the gate structure, a conductive layer covering part of the gate structure and connected to the source/drain, and a bit-line contact plug disposed on the conductive layer and directly connected to the conductive layer. | 10-30-2008 |
| 20080286935 | METHOD OF FABRICATING AN ISOLATION SHALLOW TRENCH - A method of fabricating an isolation shallow trench contains providing a substrate with at least a deep trench, forming a cap layer on the upper portion of the deep trench, forming a crust layer on a portion of the cap layer, defining a trench extending through the cap layer and the conductive layer, and forming an isolation layer in the shallow trench. | 11-20-2008 |
| 20090087978 | INTERCONNECT MANUFACTURING PROCESS - An interconnect process is provided. A substrate is provided. A plurality of gate structures is disposed on the substrate, and doped regions are disposed in the substrate and respectively located between two adjacent gate structure. A liner is conformally formed above the substrate. A dielectric layer is formed above the substrate. A contact opening is formed in the dielectric layer between two neighboring gate structures to expose the liner on the doped region and on a portion of the top surface and a portion of the sidewall of each of the gate structures. A polymer material is deposited on the liner on the portion of the top surface of each of the gate structures and on the doped region. The liner on the doped regions is removed. A conductive layer is filled in the contact opening, which is free of electrical connection to the gate structures. | 04-02-2009 |
| 20090124079 | METHOD FOR FABRICATING A CONDUCTIVE PLUG - A method for fabricating a conductive plug includes the steps of providing a substrate having at least a gate structure thereon, a first dielectric layer covering a surface of the substrate, a second dielectric layer disposed on the first dielectric layer, and at least a metal line formed within the second dielectric layer; forming a hard mask plug on the second dielectric layer; forming a third dielectric layer covering the second dielectric layer and the hard mask plug; removing a portion of the third dielectric layer to expose the hard mask plug; removing the hard mask plug to form a plug hole; and forming the conductive plug within the plug hole to electrically connect with the gate structure. | 05-14-2009 |
| 20100032743 | DYNAMIC RANDOM ACCESS MEMORY STRUCTURE, ARRAY THEREOF, AND METHOD OF MAKING THE SAME - A dynamic random access memory (DRAM) structure has a stacked capacitor disposed above an upper source/drain region of a vertical transistor having a surrounding gate. The gates of each row of a memory array are electrically connected with a buried word line. Each of bit lines is disposed between two adjacent columns of transistors and electrically connected with lower source/drain regions through bit line contacts. The DRAM structure may have a unit cell size of 4F | 02-11-2010 |
| 20100097854 | FLASH MEMORY AND FLASH MEMORY ARRAY - A flash memory including a substrate having a recess, a buried bit line, a word line, a single side insulating layer, a floating gate, a tunneling dielectric layer, a control gate, and an inter-gate dielectric layer is provided. The buried bit line extends below the recess of the substrate along a first direction. The word line is on the substrate, and extends above the recess along a second direction. The single side insulating layer is on a first sidewall of the recess. The floating gate is on a second sidewall of the recess to be opposite to the single side insulating layer. The tunneling dielectric layer is sandwiched by the floating gate and the substrate to contact the buried bit line. The control gate fills the recess and contacts the word line. The inter-gate dielectric layer is sandwiched by the control gate and the floating gate. | 04-22-2010 |
| Patent application number | Description | Published |
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| 20080206684 | METHOD FOR FORMING RING PATTERN - A method for forming a ring pattern is disclosed. The ring pattern has a first wall and a second wall. The method includes the following steps: (a) providing a substrate; (b) forming a dielectric layer on the substrate; (c) forming a first patterned photoresist layer on the dielectric layer, the first patterned photoresist layer defining the first wall; (d) etching the dielectric layer to a predetermined depth by using the first patterned photoresist as a mask, and then removing the first patterned photoresist layer; (e) forming a second patterned photoresist layer on the dielectric layer, the second patterned photoresist layer defining the second wall; (f) etching the dielectric layer by using the second patterned photoresist layer as a mask so as to form the ring pattern having the first wall and the second wall. | 08-28-2008 |
| 20080303103 | SEMICONDUCTOR STRUCTURE AND METHOD OF FORMING THE SAME - The present invention provides a semiconductor structure and a method of forming the same. The method includes the steps of providing a substrate, forming a mask layer with an opening on the substrate, locally oxidizing the substrate to form an oxide layer within the opening, removing the oxide layer, such that a partial surface of the substrate becomes a curve surface, forming a sacrificial layer on the curve surface, forming a first doped region in the substrate and under the hard mask layer, forming a gate stack within the opening, removing the hard mask layer, forming a spacer on a sidewall of the gate stack, and forming a second doped region in the substrate and under the spacer. The second doped region has a dopant concentration is larger than that of the first doped region. Therefore, the oxide layer increases the surface area of the substrate so as to increase the channel length. Thus, the leakage between the source region and the drain region can be improved. | 12-11-2008 |
