Patent application number | Description | Published |
20080283750 | Sample Observation Method and Transmission Electron Microscope - There is provided a transmission electron microscope capable of a capturing continuous field-of-view image without having an influence of aberration. In order to obtain an electron beam image of the whole of a predetermined range of a sample, the transmission electron microscope specifies a region with little aberration in a field of view of an image pickup device, moves a sample stage in units of the specified regions, captures the whole of the predetermined range as a plurality of continuous field-of-view images. | 11-20-2008 |
20090218507 | CHARGED PARTICLE BEAM DEVICE - The present invention provides a charged particle beam device which can effectively restrain misalignment of an optical axis even if a position of an anode is changed. The present invention is a charged particle beam device comprising a cathode provided with a charged particle source which emits a charged particle, an anode which applies an electric field to the emitted charged particle, a charged particle beam deflector which deflects an orbit of a charged particle beam having passed the anode, and a charged particle beam detector which detects the charged particle beam from a sample to which the charged particle is irradiated, wherein a distance changing mechanism which changes a distance between the cathode and the anode, corresponding to a charged particle amount emitted from the charged particle source and a deflection amount control mechanism which detects a condition of the deflector under which the charged particle dose detected from the sample scanned by deflecting the charged particle beam in the changed distance becomes a desired size and controls deflection of the deflector at sample measurement on the basis of the condition are provided. | 09-03-2009 |
20090274359 | SPECIMEN OBSERVATION METHOD - It is an object of the present invention to provide a specimen observation method, an image processing device, and a charged-particle beam device which are preferable for selecting, based on an image acquired by an optical microscope, an image area that should be acquired in a charged-particle beam device the representative of which is an electron microscope. In the present invention, in order to accomplish the above-described object, there are provided a method and a device for determining the position for detection of charged particles by making the comparison between a stained optical microscope image and an elemental mapping image formed based on X-rays detected by irradiation with the charged-particle beam. | 11-05-2009 |
20110205353 | METHOD FOR OBSERVING SAMPLE AND ELECTRONIC MICROSCOPE - A sample observation method of the present invention comprises a step of defining, with respect to an electron microscope image, an outline of an observation object with respect to a sample ( | 08-25-2011 |
20120138795 | SPECIMEN OBSERVATION METHOD - It is an object of the present invention to provide a specimen observation method, an image processing device, and a charged-particle beam device which are preferable for selecting, based on an image acquired by an optical microscope, an image area that should be acquired in a charged-particle beam device the representative of which is an electron microscope. In the present invention, in order to accomplish the above-described object, there are provided a method and a device for determining the position for detection of charged particles by making the comparison between a stained optical microscope image and an elemental mapping image formed based on X-rays detected by irradiation with the charged-particle beam. | 06-07-2012 |
20130144480 | ELECTRICALLY DRIVEN VEHICLE - An electrically driven vehicle equipped with electric motors ( | 06-06-2013 |
20130234024 | ELECTRON MICROSCOPE, ELECTRON-MICROSCOPE IMAGE-RECONSTRUCTION SYSTEM AND ELECTRON-MICROSCOPE IMAGE-RECONSTRUCTION METHOD - There is provided an image-reconstruction system capable of implementing a multi-axes reconstruction technique for lessening a burden on the part of a user, and precluding artifacts high in contrast, contamination of a sample, and restrictions imposed on a sample for use, occurring due to use of markings | 09-12-2013 |
20150185455 | METHOD FOR OBSERVING SAMPLE AND ELECTRONIC MICROSCOPE - A sample observation method of the present invention comprises a step of defining, with respect to an electron microscope image, an outline of an observation object with respect to a sample ( | 07-02-2015 |