Patent application number | Description | Published |
20100045985 | Focused-beam ellipsometer - The present invention relates to an ellipsometer, and more particularly, to an ellipsometer to find out the optical properties of the sample by analyzing the variation of the polarization of a light which has specific polarisation then reflected on a surface of the sample. | 02-25-2010 |
20100296092 | SINGLE-POLARIZER FOCUSED-BEAM ELLIPSOMETER - The present invention relates to a single-polarizer focused-beam ellipsometer. An ellipsometer according to the present invention includes a light source ( | 11-25-2010 |
20100321693 | MINUTE MEASURING INSTRUMENT FOR HIGH SPEED AND LARGE AREA AND THE METHOD OF THEREOF - The present invention relates to a minute measuring instrument for high speed and large area and a method thereof, and more particularly, to a minute measuring instrument for high speed and large area which measures properties of a specimen in high speed by a focused-beam ellipsometric part and then minutely remeasures the position showing a singular point by a minute measuring part and a method thereof. | 12-23-2010 |
20110077883 | Measurement of Fourier Coefficients Using Integrating Photometric Detector - Provided is a measurement method of Fourier coefficients using an integrating photometric detector, wherein, when measuring an exposure (S | 03-31-2011 |
20110216320 | MULTI-CHANNEL SURFACE PLASMON RESONANCE SENSOR USING BEAM PROFILE ELLIPSOMETRY - Provided is a multi-channel surface plasmon resonance sensor using beam profile ellipsometry; and, more particularly, to a high sensitive measuring technology, which is coupled with a vertical illumination type focused-beam ellipsometer using a multi-incident angle measurement method, and a surface plasmon resonance (SPR) sensing part deposited with a metal thin film The multi-channel surface plasmon resonance sensor includes a vertical illumination type focused-beam ellipsometer in which light is polarized; a surface plasmon resonance (SPR) sensing part which is provided at the objective lens part of the focused-beam ellipsometer; and a multi-channel flow unit which supplies a buffer solution containing a bio material binding to or dissociation from a metal thin film generating surface plasmon. | 09-08-2011 |
20120057146 | SURFACE PLASMON RESONANCE SENSOR USING BEAM PROFILE ELLIPSOMETRY - Provided is a multi-channel surface plasmon resonance sensor using beam profile ellipsometry; and, more particularly, to a high sensitive measuring technology, which is coupled with a vertical illumination type focused-beam ellipsometer using a multi-incident angle measurement method, and a surface plasmon resonance (SPR) sensing part deposited with a metal thin film. The multi-channel surface plasmon resonance sensor includes a vertical illumination type focused-beam ellipsometer, in which light is polarized; a surface plasmon resonance (SPR) sensing part which is provided at the objective lens part of the focused-beam ellipsometer so as to generate SPR according to an angle change of the polarized light; and a flow unit which supplies a buffer solution containing a bio material binding to or dissociation from the metal thin film generating surface plasmon, wherein the SPR and the ellipsometric phase change by change in an angle and a wavelength are simultaneously detected. | 03-08-2012 |
20120295357 | APPARATUS AND METHOD FOR QUANTIFYING BINDING AND DISSOCIATION KINETICS OF MOLECULAR INTERACTIONS - The present invention relates to an apparatus for quantifying the binding and dissociation kinetics of molecular interactions of small molecular bio materials with high sensitivity almost without the influence of a change in the reflective index resulting from a buffer solution by making polarized incident light incident on the binding layer of a bio material, formed in a thin dielectric film, so that the polarized incident light satisfies a p-wave non-reflecting condition and a quantifying method using the same. | 11-22-2012 |
20130044318 | ROTATING-ELEMENT ELLIPSOMETER AND METHOD FOR MEASURING PROPERTIES OF THE SAMPLE USING THE SAME - Provided is a real-time spectroscopic ellipsometer capable of obtaining information on properties of a sample, a nano pattern shape, in real time by measuring and analyzing, for a plurality of wavelengths, a change in a polarization state of incident light generated while being reflected or transmitted due to the sample when light having a specific polarization component is incident to the sample. | 02-21-2013 |
20140313511 | ROTATING-ELEMENT ELLIPSOMETER AND METHOD FOR MEASURING PROPERTIES OF THE SAMPLE USING THE SAME - Provided is a real-time spectroscopic ellipsometer capable of obtaining information on properties of a sample, a nano pattern shape, and the like, in real time by measuring and analyzing, for a plurality of wavelengths, a change in a polarization state of incident light generated while being reflected or transmitted due to the sample when light having a specific polarization component is incident to the sample. The real-time spectroscopic ellipsometer according to the exemplary embodiment of the present invention have the improved structure and function to solve problems such as polarization dependency of a light source and a photometric detector, wavelength dependency of a compensator, a limitation of a change in integration time due to a fixing of a measuring frequency of exposure, in a rotating-element multichannel spectroscopic ellipsometers of the related art, thereby measuring more accurately, precisely, and rapidly measuring the characteristics of the sample than the related art. | 10-23-2014 |
Patent application number | Description | Published |
20110271164 | MEMORY CONTROLLER AND MEMORY MANAGEMENT METHOD - Provided is a memory controller that generates Error Correction Code (ECC) information for data based on a required reliability level predetermined based on a type of the data, that computes an ECC code for the data based on the ECC information, and that records the ECC code in a memory based on the ECC information. | 11-03-2011 |
20130024735 | SOLID-STATE MEMORY-BASED STORAGE METHOD AND DEVICE WITH LOW ERROR RATE - Non-volatile solid-state memory-based storage devices and methods of operating the storage devices to have low initial error rates. The storage devices and methods use bit error rate comparison of duplicate writes to one or more non-volatile memory devices. The data set with a lower bit error rate as determined during verification is maintained, whereas data sets with higher bit error rates are discarded. A threshold of bit error rates can be used to trigger the duplication of data for bit error comparison. | 01-24-2013 |
20140059277 | STORAGE FOR ADAPTIVELY DETERMINING A PROCESSING TECHNIQUE WITH RESPECT TO A HOST REQUEST BASED ON PARTITION DATA AND OPERATING METHOD FOR THE STORAGE DEVICE - Provided are: a storage device for adaptively determining a processing technique with respect to a host request based on partition data; and an operating method for the storage device. The storage device responds to receipt of a read or write request from a host by ascertaining a partition corresponding to the host request based on data about block addresses occupied by various partitions stored in the storage device. Also, the storage device adaptively determines a processing technique with respect to the host request based on predetermined attributes of the partition concerned. | 02-27-2014 |
20140068216 | STORAGE SYSTEM FOR SUPPORTING COPY COMMAND AND MOVE COMMAND AND OPERATION METHOD OF STORAGE SYSTEM - Provided are a storage system for supporting a copy command and a move command and an operation method of said storage system. The storage system performs a copy operation and a move operation without movement of data between a host and a storage device, by using a copy command and a move command which are distinguished from a read command and a write command. More specifically, the storage device updates a mapping table by responding to the reception of the copy command or the move command from the host. | 03-06-2014 |