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Hsu-Hung
Hsu-Hung Chang, Tai-Chung City TW
| Patent application number | Description | Published |
|---|---|---|
| 20090247102 | CIRCUIT AND METHOD OF CALIBRATING DIRECT CURRENT OFFSET IN WIRELESS COMMUNICATION DEVICE - A circuit for calibrating the DC offset in a wireless communication device utilizes a voltage-generating circuit to generate a first voltage value and its negative value, and utilizes a detecting circuit to detect an output of the wireless communication device and generate a first target-branch reference value corresponding to the power of the output when the first voltage value is inputted into a target branch (e.g., the in-phase branch or the quadrature branch) of the wireless communication device, and detect an output of the wireless communication device and generate a second target-branch reference value corresponding to the power of the output when the negative value of the first voltage value is input into the target branch. Then, an estimating circuit estimates the DC offset on the target branch according to the first and second target-branch reference values and the first voltage value. | 10-01-2009 |
Hsu-Hung Chen, Tao Yuan Shien TW
| Patent application number | Description | Published |
|---|---|---|
| 20110267429 | ELECTRONIC EQUIPMENT HAVING LASER COMPONENT AND CAPABILITY OF INSPECTING LEAK OF LASER AND INSPECTING METHOD FOR INSPECTING LEAK OF LASER THEREOF - The invention provides an electronic equipment having a laser component and capability of inspecting leak of laser and an inspecting method for inspecting leak of laser thereof. The electronic equipment according to the invention includes a three-dimensional image-capturing device. According to the invention, the three-dimensional image-capturing device is controlled to capture a two-dimensional image, and to measure an actual depth map. The captured two-dimensional image is processed to obtain an estimated depth map. The invention selectively determines that the laser component occurs leak of laser or malfunctions in accordance with the estimated depth map and the actual depth map. | 11-03-2011 |
Hsu-Hung Cheng, Taipei TW
| Patent application number | Description | Published |
|---|---|---|
| 20100082956 | BIOS PARAMETER ERASING METHOD AND APPARATUS APPLIED TO COMPUTER SYSTEM - A computer system includes a triggering device; and a motherboard, connected to the triggering device, further comprising: a memory stored with a setting parameter of a basic-input-output-system; and a counter connected between the triggering device and the memory; wherein an erasing signal, for erasing the memory, is outputted to the memory from the counter according to a triggering signal outputted from the triggering device while a boosting procedure cannot be successfully executed by the computer system. | 04-01-2010 |
| 20100211767 | COMPUTER SYSTEM, MEMORY CIRCUIT ON MOTHERBOARD AND BOOTING METHOD THEREOF - A method for booting a computer system is disclosed. The computer system has a main memory. The method includes the steps of providing a backup memory, replacing the main memory by the backup memory when the computer system is booted and the main memory fails to operate normally, and decompressing the program codes of the BIOS to the backup memory to perform the backup booting procedure. | 08-19-2010 |
Hsu-Hung Wei, Chung Li TW
| Patent application number | Description | Published |
|---|---|---|
| 20100308205 | METHOD FOR AUTO FOCUS SEARCHING OF OPTICAL MICROSCOPE - A method for auto focus searching of optical microscopes is revealed. At first, sample a plurality of image signals according to a plurality of sampling positions. Then process the plurality of image signals to get a plurality of energy values. Next calculate a plurality of sharpness values of adjacent energy values and also calculate an absolute value corresponding to the sharpness value. Later check and find out a maximum value of the absolute values to get a sampling position corresponding to the image with the maximum value and use that position as the optimal focus position of the optical microscopes. By the sampling way, the energy values of the image signals are captured so as to save calculation time. Moreover, a sharpness value of adjacent energy value is also calculated so as to check the image captured at the best focus position quickly and reduce focus searching time of the optical microscope. Therefore, the focusing efficiency of the optical microscope is improved. | 12-09-2010 |