| Patent application number | Description | Published |
|---|
| 20090059713 | RAM MACRO AND TIMING GENERATING CIRCUIT THEREOF - A timing generating circuit generates a control clock ( | 03-05-2009 |
| 20090240900 | MEMORY APPARATUS AND MEMORY CONTROL METHOD - A memory includes a plurality of blocks that each include a plurality of memory cell arrays connected to divided bit lines, a first decoder that generates a block select signal for selecting any of the blocks based on an inputted address signal, read/write portions disposed for the respective blocks, each of the read/write portions executes read or write of the memory cell array belonging to the block of its own, and signal generation portions each generates an operation control signal for bringing the read/write portion that belongs to the selected block into an operating state when the block thereof has been selected by the block select signal. Each of the signal generation portions generates an operation control signal for bringing the read/write portion that belongs to the block thereof into a non-operating state when the block thereof is not selected by the block select signal. | 09-24-2009 |
| 20100148816 | Semiconductor integrated circuit device and testing method of the same - A disclosed semiconductor integrated circuit device includes a logic circuit, a memory circuit to which data are written by the logic circuit and from which the data are read by the logic circuit, a register circuit holding the data when the logic circuit writes the data to the memory circuit, and a selector circuit selecting one of data output from the register circuit and data output from the memory circuit, and outputting the selected data to the logic circuit. Further in the semiconductor integrated circuit device, in an operational test of the logic circuit, the selector circuit selects the data output from the register circuit and outputs the selected data to the logic circuit. | 06-17-2010 |
