| Patent application number | Description | Published |
|---|
| 20100014079 | OPTICAL MEASURING APPARATUS - An object of the present invention is to enable a change in a frequency for which an electric signal based on an optical signal is measured by a spectrum analyzer. An optical measurement device | 01-21-2010 |
| 20100271001 | ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASUREMENT METHOD, A PROGRAM, AND A RECORDING MEDIUM - According to the present invention, the CT is carried out based on parameters other than the absorption rate. An electromagnetic wave measurement device includes an electromagnetic wave output device | 10-28-2010 |
| 20100295534 | ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM, AND RECORDING MEDIUM - According to the electromagnetic wave measurement device of the present invention, an electromagnetic wave output device outputs an electromagnetic wave having a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] toward a device under test. An electromagnetic wave detector detects the electromagnetic wave which has transmitted through the device under test. A relative position changing unit changes a relative position of an intersection across which an optical path of the electromagnetic wave transmitting through the device under test and the device under test intersect with respect to the device under test. A characteristic value deriving unit derives a characteristic value of the electromagnetic wave based on a detection result of the electromagnetic wave detector while the characteristic value is associated with an assumed relative position which is the relative position if it is assumed that the electromagnetic wave is not refracted by the device under test. A first association correction unit changes the assumed relative position to an actual relative position, which is the relative position if the refraction of the electromagnetic wave by the device under test is considered, thereby associating the result derived by the characteristic value deriving unit with the actual relative position. A corrected characteristic value deriving unit that derives the characteristic value associated with a predetermined relative position based on an output from the first association correction unit. | 11-25-2010 |
| 20110001048 | ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM, AND RECORDING MEDIUM - According to the present invention, an electromagnetic wave measurement device includes an electromagnetic wave output device, an electromagnetic wave detector, a relative position changing unit, a delay period recording unit, a phase deriving unit, a delay-corrected phase deriving unit, a sinogram deriving unit, and an image deriving unit. The electromagnetic wave output device outputs an electromagnetic wave having a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] toward a device under test and a container storing at least a part of the device under test. The electromagnetic wave detector detects the electromagnetic wave which has transmitted through the device under test. The relative position changing unit changes a relative position of an intersection at which an optical path of the electromagnetic wave transmitting through the device under test and the device under test intersect with respect to the device under test. The delay period recording unit records a delay period of the electromagnetic wave caused by a transmission of the electromagnetic wave through the container. The phase deriving unit that derives, based on a detected result by the electromagnetic wave detector, a phase in the frequency domain of the electromagnetic wave which has transmitted through the device under test. The delay-corrected phase deriving unit that derives a delay-corrected phase obtained by subtracting an integral of the delay period with respect to the frequency from the phase. The sinogram deriving unit that derives a sinogram based on a derived result by the delay-corrected phase deriving unit. The image deriving unit derives, based on the sinogram, an image of a cross section of the device under test including the intersection. | 01-06-2011 |
| 20110075127 | ELECTROMAGNETIC WAVE MEASURING APPARATUS - A desired spatial resolution upon a measurement can be attained by making an electromagnetic wave including a terahertz wave (frequency thereof is equal to or more than 0.01 [THz], and equal to or less than 100 [THz]) incident to a device under test. An electromagnetic wave measurement device includes an incident lens which makes an electromagnetic wave to be measured having a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] incident to a device under a test while decreasing a beam diameter of the electromagnetic wave to be measured, a scanning stage which rotates, about a line orthogonal to an optical axis of the incident lens as a rotational axis, the device under the test or the optical axis, and an electromagnetic wave detector which detects the electromagnetic wave to be measured which has transmitted through the device under the test, where a coordinate on the optical axis of a position which gives the minimum value d of the beam diameter is different from a coordinate on the optical axis of the rotational axis. | 03-31-2011 |
| 20110094300 | COLLECTION MEDIUM AND COLLECTION AMOUNT MEASURING APPARATUS, AND MEASURING METHOD, PROGRAM, AND RECORDING MEDIUM OF THE SAME - The present invention precisely measures characteristic values (such as the absorption coefficient) of an electromagnetic wave when a density of a PM in a DPF which collects the PM in an exhaust gas. The DPF receives the exhaust gas, and collects the PM in the exhaust gas. The DPF includes first hole portions which are open at a first end on a side for receiving the exhaust gas, and are closed at a second end on a side opposite to the first end, second hole portions which are closed at the first end and are open at the second end, and third hole portions which are closed at the first end. The first hole portion and the second hole portion are adjacent to each other. The third hole portions are adjacent to each other. The PM in the exhaust gas passing through partition walls which partition the first hole portion and the second hole portion adjacent to each other is collected by the partition walls. | 04-28-2011 |
| 20110097649 | CARRIER AND ADHESION AMOUNT MEASURING APPARATUS, AND MEASURING METHOD, PROGRAM, AND RECORDING MEDIUM OF THE SAME - The present invention measures a quantity of attachment (such as density) of a material (such as catalyst and promoter) attached to a carrier. A carrier | 04-28-2011 |
