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Indukuru, TX

Venkat Indukuru, Austin, TX US

Patent application numberDescriptionPublished
20110154067WORKLOAD POWER CONSUMPTION PROJECTION ON INFORMATION HANDLING SYSTEM - The projected power consumption for an application program running on a future IHS is determined by generating a power proxy for the application program, and power proxies for a plurality of standard benchmarks. An algorithm correlates the power proxy for the application program, and the power proxies for the standard benchmarks to generate weighted surrogates that are combined with power proxies derived from running the benchmark surrogates on the future IHS to generate the projected power consumption.06-23-2011

Venkat R. Indukuru, Austin, TX US

Patent application numberDescriptionPublished
20080307203Scaling Instruction Intervals to Identify Collection Points for Representative Instruction Traces - A method, system, and computer program product are provided for identifying instructions to obtain representative traces. A phase instruction budget is calculated for each phase in a set of phases. The phase instruction budget is based on a weight associated with each phase and a global instruction budget. A starting index and an ending index are identified for instructions within a set of intervals in each phase in order to meet the phase instruction budget for that phase, thereby forming a set of interval indices. A determination is made as to whether the instructions within the set of interval indices meet the global instruction budget. Responsive to the global instruction budget being met, the set of interval indices are output as collection points for the representative traces.12-11-2008
20090199138Method and Apparatus for Evaluating Integrated Circuit Design Model Performance Using Basic Block Vectors and Fly-By Vectors Including Microarchitecture Dependent Information - A test system or simulator includes an IC test application sampling software program that executes test application software on a semiconductor die IC design model. The test application sampling software includes trace, simulation point, CPI error, clustering and other programs. IC designers utilize the test application sampling software to evaluate the performance characteristics of IC designs with test software applications. The test application sampling software generates basic block vectors (BBVs) and fly-by vectors (FBVs) from instruction trace analysis of test application software. The test application sampling software analyzes microarchitecture dependent information that it uses to generate the FBVs. Test application sampling software generates a reduced representative test application software program from the BBV and FBV data utilizing an instruction budgeting method. Designers use the test system with test application sampling software to evaluate IC design models by using the representative test application software program.08-06-2009
20090276190Method and Apparatus For Evaluating Integrated Circuit Design Performance Using Basic Block Vectors, Cycles Per Instruction (CPI) Information and Microarchitecture Dependent Information - A test system or simulator includes an integrated circuit (IC) benchmark software program that executes workload program software on a semiconductor die IC design model. The benchmark software program includes trace, simulation point, basic block vector (BBV) generation, cycles per instruction (CPI) error, clustering and other programs. The test system also includes CPI stack program software that generates CPI stack data that includes microarchitecture dependent information for each instruction interval of workload program software. The CPI stack data may also include an overall analysis of CPI data for the entire workload program. IC designers may utilize the benchmark software and CPI stack program to develop a reduced representative workload program that includes CPI data as well as microarchitecture dependent information.11-05-2009
20090276191Method And Apparatus For Integrated Circuit Design Model Performance Evaluation Using Basic Block Vector Clustering And Fly-By Vector Clustering - A test system or simulator includes an enhanced IC test application sampling software program that executes test application software on a semiconductor die IC design model. The enhanced test application sampling software may include trace, simulation point, CPI error, clustering, instruction budgeting, and other programs. The enhanced test application sampling software generates basic block vectors (BBVs) and fly-by vectors (FBVs) from instruction trace analysis of test application software workloads. The enhanced test application sampling software utilizes the microarchitecture dependent information to generate the FBVs to select representative instruction intervals from the test application software. The enhanced test application sampling software generates a reduced representative test application software program from the BBV and FBV data utilizing a global instruction budgeting analysis method. Designers use the test system with enhanced test application sampling software to evaluate IC design models by using the representative test application software program.11-05-2009
20100161282WORKLOAD PERFORMANCE PROJECTION FOR FUTURE INFORMATION HANDLING SYSTEMS USING MICROARCHITECTURE DEPENDENT DATA - A performance projection system includes a test IHS and a currently existing IHS. The performance projection system includes surrogate programs and user application software. The test IHS or simulator includes a processor with hardware (HW) counter(s) and an L1 cache. The test IHS employs a memory that includes a virtual future IHS, currently existing IHS, surrogate programs, and user application software for determination of runtime and HW counter performance data. The user application software and surrogate programs execute on the currently existing IHS to provide designers with runtime data and HW counter or microarchitecture dependent data. Designers execute surrogate programs on the future IHS to provide runtime and HW counter data. Designers normalize and weight the runtime and HW counter data to provide a representative surrogate program for comparison to user application software performance on the future IHS. Using a scaling factor, designers may generate a projection of runtime performance for the user application software executing on the future IHS.06-24-2010
20100162216WORKLOAD PERFORMANCE PROJECTION VIA SURROGATE PROGRAM ANALYSIS FOR FUTURE INFORMATION HANDLING SYSTEMS - A performance projection system includes a test IHS and multiple currently existing IHSs. The performance projection system includes user application software and surrogate programs that execute on currently existing IHSs. The performance projection system measures user application software and surrogate program performance during execution on currently existing IHSs. The performance projection systems measures runtime program performance during execution of surrogate programs on a future semiconductor die IC design model or virtualized future system. Designers normalize and compare surrogate program runtime performance data with user application software performance data. Designers un-normalize the normalized runtime performance data to generate a projection of runtime performance on the future system.06-24-2010
20110154352MEMORY MANAGEMENT SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT - According to one aspect of the present disclosure a method and technique for managing memory access is disclosed. The method includes setting a memory databus utilization threshold for each of a plurality of processors of a data processing system to maintain memory databus utilization of the data processing system at or below a system threshold. The method also includes monitoring memory databus utilization for the plurality of processors and, in response to determining that memory databus utilization for at least one of the processors is below its threshold, reallocating at least a portion of unused databus utilization from the at least one processor to at least one of the other processors.06-23-2011

Patent applications by Venkat R. Indukuru, Austin, TX US

Venkat Rajeev Indukuru, Austin, TX US

Patent application numberDescriptionPublished
20080201566METHOD AND APPARATUS FOR MEASURING PIPELINE STALLS IN A MICROPROCESSOR - A computer implemented method, apparatus, and computer program product for monitoring execution of instructions in an instruction pipeline. The process identifies a number of stall cycles for a group of instructions to complete execution. The process retrieves a deterministic latency pattern corresponding to the group of instructions. The process compares the number of stall cycles to the deterministic execution latency pattern. The process identifies the instruction as a dependent instruction in response to a determination that an instruction in the group of instructions completed a deterministic number of cycles after an antecedent instruction completed.08-21-2008
20080294881METHOD AND APPARATUS FOR INSTRUCTION COMPLETION STALL IDENTIFICATION IN AN INFORMATION HANDLING SYSTEM - An information handling system includes a processor that executes multiple instructions or instruction threads within a software application program. The information handling system includes operating system software that manages processor system hardware and software in a multi-tasking environment. In one embodiment, the operating system manages instruction completion stall analysis software to determine the cause or causes of instruction stalls. In another embodiment, the stall analysis software cooperates with the operating system software to store instruction completion stall event data on a per instruction basis while the application program executes. The operating system software may cooperate with the stall analysis software to store instruction completion stall data in memory for later manipulation by system users or other software.11-27-2008
20090259830Quantifying Completion Stalls Using Instruction Sampling - A method, computer program product, and data processing system for collecting metrics regarding completion stalls in an out-of-order superscalar processor with branch prediction is disclosed. A preferred embodiment of the present invention selectively samples particular instructions (or classes of instructions). Each selected instruction, as it passes through the processor datapath, is marked (tagged) for monitoring by a performance monitoring unit. The progress of marked instructions is monitored by the performance monitoring unit, and various stall counters are triggered by the progress of the marked instructions and the instruction groups they form a part of. The stall counters count cycles to give an indication of when certain delays associated with particular instructions occur and how serious the delays are.10-15-2009