James Craig
James Craig Fryman, New Paris, IN US
Patent application number | Description | Published |
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20120123423 | PATIENT-SPECIFIC INSTRUMENTS FOR TOTAL HIP ARTHROPLASTY - Patient-specific instruments for preparing bones, such as a proximal femur and an acetabulum in a total hip arthroplasty, to receive respective orthopedic prostheses. The guides include a femoral resection guide and a bone canal preparation guide, each having a surface conforming to at least one of a metaphysis and a femoral neck of a femur. The femoral resection guide includes a cut referencing surface to guide a cutting instrument, and the bone canal preparation guide includes a guide aperture sized to guide a rasping instrument. An acetabular guide includes a surface conforming to an acetabulum and a guide aperture for guiding a surgical instrument such as a reaming instrument. The patient-specific, conforming surfaces of each of the guides may be designed based on patient-specific anatomical data obtained from the use of imaging technology. | 05-17-2012 |
James Craig Harti, Snohomish, WA US
Patent application number | Description | Published |
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20100033734 | Vehicle frame deformation measurement apparatus and method - An apparatus and method are provided for indicating deformation of a vehicle body when the vehicle body has reference points and a normal position thereof. The apparatus and method comprising the use of at least one target positioned at a predetermined location relative to the reference point on the vehicle body. The target is adapted to provide information indicating the position of the target relative to said normal position thereof when a laser scanner sweeps a laser beam across the target to activate the target and provide target location information. A computer is provided for receiving the target location information and calculating the position of the target relative to normal position. The laser source of the laser scanner is a Diode Pumped Solid State (DPSS) laser to provide stable beam output and prevent beam drift to prove a more accurate measurement. | 02-11-2010 |
James Craig Ondrusek, Richardson, TX US
Patent application number | Description | Published |
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20130039139 | Method of Stressing Static Random Access Memories for Pass Transistor Defects - A method of stressing and screening static random access memory (SRAM) arrays to identify memory cells with bit line side pass transistor defects. After writing initial data states into the memory array under nominal bias conditions, an elevated bias voltage is applied to the memory array, for example to its power supply node. Under the elevated bias voltage, alternating data patterns are written into and read from the memory array for a selected duration. The elevated bias voltage is reduced, and a write screen is performed to identify defective memory cells. The dynamic stress of the repeated writes and reads accelerates early life failures, facilitating the write screen. | 02-14-2013 |