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Imtiaz

Imtiaz Khan, Trabuco Canyon, CA US

Patent application numberDescriptionPublished
20090174981NONVOLATILE STATUS INDICATOR SWITCH - A non-volatile status indicator switch is provided. In one embodiment, the invention relates to an aircraft electrical system including a fault detection circuit coupled to a relay, and a fault indicator circuit coupled to the fault detection circuit and to a control input of the relay, wherein the fault indicator circuit includes a nonvolatile memory element, wherein the fault detection circuit is configured to detect a fault and to provide a signal indicative of the fault to the fault indicator circuit, and wherein the fault indicator circuit is configured to respond to the signal indicative of the fault by providing a predetermined control signal to the relay and by storing information indicative of the detection of the fault in the nonvolatile memory element.07-09-2009
20100214703POWER DISTRIBUTION SYSTEM USING SOLID STATE POWER CONTROLLERS - Solid state power controllers are described that include a switch controlled by a microcontroller and communication contacts. In one aspect of the invention, the microcontroller is galvanically isolated from the communication contacts using magnetoresistive isolation. In another aspect of the invention a number of solid state power controllers are connected to an external microcontroller to form a power distribution array. In addition, messages exchanged between the external microcontroller and the solid state power controllers can be used to configure the solid state power controllers and provide a user interface.08-26-2010

Patent applications by Imtiaz Khan, Trabuco Canyon, CA US

Imtiaz Musaliar, Chicago, IL US

Patent application numberDescriptionPublished
20090249636Cutting tape measure apparatus - A precision measurement and cutting tool for cutting a material, the precision measurement and cutting tool comprising: a measurement tape, a housing for containing a measurement tape having an opening for the measurement tape on a first side, and a first cartridge mounted at an end of the measurement tape and containing a retractable first cutting blade. In another embodiment, a precision measurement and cutting tool for cutting a material, the precision measurement and cutting tool comprising: a measurement tape having a top side and a bottom side and measuring indicia on the top side, a housing for containing a measurement tape having a first side opposite a second side and a top side opposite a bottom side and having an opening for the measurement tape on a first side that is opposite a second side, a first cartridge mounted at an end of the measurement tape and containing a retractable first cutting blade and including a bias member for biasing the cartridge to a position wherein the first cutting blade is covered and retracted, an engagement portion on the first cartridge mechanically coupled to the retractable first cutting blade such that moving the engagement portion moves the retractable cutting blade to one of a retracted and an un-retracted position.10-08-2009

Imtiaz Nadaf, Shrewsbury, MA US

Patent application numberDescriptionPublished
20120110675RESTRICTIONS TO DATA TRANSMISSION - Data received at, or created on, a device may be tagged as corporate dependent upon a service over which the data is received or an application in which the data is created. When a user attempts to insert tagged data into a data item that is to be transmitted by the device, the insertion may be prevented. Similarly, the transmission of tagged data may be restricted to only occur on a secure service.05-03-2012

Imtiaz Rangwalla, Andover, MA US

Patent application numberDescriptionPublished
20090035479MATERIALS TREATABLE BY PARTICLE BEAM PROCESSING APPARATUS - The present invention is directed to materials treatable by electron beam (EB) processing, such as materials for flexible packaging. The material comprises a substrate; an ink formulation on at least a portion of the substrate, the ink formulation comprising ink and at least one monomer selected from acrylate esters, vinyl ethers, cycloaliphatic diepoxides, and polyols; and a lacquer on at least a portion of the ink formulation, the lacquer comprising at least one monomer selected from acrylate esters, vinyl ethers, cycloaliphatic diepoxides, and polyols. The processing apparatus for EB treating the material operates at a low voltage, such as 125 kVolts or less.02-05-2009

Patent applications by Imtiaz Rangwalla, Andover, MA US