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Izumi Waki, Tokyo JP

Izumi Waki, Tokyo JP

Patent application numberDescriptionPublished
20090039253Gas monitoring apparatus - A gas monitoring apparatus includes a sample introducing portion, a measurement portion, an ionization portion, a mass analysis portion, a data processing portion and a display. The sample introducing portion introduces a sample gas including an object material to be measured. The measurement portion measures a concentration of a predetermined coexisting material, which coexists with the object material in the sample gas. The ionization portion ionizes the sample gas. The mass analysis portion analyzes mass of an ion produced by the ionization portion. The data processing portion analyzes signals detected by the mass analysis portion to calculate a concentration of the object material. And the display displays results of analysis conducted by the data processing portion. The data processing portion includes an adjustment portion which adjusts the concentration of the object material according to the concentration of the predetermined coexisting material.02-12-2009
20090084950Apparatus for detecting chemical substances and method therefor - An apparatus for detecting chemical substances which is high in sensitivity and selectivity is provided.04-02-2009
20090189065Method of mass spectrometry and mass spectrometer - In a mass spectrometer introducing ions produced at an ion source, and including quadrupole rods which have an inlet and an outlet and to which a radio-frequency voltage is applied, the mass spectrometer, i.e., a mass spectrometry device implemented by a linear trap which exhibits high ejection efficiency, high mass resolution, and low ejection energy, executes the following steps: Trapping at least part of the ions by a trap potential generated on the central axis of a quadrupole field, oscillating part of the trapped ions in an intermediate direction between the mutually-adjacent quadrupole rods, ejecting the oscillated ions by an extraction field, and detecting the ejected ions or introducing the ejected ions into another detection process.07-30-2009
20090200458Adhering Matter Inspection Equipment and Method for Inspecting Adhering Matter - A technology for collecting a granular substance adhering to a baggage with high rate without touching the substance and inspecting whether a dangerous or specific sample material is adhered to the baggage. A method for simplifying or automating such an inspection is also provided. An adhering matter inspection equipment (08-13-2009
20090278043ION GUIDE DEVICE, ION REACTOR, AND MASS ANALYZER - A charged particle reaction cell of the present invention has a serially-arranged plurality of ring electrodes, wherein a modulated radio frequency voltage obtained by modulating the amplitude of a radio frequency voltage is applied, whereby ions are captured at the bottom of the ups and downs of a formed pseudopotential and are transferred with the move of the pseudopotential. In the charged particle reaction cell, the time required for the charged particle reaction can be secured and also the problem of the decrease of the throughput or the mass resolution can be solved, and the speed of the structure analysis of a measurement sample can be accelerated.11-12-2009
20090294646Mass Spectrometer - An electron capture dissociation device to implement a combination of electron capture dissociation and collision dissociation and a mass spectrometer with the use thereof are provided. This device includes a linear ion trap provided with linear multipole electrodes applied with a radio frequency electric field and wall electrodes that are arranged on both ends in the axis direction of the linear multipole electrodes, have holes on the central axis thereof, and generate a wall electric field by being applied with a direct-current voltage, a cylindrical magnetic field-generating unit that generates a magnetic field parallel to the central axis of the linear multipole electrodes and surrounds the linear ion trap, and an electron source arranged opposite to the linear multipole electrodes with sandwiching one of the wall electrodes. The electron generation site of the electron source is placed in the inside of the magnetic field generated by the magnetic field-generating unit.12-03-2009
20100219337Method Of Mass Spectrometry And Mass Spectrometer - A mass spectrometer introducing ions produced at an ion source, and including quadrupole rods which have an inlet and an outlet and to which a radio-frequency voltage is applied, the mass spectrometer, i.e., a mass spectrometry device implemented by a linear trap which exhibits high ejection efficiency, high mass resolution, and low ejection energy, executes the following steps: Trapping at least part of the ions by a trap potential generated on the central axis of a quadrupole field, oscillating part of the trapped ions in an intermediate direction between the mutually-adjacent quadrupole rods, ejecting the oscillated ions by an extraction field, and detecting the ejected ions or introducing the ejected ions into another detection process.09-02-2010
20110157580PRETREATMENT APPARATUS AND MASS SPECTROMETER EQUIPPED WITH THE SAME APPARATUS - To perform accurate measurement in the analysis of chemical components with low concentration, pretreatment such as concentration and purification of samples is essential. For high-throughput of pretreatment of biological samples, various random clinical testing is encountered, where analytes change from sample to sample. The pretreatment apparatus has a separating agent selectively separating a specific component by allowing a sample solution to flow therethrough. A holding section holds a plurality of housing sections, which house the separating agent therein, and has an endless track. A pressurizing section applies pressure to the housing section in a continuous and random-accessible manner; and an extraction solution receiver mechanism selectively receives an extracted solution from the separating agent housed in the housing section. A mass spectrometer is connected to the pretreatment apparatus. Thus, a large number of specimens can be simultaneously processed.06-30-2011

Patent applications by Izumi Waki, Tokyo JP