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| 20080248245 | Soft Magnetic Material, Method of Manufacturing Soft Magnetic Material, Dust Core, and Method of Manufacturing Dust Core - A soft magnetic material includes a plurality of composite magnetic particles. Each of the plurality of composite magnetic particles has a metal magnetic particle including iron, a lower film surrounding the surface of the metal magnetic particle and including a nonferrous metal, and an insulating upper film surrounding the surface of the lower film and including an inorganic compound. The inorganic compound contains at least one element of oxygen and carbon. The nonferrous metal has an affinity with at least one of oxygen and carbon that is larger than such affinity of iron. The nonferrous metal has a diffusion coefficient with respect to at least one of oxygen and carbon that is smaller than such diffusion coefficient of iron. Thus, a soft magnetic material that provides desirable magnetic properties, a method of manufacturing a soft magnetic material, a dust core, and a method of manufacturing a dust core are provided. | 10-09-2008 |
| 20090047519 | SOFT MAGNETIC MATERIAL, DUST MAGNETIC CORE, PROCESS FOR PRODUCING SOFT MAGNETIC MATERIAL AND PROCESS FOR PRODUCING DUST MAGNETIC CORE - The soft magnetic material includes a plurality of composite magnetic particles having a metal magnetic particle and an insulating film surrounding the surface of the metal magnetic particle. The metal magnetic particle contains iron as the main component. The insulating film contains aluminum, silicon, phosphorus, and oxygen. The insulating film satisfies the relationship 0.4≦M | 02-19-2009 |
| 20100255188 | SOFT MAGNETIC MATERIAL, POWDER MAGNETIC CORE AND METHOD OF MANUFACTURING SOFT MAGNETIC MATERIAL - A soft magnetic material is a soft magnetic material including a composite magnetic particle ( | 10-07-2010 |
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| 20080210883 | Liquid metal ion gun - An emitter of a Ga liquid metal ion source is constituted to include W12 of a base material and Ga9 of an ion source element covering a surface as construction materials. By making back-sputtered particles become elements (W and Ga) of the Ga liquid metal ion sour source, if back-sputtered particles attach to the Ga liquid metal ion source, contamination which may change physical characteristics of Ga9 does not occur. A W aperture is used as a beam limiting (GUN) aperture to place Ga of approx. 25 mg (of melting point of 30° C.) on a surface of a portion included in a beam emission region (Ga store). When emitting ions to the beam limiting (GUN) aperture, Ga in the emission region melts and diffuses on a surface of the beam emission region of the W aperture. | 09-04-2008 |
| 20090127458 | Methods for Sample Preparation and Observation, Charged Particle Apparatus - In an SEM observation in a depth direction of a cross section processed by repeated FIB cross-sectioning and SEM observation to correct a deviation in an observation field of view and a deviation in focus, are corrected, the deviations occurring when a processed cross section moves in the depth direction thereof; information on a height and a tilt of a surface of cross section processing area is calculated before the processing, the above information is used, the deviation in a field of view and the deviation in focus in SEM observation, which correspond to an amount of movement of the cross section at a time of the processing, are predicted, and the SEM is controlled based on the predicted values. | 05-21-2009 |
| 20090152462 | Gas field ionization ion source, scanning charged particle microscope, optical axis adjustment method and specimen observation method - It is an object of the present invention to improve the stability of a gas field ionization ion source. | 06-18-2009 |
| 20090173888 | Gas field ion source, charged particle microscope, and apparatus - A gas field ion source that can simultaneously increase a conductance during rough vacuuming and reduce an extraction electrode aperture diameter from the viewpoint of the increase of ion current. The gas field ion source has a mechanism to change a conductance in vacuuming a gas molecule ionization chamber. That is, the conductance in vacuuming a gas molecule ionization chamber is changed in accordance with whether or not an ion beam is extracted from the gas molecule ionization chamber. By forming lids as parts of the members constituting the mechanism to change the conductance with a bimetal alloy, the conductance can be changed in accordance with the temperature of the gas molecule ionization chamber, for example the conductance is changed to a relatively small conductance at a relatively low temperature and to a relatively large conductance at a relatively high temperature. | 07-09-2009 |
| 20110114476 | Method and apparatus for specimen fabrication - A sample fabricating method of irradiating a sample with a focused ion beam at an incident angle less than 90 degrees with respect to the surface of the sample, eliminating the peripheral area of a micro sample as a target, turning a specimen stage around a line segment perpendicular to the sample surface as a turn axis, irradiating the sample with the focused ion beam while the incident angle on the sample surface is fixed, and separating the micro sample or preparing the micro sample to be separated. A sample fabricating apparatus for forming a sample section in a sample held on a specimen stage by scanning and deflecting an ion beam, wherein an angle between an optical axis of the ion beam and the surface of the specimen stage is fixed and formation of a sample section is controlled by turning the specimen stage. | 05-19-2011 |
| 20110254944 | SCANNING CHARGED PARTICLE MICROSCOPE - When a scanning image of a scanning charged particle microscope is impaired by an external disturbance, a disturbance frequency can be simply and precisely analyzed from the image in order to specify the external disturbance. The maximum frequency analyzable by the scanning charged particle microscope can also be increased up to several kHz, which is the rotation frequency of, for example, a turbo-molecular pump commonly used as an exhaust pump of the scanning charged particle microscope. In an FFT analysis of a stripe pattern which is an impairment of the scanning image, the scanning charged particle microscope performs a one-dimensional FFT (1D-FFT) in the Y-direction (sub-deflection direction of the charged particle beam) or a one-dimensional DFT (1D-DFT) in the X-direction (main deflection direction of the charged particle beam). To extend the analyzable maximum frequency up to several kHz, the scanning charged particle microscope also performs the 1D-FFT (or 1D-DFT) analysis in the X-direction (main deflection direction of the charged particle beam) along which the charged particle beam has a fast scanning speed. | 10-20-2011 |
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| 20080215550 | SEARCH SUPPORT APPARATUS, COMPUTER PROGRAM PRODUCT, AND SEARCH SUPPORT SYSTEM - A search support apparatus estimates, based on a document and a specific phrase (keyword) in the document, a theme of the document, a site type of a website that provides the document, and a content type of the document, and selects a search condition corresponding to the theme, the site type, and the content type, to be presented to the user. | 09-04-2008 |
| 20080243791 | APPARATUS AND METHOD FOR SEARCHING INFORMATION AND COMPUTER PROGRAM PRODUCT THEREFOR - An information searching apparatus stores, in a character-string accumulating unit, first character strings in correspondence with second character strings while classifying each of the second character strings according to an attribute thereof. The information searching apparatus further stores, in a storage unit, the attributes in correspondence with specified information each of which is specified based on at least one of the corresponding first character string and the containing document. The information searching apparatus obtains specified information based on at least one of a first character string and a document that contains the first character string and extracts, from the storage unit, the attributes. The information searching apparatus then extracts, from the character-string accumulating unit, one of the second character strings. | 10-02-2008 |
| 20090049144 | APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR PROCESSING EMAIL, AND APPARATUS FOR SEARCHING EMAIL - An email processing apparatus determines, from at least one or more of a main body of an email and a subject of an email stored in an email storage unit, a content category of the email; specifies, based on the content category, a search target category of a search target email that relates to the email of the content category; acquires search target information for searching for a search target email of the search target category; and creates a search condition for searching for the search target email containing the search target information in the email storage unit. | 02-19-2009 |
| 20090077122 | APPARATUS AND METHOD FOR DISPLAYING CANDIDATES - A candidate displaying apparatus includes: a content input unit that performs an input process on a content; a named entity extracting unit that extracts, from the content, named entities each identifying a specific object or a specific piece of information; an association degree calculating unit that calculates a degree of association between each of the named entities and a predetermined character string contained in the content; an associated information storage unit that stores therein the named entities, the character string, and the degrees of association in correspondence with one another; and a displaying unit that displays, on a display device, the named entities that are kept in correspondence with the character string as selectable candidates in descending order of the degrees of association thereof. | 03-19-2009 |
| 20090083230 | APPARATUS AND METHOD FOR SUPPORTING INFORMATION SEARCHES - An information search supporting apparatus includes a search history storage storing keywords, narrow-down criteria for each of the keywords, and keyword attributes expressing meanings of the keywords, while keeping them in correspondence; and a search number-of-times storage storing number of times indicating how many times one or both of the keywords and the narrow-down criteria have each been used in searches. The apparatus receives input of a character string, obtains a character string attribute expressing the meaning thereof, obtains, from the search history storage, any of the keywords and narrow-down criteria that are in association with the keyword attribute matching the character string attribute, further obtains, from the search number-of-times storage, the number corresponding to one or both of the obtained keywords and narrow-down criteria, and generates a screen on which the obtained keywords and narrow-down criteria are rearranged based on the number and that prompts the user to specify a new search criterion. | 03-26-2009 |
