Hideki Kikuchi
Hideki Kikuchi, Chiba JP
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20090255939 | Gas Tank and Method for Producing the Same - According to the present invention, a gas tank having a gas-barrier inner shell and an outer shell that is formed so as to cover the inner shell and is made of a pressure-resistant FRP, such outer shell comprising reinforcing fiber bundles (A), a thermosetting resin (B), and an elastomer particles and/or thermoplastic resin particles (C), provided that elastomer particles and/or thermoplastic resin particles (C) that have been dispersed in a thermosetting resin (B) exist in reinforcing fiber bundles (A), is provided. Such gas tank is excellent in strength and heat resistance and has suppressed gas permeability. | 10-15-2009 |
Hideki Kikuchi, Hitachinaka JP
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20090127474 | ELECTRIC CHARGED PARTICLE BEAM MICROSCOPE AND MICROSCOPY - An electric charged particle beam microscope is provided in which a specimen movement due to a specimen rotation is classified into a repeatable movement and a non-repeatable movement, a model of movement is determined for the repeatable movement, a range of movement is determined for the non-repeatable movement, the repeatable movement is corrected on the basis of the movement model through open-loop and the non-repeatable movement is corrected under a condition set on the basis of the range of movement. | 05-21-2009 |
20110115637 | CHARGED CORPUSCULAR RAY APPARATUS - The present invention relates to the acquisition of tilted series images of a minute sample in a short time. | 05-19-2011 |
20120104253 | CHARGED PARTICLE BEAM MICROSCOPE AND MEASURING METHOD USING SAME - A charged particle beam device is equipped with a function of: obtaining an approximation function of a sample drift from a visual field shift amount among plural images (S | 05-03-2012 |
20120287258 | CHARGED PARTICLE BEAM MICROSCOPE AND METHOD OF MEASUREMENT EMPLOYING SAME - The electric charged particle beam microscope includes an electric charged particle source; a condenser lens converging electric charged particles emitted from the electric charged particle source on a specimen; a deflector scanning the converged electric charged particles over the specimen; a control unit of the deflector; a specimen stage on which the specimen is mounted; a detector detecting the electric charged particles; a computer forming an image from a control signal from the deflector and an output signal from the detector; and a display part connected with the computer. The control unit of the deflector can change the scan rate of the electric charged particles. A first rate scan image is obtained at a first rate and a second rate scan image is obtained at a second rate slower than the first rate. | 11-15-2012 |
Hideki Kikuchi, Shizuoka JP
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20140103273 | Resin Tube for Guide Wire, Method for Manufacturing Resin Tube for Guide Wire, and Guide Wire - Provided are a resin tube for a guide wire, a method for manufacturing a resin tube for a guide wire, and a guide wire, configured such that the resin tube makes point contact in the axial direction with an object of contact at working site, thereby reducing frictional resistance and yielding excellent sliding properties, while also being prevented from kinking and collapsing, and having excellent buckling resistance. The resin tube for a guide wire is characterized in that the outer shape of a cross-section perpendicular to the axial direction is polygonal, elliptic, or irregular, that the resin tube is twisted in a helical shape about a deep inner-core hole as the axis of twisting, the deep inner-core hole extending in the axial direction and allowing a core wire to be inserted therein, and that the resin tube is provided with a trunk section having an undulation on the outer surface caused by the twisted eccentric wall thickness. | 04-17-2014 |
Hideki Kikuchi, Tokyo JP
Patent application number | Description | Published |
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20140353500 | CHARGED PARTICLE BEAM MICROSCOPE, SAMPLE HOLDER FOR CHARGED PARTICLE BEAM MICROSCOPE, AND CHARGED PARTICLE BEAM MICROSCOPY - There is provided an apparatus that can capture a rotation series of images of an observation area within a range of −180° to +180° around the x axis thereof, and can capture a rotation series of images of the observation area within a range of −180° to +180° around the y axis thereof. | 12-04-2014 |
20150041676 | SOUNDPROOF COVER FOR CHARGED-PARTICLE BEAM DEVICE, AND CHARGED-PARTICLE BEAM DEVICE - It is an object of the present invention to provide a noise-proof cover and a charged particle beam apparatus that realize both of suppression of an image failure caused by a specific frequency and a reduction in size. To attain the object, the present invention proposes a noise-proof cover that surrounds a charged particle beam apparatus, the noise-proof cover including a hollow section forming member that forms a cylindrical body having a wall surface extending along an inner wall of the noise-proof cover, one end of the cylindrical body formed by the hollow section forming member being opened and the other end of the cylindrical section being closed, and the charged particle beam apparatus surrounded by the noise-proof cover. | 02-12-2015 |