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Jang, Cheonan-Si
Chulwoong Jang, Cheonan-Si KR
| Patent application number | Description | Published |
|---|---|---|
| 20100235693 | SOLID STATE DRIVE TESTING APPARATUS AND METHOD - Provided are apparatus and method of testing solid state drives. The method includes accommodating solid state drives to be tested in a magazine with one or more cassettes, sorting the solid state drives into operable solid state drives or defective solid state drives by testing electrical characteristics, and loading the sorted solid state drives. | 09-16-2010 |
Chul-Woong Jang, Cheonan-Si KR
| Patent application number | Description | Published |
|---|---|---|
| 20090015287 | APPARATUS FOR TESTING AN OBJECT - An apparatus for testing an object includes a test chamber, a guiding member, testing units and a transferring unit. The test chamber is configured to receive the object. The guiding member is arranged extending along a first direction in the test chamber. The testing units are movably connected to the guiding member to test electrical characteristics of the object. The transferring unit is arranged in the test chamber to load the object into one of the testing units and unload the object from one of the testing units. The testing units may be transferred to a position for repair without suspension of the apparatus. The object may be tested using another testing unit while the other testing unit is being repaired. | 01-15-2009 |
| 20090300442 | Field mounting-type test apparatus and method for testing memory component or module in actual PC environment - Provided are a field mounting-type test apparatus and method, which can enhance competitiveness of a product by simulating various test conditions including a mounting environment so as to improve quality reliability of a memory device and by minimizing overall loss due to change in a mounting environment so as to reduce testing time and cost. In accordance with example embodiments, the field mounting-type test apparatus may include a mass storage device configured to store logic data simulating a mounting environment of a device under test (DUT) and a tester main frame configured to test the DUT by using the logic data. | 12-03-2009 |
| 20110109318 | SIGNAL CAPTURE SYSTEM AND TEST APPARATUS INCLUDING THE SAME - A signal capture system for capturing a signal and storing the captured signal in a storage apparatus in real time, and a test apparatus including the signal capture system. The signal capture system includes a printed circuit board; a socket that is connected to the printed circuit board and on which a reference memory component is mounted; and an interposer that is mounted on the printed circuit board, is connected to the socket, an external apparatus, and a storage apparatus, receives first signals from the reference memory component and transmits the received first signals to the external apparatus and the storage apparatus, and receives second signals from the external apparatus and transmits the received second signals to the reference memory component and the storage apparatus, wherein a shape of the socket is defined according to a type of the reference memory component. | 05-12-2011 |
Chul-Wuong Jang, Cheonan-Si KR
| Patent application number | Description | Published |
|---|---|---|
| 20080204066 | Automatic test equipment capable of high speed test - Automatic test equipment is capable of performing a high-speed test of semiconductor devices, with a low cost and high efficiency. The automatic test equipment (ATE) comprises: an ATE body configured to electrically test semiconductor devices; a field programmable gate array (FPGA) controlling drivers and comparators on the ATE; an accelerator connected to an output terminal of the FPGA and that doubles an operating frequency of the FPGA; and a decelerator connected to an output terminal of the FPGA and that converts an operating frequency of data transferred from the semiconductor device to the operating frequency of the FPGA. | 08-28-2008 |
Dae-Jin Jang, Cheonan-Si KR
| Patent application number | Description | Published |
|---|---|---|
| 20080254702 | APPARATUS FOR ASSEMBLING LAMPS AND METHOD OF ASSEMBLING LAMPS USING THE SAME - An apparatus for assembling lamps that automatically installs lamps into a container includes a lamp arrangement unit including a retaining-stage formed to receive a plurality of lamps, and a lamp press-fitting unit including grippers that holds lamps positioned on the retaining-stage to move lamps, a body press-fitting portion that positions bodies of lamps into a container, and a lead press-fitting portion that positions leads of lamps into the container. A method of assembling lamps uses the apparatus. | 10-16-2008 |
Jin-Hyuk Jang, Cheonan-Si KR
| Patent application number | Description | Published |
|---|---|---|
| 20110210898 | GROUND RADIATION ANTENNA - A ground radiation antenna is disclosed. Herein, the ground radiation antenna provides a radiator-forming circuit, which is formed to have a simple structure using a capacitive element, as well as a feeding circuit suitable for the provided radiator-forming circuit. Thus, the structure of the antenna becomes simpler and the size of the antenna becomes smaller. Accordingly, the fabrication process of the antenna is simplified, thereby largely reducing the fabrication cost. | 09-01-2011 |
Min-Sok Jang, Cheonan-Si KR
| Patent application number | Description | Published |
|---|---|---|
| 20090068916 | METHOD OF MANUFACTURING CONDUCTIVE PARTICLE, ANISOTROPIC CONDUCTIVE ADHESIVE HAVING THE SAME, AND METHOD OF MANUFACTURING DISPLAY APPARATUS USING THE SAME - In an anisotropic conductive adhesive containing a conductive particle, the conductive particle includes a resin particle that is provided with a cavity formed therein and a conductive layer surrounding a surface of the resin particle. The cavity is formed by mixing the resin particle with a reactant and partially removing the reactant from the resin particle. Thus, the conductive particle may readily absorb an external pressure, thereby providing an improved malleability to the conductive particle. | 03-12-2009 |
Seung-Ho Jang, Cheonan-Si KR
| Patent application number | Description | Published |
|---|---|---|
| 20080204066 | Automatic test equipment capable of high speed test - Automatic test equipment is capable of performing a high-speed test of semiconductor devices, with a low cost and high efficiency. The automatic test equipment (ATE) comprises: an ATE body configured to electrically test semiconductor devices; a field programmable gate array (FPGA) controlling drivers and comparators on the ATE; an accelerator connected to an output terminal of the FPGA and that doubles an operating frequency of the FPGA; and a decelerator connected to an output terminal of the FPGA and that converts an operating frequency of data transferred from the semiconductor device to the operating frequency of the FPGA. | 08-28-2008 |
| 20090300442 | Field mounting-type test apparatus and method for testing memory component or module in actual PC environment - Provided are a field mounting-type test apparatus and method, which can enhance competitiveness of a product by simulating various test conditions including a mounting environment so as to improve quality reliability of a memory device and by minimizing overall loss due to change in a mounting environment so as to reduce testing time and cost. In accordance with example embodiments, the field mounting-type test apparatus may include a mass storage device configured to store logic data simulating a mounting environment of a device under test (DUT) and a tester main frame configured to test the DUT by using the logic data. | 12-03-2009 |