Patent application number | Description | Published |
20080304509 | OUT OF BAND SIGNALING ENHANCEMENT FOR HIGH SPEED SERIAL DRIVER - An integrated microelectronic serial driver is provided which is operable to transmit a differential pattern signal during a burst interval and a predetermined common mode voltage level during a second interval between adjacent burst intervals, the serial driver including at least one pre-driver and a driver coupled to an output of the pre-driver for transmitting the differential communication signal. A switching circuit is operable to switch the serial driver between a first power supply voltage level for the burst interval and the predetermined common mode voltage level, wherein the predetermined common mode voltage level is independent of variations in power supply voltage conditions and temperature conditions. | 12-11-2008 |
20080316930 | Robust Cable Connectivity Test Receiver For High-Speed Data Receiver - A system is provided for detecting a fault in a signal transmission path. In one embodiment, the system can include a variable amplitude signal attenuator which is operable to modify an input signal by variably attenuating a signal voltage swing of the input signal. Desirably, the input signal is attenuated only when transitioning from a high signal voltage level towards a low signal voltage level d variably, such that a larger high-to-low signal voltage swing is attenuated more than a smaller high-to-low signal voltage swing. Desirably, a comparator, which may apply hysteresis to the output signals, may detect a crossing of a reference voltage level by the modified input signal. In this way, when the comparator does not detect an expected crossing of the reference voltage level by the modified input signal, a determination can be made that a fault exists in the signal transmission path. | 12-25-2008 |
20090004978 | TRANSMITTER BANDWIDTH OPTIMIZATION CIRCUIT - A method is provided for operating a transmitter integrated in a microelectronic element. In a calibration phase, a plurality of operational parameters are stored for controlling a frequency response of the transmitter under each of a plurality of corresponding operating conditions. Upon detecting an operating condition such as a temperature or power supply voltage level, the corresponding stored operational parameter is applied to the transmitter to control the frequency response. | 01-01-2009 |
20090027075 | System And Method of Digitally Testing An Analog Driver Circuit - A circuit and method of testing an analog driver circuit using digital scan-based test methodologies. The circuit of the present invention comprises a control circuit for generating signals in response to a test enable signal, a differential driver circuit for receiving a differential input signal, amplifying the differential input signal and transmitting a differential output signal in response to the differential input signal and the signals generated by the control circuit, a programmable termination impedance circuit for generating a differential termination impedance at the output node of the differential driver circuit in response the signals generated by the control circuit, and a differential receiver circuit for receiving the differential output from the differential driver circuit, convert the differential output signal to a single ended signal and transmitting the single ended signal, all in response to the test enable signal. The method of the present invention comprises digitally testing the differential driver circuit by activating a test enable signal, skewing the differential output termination impedance in response to the test enable signal, adjusting a voltage offset of the differential receiver circuit in response to the test enable signal, selecting a power level for the differential driver circuit in response to the test enable signal, enabling a decoder in response to the test enable signal, wherein the decoder activates only one segment of the differential driver circuit during any one test sequence, activating one of the segments for testing, stimulating the differential driver circuit with digital test patterns, receiving an output of the differential driver circuit by the differential receiver circuit, converting the received differential driver output to a single-ended signal, observing the single-ended signal; and deactivating the test enable signal. | 01-29-2009 |
20090128161 | Structure for robust cable connectivity test receiver for high-speed data receiver - A design structure embodied in a machine-readable medium used in a design process may include a system for detecting a fault in a signal transmission path. Such system may include, for example, a hysteresis comparator including a latch having n-type field effect transistor (“NFET”) storage elements. The hysteresis comparator may be operable to detect a crossing of a reference voltage level by an input signal arriving from the signal transmission path such that when the comparator does not detect an expected crossing of the reference voltage level by the input signal, the fault is determined to be detected in the signal transmission path. | 05-21-2009 |
20090129485 | Structure for transmitter bandwidth optimization circuit - A design structure embodied in a machine-readable medium used in a design process provides a transmitter having a frequency response controllable in accordance with an operational parameter, and may include a storage operable to store operational parameters for controlling a frequency response of the transmitter under each of a plurality of corresponding operating conditions. A sensor can be used to detect an operating condition. In response to a change in the detected operating condition, a stored operational parameter corresponding to the detected operating condition can be used to control the frequency response of the transmitter. | 05-21-2009 |
20090172614 | AVOIDING DEVICE STRESSING - A system for protecting a weak device operating in micro-electronic circuit and a design structure including the system embodied in a machine readable medium are disclosed. The system includes a high voltage power supply from high voltage overstressing prevents the weak device from failing during power-up, power-down, and when a low voltage power supply in a multiple power supply system is absent. The system further includes a low voltage power supply detection circuit configured to detect circuit power-up, circuit power-down, and when the low voltage power supply is absent, and generate a control signal upon detection. The system further includes a controlled current mirror device configured to provide a trickle current to maintain a conduction channel in the weak device in response to the control signal received from the low voltage power supply detection circuit during circuit power-up, circuit power-down, and when the low voltage power supply is absent. | 07-02-2009 |
20090300562 | Design structure for out of band signaling enhancement for high speed serial driver - A design structure is provided for a microelectronic serial driver. The serial driver is operable to transmit a differential pattern signal during a burst interval and a predetermined common mode voltage level during a second interval between adjacent burst intervals, the serial driver including at least one pre-driver and a driver coupled to an output of the pre-driver for transmitting the differential communication signal. A switching circuit is operable to switch the serial driver between a first power supply voltage level for the burst interval and the predetermined common mode voltage level, wherein the predetermined common mode voltage level is independent of variations in power supply voltage conditions and temperature conditions. | 12-03-2009 |