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Japha
Jonathan Japha, Rehovot IL
| Patent application number | Description | Published |
|---|---|---|
| 20100320995 | ATOM CHIP DEVICE - Ultra-cold (nano-Kelvin) neutral atoms can be trapped, manipulated, and measured, using integrated current carrying micro-structures on a nearby surface (Atom Chips). This can be utilized for the realization of ultra-sensitive sensors and quantum computation devices based on the quantum mechanical properties of the trapped atoms. However, harmful processes arise from the interactions between the atoms and the nearby surface. According to the present invention these harmful processes can be highly suppressed by using electrically anisotropic materials. It is shown that time-independent trapping potential corrugation leading to fragmentation of the trapped atom cloud can be suppressed, and that time dependent noise processes arising from the coupling of atoms to the nearby surface, and leading to loss of atoms from the trap, heating and loss of coherence can be significantly reduced. | 12-23-2010 |
Yonathan Japha, Rehovot IL
| Patent application number | Description | Published |
|---|---|---|
| 20110038053 | GUIDED MATTER-WAVE SAGNAC INTERFEROMETER - The present invention provides an interferometer apparatus comprising a matter-wave guide enclosing an area, wherein a flux of particles may be guided in the matter-wave guide in at least two opposite paths, the matter-wave guide is rotatable relative to an inertial frame of reference; a first beam splitter to split the first beam to at least second and third beams, each of the second and third beams is to be guided in another path of the two opposite paths; and a second beam splitter allowing particles of the second and third beams to exit the matter-wave guide in a first probability and to stay in the matter-wave guide in a second probability. | 02-17-2011 |
Yoni Japha, Rehovot IL
| Patent application number | Description | Published |
|---|---|---|
| 20100154570 | ATOMCHIP DEVICE - An AtomChip device and a method for trapping, manipulating and measuring atoms in ultra high vacuum chamber, and for increasing the lifetime of the trapped atoms, the AtomChip device including at least one conductive element, made of metal, wherein at least part of the metal is a dilute alloy metal, and wherein the at least one conductive element has a low working temperature. | 06-24-2010 |