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Hoen
Karl Hoen, Asbach DE
| Patent application number | Description | Published |
|---|---|---|
| 20100101293 | COILING FURNACE - The invention relates to a coiling furnace ( | 04-29-2010 |
Storrs Hoen, Brisbane, CA US
| Patent application number | Description | Published |
|---|---|---|
| 20100132078 | Method for Measuring the Force of Interaction in a Scanning Probe Microscope - A scanning probe microscope and method for operating the same are disclosed. The microscope includes a probe mount for attaching a probe, an electromechanical actuator, a probe position signal generator, an impulse signal generator and a servo. A probe tip is mounted on a first end of a cantilever arm, a second end of the cantilever arm being mounted on a mechanical vibrator that causes the second end to vibrate in response to a drive signal. The probe position signal generator generates a position signal indicative of a position of the probe relative to the second end of the cantilever arm. The impulse signal generator measures a quantity related to an impulse imparted to the probe tip by the interaction between the tip and the local characteristics of the sample. The servo operates the electromechanical actuator so as to maintain the measured quantity at a predetermined value. | 05-27-2010 |
Storrs T. Hoen, Brisbane, CA US
| Patent application number | Description | Published |
|---|---|---|
| 20090062935 | Automatic Generation Of PID Parameters For An Atomic Force Microscope - Linear PID controllers have a transfer function that resembles the frequency response of a notch filter. The PID parameters, K | 03-05-2009 |
Storrs Townsend Hoen, Brisbane, CA US
| Patent application number | Description | Published |
|---|---|---|
| 20090107266 | PROBE TIP ASSEMBLY FOR SCANNING PROBE MICROSCOPES - A probe assembly for a scanning probe microscope (SPM), a cartridge for a probe assembly for an SPM, and a method of attaching a probe tip to an SPM are described. | 04-30-2009 |