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Hendler, US

Donald J. Hendler, Brookville, NY US

Patent application numberDescriptionPublished
20090052162COMBINATION DEVICE INCLUDING A GUIDE LIGHT AND AN ELECTRICAL COMPONENT - There is disclosed a combination electrical device comprising a housing wherein there can be at least one light and at least one sensor disposed in the housing. The light serves as a guide light wherein the sensor is for determining the presence or absence of light. Inside the housing can be face terminals which extend up to a user accessible interface in the form of apertures for receiving prongs of a plug. The housing can include an additional housing for receiving a circuit board coupled to the light and the sensor. In addition, there can be a translucent cover for covering the light and the sensor. In at least one embodiment, the translucent cover can extend along at least one fourth of a length of a front face of the housing. In another embodiment, the translucent cover can extend along at least one third of a length of a front face of the housing. In still another embodiment, the translucent cover can extend along one half of a length of the housing.02-26-2009

Larry Hendler, San Jose, CA US

Patent application numberDescriptionPublished
20110192461Zone Melt Recrystallization of layers of polycrystalline silicon - A solar cell comprises a recrystallized active layer wherein the active layer has preferred characteristics.08-11-2011

Lawrence Hendler, Sunnyvale, CA US

Patent application numberDescriptionPublished
20100304035Plasma Spraying and Recrystallization of Thick Film Layer - A linear process tool comprising at least two deposition modules each comprising one or more plasma spray guns operable to move in a direction approximately orthogonal to the direction of a substrate carrier is configured to deposit at least a first and second layer, in direct contact with each other, wherein a first layer is of first composition and the second layer is of second composition different than the first composition.12-02-2010

Lawrence Hendler, Cupertino, CA US

Patent application numberDescriptionPublished
20080221720Manufacturing Process End Point Detection - A method for identifying a predetermined state of a manufacturing process by monitoring the process which involves, monitoring a plurality of variables that vary in value during the manufacturing process. The method also involves mapping as points in a hyperspace the values of each variable at a plurality of times, where the hyperspace has a number of dimensions equal to the number of variables and the number of points is equal to the plurality of times. The method also involves identifying that a manufacturing process has reached the predetermined state when one of the points reaches a closed volume in the hyperspace that is located within a predefined distance from a predefined location in the hyperspace.09-11-2008
20090037013Automated Model Building and Model Updating - A system and computer-implemented method for creating a new model or updating a previously-created model based on a template are described. A template is generated from a previously-created model. The previously-created model specifies a set of parameters associated with a manufacturing process, a process tool or chamber. Variables associated with the manufacturing process are acquired, monitored, and analyzed. A statistical analysis (or multivariate statistical analysis) is employed to analyze the monitored variables and the set of parameters. When any of the monitored variables satisfy a threshold condition, a new model is created or the parameters of the previously-created model are updated, adjusted, or modified based on the template and the monitored variables. A user interface facilitating communication between a user and the systems and display of information is also described.02-05-2009
20100100223PROCESS CONTROL USING PROCESS DATA AND YIELD DATA - A method for monitoring a manufacturing process features acquiring metrology data for semiconductor wafers at the conclusion of a final process step for the manufacturing process (“Step a”). Data is acquired for a plurality of process variables for a first process step for manufacturing semiconductor wafers (“Step b”). A first mathematical model of the first process step is created based on the metrology data and the acquired data for the plurality of process variables for the first process step (“Step c”). Steps b and c are repeated for at least a second process step for manufacturing the semiconductor wafers (“Step d”). An nth mathematical model is created based on the metrology data and the data for the plurality of process variables for each of the n process steps ('Step e“). A top level mathematical model is created based on the metrology data and the models created by steps c, d and e (”Step f'). The top level mathematical model of Step f is based on those process variables that have a substantial effect on the metrology data.04-22-2010

Patent applications by Lawrence Hendler, Cupertino, CA US

Peter E. Hendler, Rochester, NY US

Patent application numberDescriptionPublished
20090004532Dummy cassettes for a solid oxide fuel cell stack - A fuel cell stack assembly comprising a plurality of serially-assembled fuel cell stages formed as individual cassette units, wherein at least one of the first and last cassettes, and preferably both, is a dummy cassette assembled with a metal blank in place of the fuel cell, which metal blank preferably is formed integrally with a dummy picture frame element. A dummy cassette contains an interconnect, flow blocking anode spacers, metal contact paste, and a separator plate to assure electrical conductivity and structural integrity in the assembled fuel cell stack. Providing the dummy cassettes corrects a known problem of underperformance of the end fuel cell cassettes which limits the performance of the entire stack.01-01-2009
20100233564Fuel Cell Stack Including Non-Fuel Cell Cassette - A fuel cell stack is disclosed including a non-fuel cell cassette having temperature sensing elements disposed therein. The temperature sensing elements are disposed in one or more void spaces in the non-fuel cell cassette, which void spaces are connected to openings in the side of the non-fuel cell cassette for lead wires to communicate information from the temperature sensing elements to components outside of the fuel cell stack.09-16-2010

Sheldon Saul Hendler, La Jolla, CA US

Patent application numberDescriptionPublished
20100172971Compositions for Inhibiting NADPH Oxidase Activity - Phycobilins are disclosed to have prodrug activity as inhibitors of NADPH oxidase activity and are disclosed to be useful in the prophylaxis and/or treatment of medical conditions associated with or linked to an NADPH oxidase activity. Compositions containing phycobilins are described which facilitate the administration of phycobilins.07-08-2010