Inuma
Manabu Inuma, Tokyo JP
Patent application number | Description | Published |
---|---|---|
20130174243 | BIOMETRIC AUTHENTICATION SYSTEM, COMMUNICATION TERMINAL DEVICE, BIOMETRIC AUTHENTICATION DEVICE, AND BIOMETRIC AUTHENTICATION METHOD - Provided is a biometric authentication system capable of preventing spoofing attacks even if leakage of key information and a registration conversion template occurs. A communication terminal device ( | 07-04-2013 |
Takehiro Inuma, Hadano-Shi JP
Patent application number | Description | Published |
---|---|---|
20100187732 | SOLDER RECOVERY DEVICE - A solder recovery device includes a melter which melts solder dross stored in a melting crucible, an agitation unit which agitates the melted solder dross, so as to separate the melted solder dross up and down into an oxidized residue and a recycled solder in the melting crucible, and a suction unit which sucks the oxidized residue generated by the agitation, the suction unit sucking the oxidized residue in an upper portion of the melting crucible to be removed. | 07-29-2010 |
Tsuyoshi Inuma, Kamiina-Gun JP
Patent application number | Description | Published |
---|---|---|
20100164518 | PROBE CARD - A probe card is provided that is capable of accurately ensuring the flatness and the parallelism with respect to a predetermined reference surface. A point (Q) of application of force applied from a leaf spring ( | 07-01-2010 |
20100219852 | PROBE CARD - A probe card includes a probe head that holds a plurality of probes; a flat wiring board that has a wiring pattern corresponding to a circuit structure; an interposer that is stacked on the wiring board and relays wirings of the wiring board; a space transformer that is placed between the interposer and the probe head, transforms a space between the wirings relayed by the interposer, and leads the transformed wirings out to a surface facing the probe head; and a plurality of post members that are formed in a substantially columnar shape with a height larger than a sum of a thickness of the wiring board and a thickness of the interposer, and embedded to pierce through the wiring board and the interposer in a thickness direction such that one of end surfaces of each post member comes into contact with the space transformer. | 09-02-2010 |
Tsuyoshi Inuma, Nagano JP
Patent application number | Description | Published |
---|---|---|
20100001748 | Probe Card - A probe card includes a flat wiring board having a wiring pattern corresponding to a circuit structure for generating a signal for a test, an interposer that is stacked on the wiring board and relays wirings of the wiring board, a space transformer that is stacked on the interposer and fastened thereto by an adhesive, transforms a space between the wirings relayed by the interposer, and leads the wirings out to a surface opposite a surface facing the interposer, and a probe head that is stacked on the space transformer and houses and holds a plurality of probes. | 01-07-2010 |
20100001752 | PARALLELISM ADJUSTING MECHANISM OF PROBE CARD - A parallelism adjusting mechanism of a probe card is provided. The parallelism adjusting mechanism can bring probes held by a probe card into uniform contact with a wafer even if a parallelism between a mounting reference surface for the probe card and the wafer as a test object is lost. To achieve this purpose, specifically, to adjust a parallelism of a probe card ( | 01-07-2010 |